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Integration of genetically modified virus-like-particles with an optical resonator for selective bio-detection

Nanotechnology, 2015-05, Vol.26 (20), p.205501-205501

2015

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Fabrication challenges for indium phosphide microsystems

Journal of micromechanics and microengineering, 2015-04, Vol.25 (4), p.43001-14

2015

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Grain size effects on piezoelectric properties of BaTiO3 ceramics prepared by spark plasma sintering

Journal of materials science. Materials in electronics, 2016-06, Vol.27 (6), p.5967-5971

2016

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Indium phosphide-based monolithically integrated PIN waveguide photodiode readout for resonant cantilever sensors

Applied physics letters, 2014-10, Vol.105 (14)

2014

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The effect of diffusion and overhangs/vacancies on the microstructure of zig-zag thin film

Applied surface science, 2007-01, Vol.253 (6), p.3004-3008

2007

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Simulation of growth process of thin film on non-planar substrate

Applied surface science, 2005-08, Vol.249 (1), p.85-90

2005

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Roughness evolution of ZrO2 thin films grown by reactive ion beam sputtering

Thin solid films, 2003-11, Vol.444 (1-2), p.146-152

2003

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Theory of optical bistability in a non-linear quasi-waveguide

Applied physics. B, Lasers and optics, 2002-12, Vol.75 (8), p.865-869

2002

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Co/C and W/Si multilayers deposited by ion-beam sputtering for the soft X-ray range

Applied physics. A, Materials science & processing, 2002-04, Vol.74 (4), p.553-555

2002

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Preparation of ultralow loss mirrors with reflectivity of over 99.9968

Laser physics, 2003-09, Vol.13 (9), p.1166-1169

2003

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Highly (111)-oriented PbTiO3 films prepared by rf planar magnetron sputtering and their optical properties

Surface & coatings technology, 2002-10, Vol.160 (2-3), p.173-176

2002

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Influence of different post-treatments on the structure and optical properties of zinc oxide thin films

Applied surface science, 2005-04, Vol.242 (3), p.346-352

2005

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Influence of oxygen partial pressure on the structure and photoluminescence of direct current reactive magnetron sputtering ZnO thin films

Thin solid films, 2005-02, Vol.473 (1), p.58-62

2005

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Influence of buffer layer thickness on the structure and optical properties of ZnO thin films

Applied surface science, 2006-02, Vol.252 (8), p.2888-2893

2006

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Electrical transport in metallic films

Journal of applied physics, 2004-03, Vol.95 (5), p.2527-2531

2004

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Annealing effects on structure and laser-induced damage threshold of Ta2O5/SiO2 dielectric mirrors

Applied surface science, 2003-04, Vol.210 (3-4), p.353-358

2003

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Evolutions of residual stress and microstructure in ZrO2 thin films deposited at different temperatures and rates

Thin solid films, 2003-11, Vol.445 (1), p.59-62

2003

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High laser-induced damage threshold HfO2 films prepared by ion-assisted electron beam evaporation

Applied surface science, 2005-04, Vol.243 (1-4), p.232-237

2005

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Roles of absorbing defects and structural defects in multilayer under single-shot and multi-shot laser radiation

Applied surface science, 2004-04, Vol.227 (1-4), p.275-281

2004

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Laser conditioning and multi-shot laser damage accumulation effects of HfO2/SiO2 antireflective coatings

Applied surface science, 2005-05, Vol.245 (1-4), p.335-339

2005

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Annealing effects on electron-beam evaporated Al2O3 films

Applied surface science, 2005-04, Vol.242 (3-4), p.437-442

2005

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Enhancement of near-band-edge photoluminescence of ZnO thin films in sandwich configuration at room temperature

Journal of applied physics, 2006-05, Vol.99 (9), p.093520-093520-3

2006

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Enhancement of near-band edge photoluminescence of ZnO thin films by employing MgF2 buffer layer

Journal of crystal growth, 2006-05, Vol.290 (2), p.334-337

2006

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Laser conditioning of ZrO2:Y2O3/SiO2 mirror coatings prepared by E-beam evaporation

Applied surface science, 2005-01, Vol.239 (2), p.171-175

2005

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The study on the interface adhesion comparison of the MgF2, Al2O3, SiO2 and Ag thin films

Applied surface science, 2005-05, Vol.245 (1-4), p.11-15

2005

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Integration of genetically modified virus-like-particles with an optical resonator for selective bio-detection

Fabrication challenges for indium phosphide microsystems

Grain size effects on piezoelectric properties of BaTiO3 ceramics prepared by spark plasma sintering

Indium phosphide-based monolithically integrated PIN waveguide photodiode readout for resonant cantilever sensors

The effect of diffusion and overhangs/vacancies on the microstructure of zig-zag thin film

Simulation of growth process of thin film on non-planar substrate

Roughness evolution of ZrO2 thin films grown by reactive ion beam sputtering

Theory of optical bistability in a non-linear quasi-waveguide

Co/C and W/Si multilayers deposited by ion-beam sputtering for the soft X-ray range

Preparation of ultralow loss mirrors with reflectivity of over 99.9968

Highly (111)-oriented PbTiO3 films prepared by rf planar magnetron sputtering and their optical properties

Influence of different post-treatments on the structure and optical properties of zinc oxide thin films

Influence of oxygen partial pressure on the structure and photoluminescence of direct current reactive magnetron sputtering ZnO thin films

Influence of buffer layer thickness on the structure and optical properties of ZnO thin films

Electrical transport in metallic films

Annealing effects on structure and laser-induced damage threshold of Ta2O5/SiO2 dielectric mirrors

Evolutions of residual stress and microstructure in ZrO2 thin films deposited at different temperatures and rates

High laser-induced damage threshold HfO2 films prepared by ion-assisted electron beam evaporation

Roles of absorbing defects and structural defects in multilayer under single-shot and multi-shot laser radiation

Laser conditioning and multi-shot laser damage accumulation effects of HfO2/SiO2 antireflective coatings

Annealing effects on electron-beam evaporated Al2O3 films

Enhancement of near-band-edge photoluminescence of ZnO thin films in sandwich configuration at room temperature

Enhancement of near-band edge photoluminescence of ZnO thin films by employing MgF2 buffer layer

Laser conditioning of ZrO2:Y2O3/SiO2 mirror coatings prepared by E-beam evaporation

The study on the interface adhesion comparison of the MgF2, Al2O3, SiO2 and Ag thin films

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