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The ECAT HRRT: performance and first clinical application of the new high resolution research tomograph

IEEE transactions on nuclear science, 2002-02, Vol.49 (1), p.104-110

2002

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Multisector Dynamics: Advancing the Science of Complex Adaptive Human‐Earth Systems

Earth's future, 2022-03, Vol.10 (3), p.n/a

2022

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A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked Loops

IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.3447-3455

2008

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Observation of Low-Energy Proton Direct Ionization in a 72-Layer 3-D NAND Flash Memory

IEEE transactions on nuclear science, 2021-05, Vol.68 (5), p.835-841

2021

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Mechanical and Thermal Characterization of Phase-Change Material and High-Density Polyethylene Functional Composites for Thermal Energy Storage

Journal of solar energy engineering, 2023-12, Vol.145 (6)

2023

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C-CREST Technique for Combinational Logic SET Testing

IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.3347-3351

2008

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Physical characteristics of the ECAT EXACT3D positron tomograph

Physics in medicine & biology, 2000-09, Vol.45 (9), p.2601-2618

2000

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Single-Event Effects on Combinational Logic Circuits Operating at Ultra-Low Power

IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.3342-3346

2008

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SPMD cluster-based parallel 3D OSEM

IEEE transactions on nuclear science, 2003-10, Vol.50 (5), p.1498-1502

2003

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Tracking Coincidence Events in PET Even When Count Rates Are Extremely High: The Lost-Event Tally Packet Concept

IEEE transactions on nuclear science, 2012-10, Vol.59 (5), p.1915-1919

2012

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Control and Information Systems for the National Ignition Facility

Fusion science and technology, 2017-03, Vol.69 (1)

2017

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Physical performance of a positron tomograph for brain imaging with retractable septa

Physics in medicine & biology, 1992-08, Vol.37 (8), p.1637-1655

1992

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Mitigation techniques for single event induced charge sharing in a 90 nm bulk CMOS process

2008 IEEE International Reliability Physics Symposium, 2008, p.468-472

2008

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Tracking coincidence events in pet even when count rates are extremely high: The Lost-Event Tally packet concept

2011 IEEE Nuclear Science Symposium Conference Record, 2011, p.3227-3231

2011

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Performance evaluation of a new LSO high resolution research tomograph-HRRT

1999 IEEE Nuclear Science Symposium. Conference Record. 1999 Nuclear Science Symposium and Medical Imaging Conference (Cat. No.99CH37019), 1999, Vol.2, p.1067-1071 vol.2

1999

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Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process

IEEE transactions on device and materials reliability, 2009-06, Vol.9 (2), p.311-317

2009

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The ECAT HRRT: performance and first clinical application of the new high resolution research tomograph

Multisector Dynamics: Advancing the Science of Complex Adaptive Human‐Earth Systems

A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked Loops

Observation of Low-Energy Proton Direct Ionization in a 72-Layer 3-D NAND Flash Memory

Mechanical and Thermal Characterization of Phase-Change Material and High-Density Polyethylene Functional Composites for Thermal Energy Storage

C-CREST Technique for Combinational Logic SET Testing

Physical characteristics of the ECAT EXACT3D positron tomograph

Single-Event Effects on Combinational Logic Circuits Operating at Ultra-Low Power

SPMD cluster-based parallel 3D OSEM

Tracking Coincidence Events in PET Even When Count Rates Are Extremely High: The Lost-Event Tally Packet Concept

Control and Information Systems for the National Ignition Facility

Physical performance of a positron tomograph for brain imaging with retractable septa

Mitigation techniques for single event induced charge sharing in a 90 nm bulk CMOS process

Tracking coincidence events in pet even when count rates are extremely high: The Lost-Event Tally packet concept

Performance evaluation of a new LSO high resolution research tomograph-HRRT

Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process

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