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Quantitative monitoring of InAs quantum dot growth using X-ray diffraction

Journal of crystal growth, 2014-09, Vol.401, p.372-375

Takahasi, Masamitu

2014

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Effect of crystallization of Ni catalyst on direct precipitation of multilayer graphene using W capping layer

Journal of crystal growth, 2021-02, Vol.555, p.125969, Article 125969

2021

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Structural Dynamics of Adsorption Equilibrium for Iodine Adsorbed on Au(111)

Journal of physical chemistry. C, 2020-08, Vol.124 (32), p.17711-17716

2020

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Real-time structural analysis of InGaAs/InAs/GaAs(1 1 1)A interfaces by in situ synchrotron X-ray reciprocal space mapping

Journal of crystal growth, 2019-04, Vol.512, p.33-36

2019

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Mechanisms Determining the Structure of Gold-Catalyzed GaAs Nanowires Studied by in Situ X‑ray Diffraction

Crystal growth & design, 2015-10, Vol.15 (10), p.4979-4985

2015

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Anomalous lattice deformation in GaN/SiC(0001) measured by high-speed in situ synchrotron X-ray diffraction

Applied physics letters, 2016-01, Vol.108 (1)

2016

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Feature extraction and spatial imaging of synchrotron radiation X-ray diffraction patterns using unsupervised machine learning

Science and technology of advanced materials. Methods, 2024-12, Vol.4 (1)

2024

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Strain relaxation and compositional separation during growth of InGaAs/GaAs(001)

Journal of crystal growth, 2017-06, Vol.468, p.241-244

2017

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Influence of indium supply on Au-catalyzed InGaAs nanowire growth studied by in situ X-ray diffraction

Journal of crystal growth, 2017-06, Vol.468, p.135-138

2017

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X-ray in situ observation of graphene precipitating directly on sapphire substrate with and without Ti capping layer

Journal of crystal growth, 2020-11, Vol.549, p.125861, Article 125861

2020

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Role of Liquid Indium in the Structural Purity of Wurtzite InAs Nanowires That Grow on Si(111)

Nano letters, 2014-12, Vol.14 (12), p.6878-6883

2014

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Structure of Au(111) and Au(100) Single-Crystal Electrode Surfaces at Various Potentials in Sulfuric Acid Solution Determined by In Situ Surface X-ray Scattering

Journal of physical chemistry. C, 2007-09, Vol.111 (35), p.13197-13204

2007

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In-situ x-ray characterization of wurtzite formation in GaAs nanowires

Applied physics letters, 2012-02, Vol.100 (9), p.093103-093103-4

2012

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In situ X-ray diffraction during stacking of InAs/GaAs(0 0 1) quantum dot layers and photoluminescence spectroscopy

Journal of crystal growth, 2009-03, Vol.311 (7), p.1761-1763

2009

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High-speed three-dimensional reciprocal-space mapping during molecular beam epitaxy growth of InGaAs

Journal of applied crystallography, 2012-10, Vol.45 (5), p.1046-1053

2012

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In situ three-dimensional X-ray reciprocal-space mapping of InGaAs multilayer structures grown on GaAs(001) by MBE

Journal of crystal growth, 2015-09, Vol.425, p.13-15

2015

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In situ three-dimensional X-ray reciprocal-space mapping of GaAs epitaxial films on Si(001)

Journal of crystal growth, 2013-09, Vol.378, p.34-36

2013

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In Situ Synchrotron X-ray Diffraction Reciprocal Space Mapping Measurements in the RF-MBE Growth of GaInN on GaN and InN

Crystals (Basel), 2019-12, Vol.9 (12), p.631

2019

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Real-time observation of anisotropic strain relaxation by three-dimensional reciprocal space mapping during InGaAs/GaAs (001) growth

Applied physics letters, 2010-07, Vol.97 (4), p.041906-041906-3

2010

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X-ray reciprocal space mapping of dislocation-mediated strain relaxation during InGaAs/GaAs(001) epitaxial growth

Journal of applied physics, 2011-12, Vol.110 (11), p.113502-113502-7

2011

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In situ monitoring of internal strain and height of InAs nanoislands grown on GaAs(001)

