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Applied physics. A, Materials science & processing, 2023-11, Vol.129 (11), Article 780
2023
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Applied physics. A, Materials science & processing, 2017-08, Vol.123 (8), p.1-6, Article 503
2017
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Journal of materials science. Materials in electronics, 2019-09, Vol.30 (17), p.16353-16358
2019
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Inorganic materials, 2018-03, Vol.54 (3), p.229-232
2018
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Applied physics. A, Materials science & processing, 2007-09, Vol.88 (4), p.687-691
2007
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Physica status solidi. C, 2010-06, Vol.7 (6), p.1668-1671
2010
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Thin solid films, 2004-07, Vol.459 (1-2), p.262-266
2004
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Physical review. B, Condensed matter and materials physics, 2005-07, Vol.72 (3), Article 033414
2005
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Scripta materialia, 2018-04, Vol.147, p.37-39
2018
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MRS proceedings, 2010, Vol.1258 (1), Article 1258-R10-19
2010
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Journal of alloys and compounds, 1995-05, Vol.223 (1), p.91-96
1995
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Thin solid films, 2004-07, Vol.459 (1), p.111-114
2004
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Journal of crystal growth, 1992-02, Vol.117 (1), p.975-978
1992
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Surface investigation, x-ray, synchrotron and neutron techniques, 2015-05, Vol.9 (3), p.558-563
2015
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Semiconductors (Woodbury, N.Y.), 2015-12, Vol.49 (13), p.1735-1738
2015
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Surface investigation, x-ray, synchrotron and neutron techniques, 2015, Vol.9 (1), p.139-143
2015
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Vacuum, 1999-05, Vol.53 (1), p.105-108
1999
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Nanotechnology, 2009-05, Vol.20 (18), p.189802-189802
2009
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Thin solid films, 1994-07, Vol.247 (2), p.145-147
1994
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Surface investigation, x-ray, synchrotron and neutron techniques, 2011-08, Vol.5 (4), p.772-774
2011
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Journal of the less-common metals, 1986, Vol.115 (1), p.91-95
1986
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Physica status solidi. A, Applied research, 2000-11, Vol.182 (1), p.93-96
2000
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MRS proceedings, 1996, Vol.427, Article 127
1996
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MRS proceedings, 1996, Vol.428, Article 61
1996
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Semiconductors (Woodbury, N.Y.), 2006-11, Vol.40 (11), p.1368-1371
2006
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