Applied physics letters, 2006-03, Vol.88 (10)

2006

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Acute and obtuse rhombohedrons in the local structures of relaxor ferroelectric Pb(Mg 1 / 3 Nb 2 / 3 )O 3

Physical review. B, Condensed matter and materials physics, 2014-04, Vol.89 (14), Article 140103

2014

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In Situ Electrochemical, Electrochemical Quartz Crystal Microbalance, Scanning Tunneling Microscopy, and Surface X-ray Scattering Studies on Ag/AgCl Reaction at the Underpotentially Deposited Ag Bilayer on the Au(111) Electrode Surface

Journal of physical chemistry. C, 2011-06, Vol.115 (25), p.12471-12482

2011

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Growth temperature dependence of strain relaxation during InGaAs/GaAs(001) heteroepitaxy

Journal of crystal growth, 2011-05, Vol.323 (1), p.13-16

2011

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Growth of horizontally aligned single-walled carbon nanotubes on anisotropically etched silicon substrate

Nanoscale, 2010-09, Vol.2 (9), p.1708-1714

2010

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Quantitative monitoring of InAs quantum dot growth using X-ray diffraction

Effect of crystallization of Ni catalyst on direct precipitation of multilayer graphene using W capping layer

Structural Dynamics of Adsorption Equilibrium for Iodine Adsorbed on Au(111)

Real-time structural analysis of InGaAs/InAs/GaAs(1 1 1)A interfaces by in situ synchrotron X-ray reciprocal space mapping

Mechanisms Determining the Structure of Gold-Catalyzed GaAs Nanowires Studied by in Situ X‑ray Diffraction

Anomalous lattice deformation in GaN/SiC(0001) measured by high-speed in situ synchrotron X-ray diffraction

Feature extraction and spatial imaging of synchrotron radiation X-ray diffraction patterns using unsupervised machine learning

Strain relaxation and compositional separation during growth of InGaAs/GaAs(001)

Influence of indium supply on Au-catalyzed InGaAs nanowire growth studied by in situ X-ray diffraction

X-ray in situ observation of graphene precipitating directly on sapphire substrate with and without Ti capping layer

Role of Liquid Indium in the Structural Purity of Wurtzite InAs Nanowires That Grow on Si(111)

Structure of Au(111) and Au(100) Single-Crystal Electrode Surfaces at Various Potentials in Sulfuric Acid Solution Determined by In Situ Surface X-ray Scattering

In-situ x-ray characterization of wurtzite formation in GaAs nanowires

In situ X-ray diffraction during stacking of InAs/GaAs(0 0 1) quantum dot layers and photoluminescence spectroscopy

High-speed three-dimensional reciprocal-space mapping during molecular beam epitaxy growth of InGaAs

In situ three-dimensional X-ray reciprocal-space mapping of InGaAs multilayer structures grown on GaAs(001) by MBE

In situ three-dimensional X-ray reciprocal-space mapping of GaAs epitaxial films on Si(001)

In Situ Synchrotron X-ray Diffraction Reciprocal Space Mapping Measurements in the RF-MBE Growth of GaInN on GaN and InN

Real-time observation of anisotropic strain relaxation by three-dimensional reciprocal space mapping during InGaAs/GaAs (001) growth

X-ray reciprocal space mapping of dislocation-mediated strain relaxation during InGaAs/GaAs(001) epitaxial growth

In situ monitoring of internal strain and height of InAs nanoislands grown on GaAs(001)

Acute and obtuse rhombohedrons in the local structures of relaxor ferroelectric Pb(Mg 1 / 3 Nb 2 / 3 )O 3

In Situ Electrochemical, Electrochemical Quartz Crystal Microbalance, Scanning Tunneling Microscopy, and Surface X-ray Scattering Studies on Ag/AgCl Reaction at the Underpotentially Deposited Ag Bilayer on the Au(111) Electrode Surface

Growth temperature dependence of strain relaxation during InGaAs/GaAs(001) heteroepitaxy

Growth of horizontally aligned single-walled carbon nanotubes on anisotropically etched silicon substrate

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