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Bi‐level optimization of multi‐regional power system considering low‐carbon oriented synergy of both source and load sides

IET renewable power generation, 2024-02, Vol.18 (3), p.515-528

2024

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Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: From Bit Upset to SEFI and Erroneous Behavior

IEEE transactions on nuclear science, 2022-01, Vol.69 (1), p.35-42

2022

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IEEE_Xplore

Research on Model of Micro-grid Green Power Transaction Based on Blockchain Technology and Double Auction Mechanism

Journal of Electrical Engineering & Technology, 2024, 19(1), , pp.133-145

2024

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Estimation of Muon-Induced SEU Rates for 65-nm Bulk and UTBB-SOI SRAMs

IEEE transactions on nuclear science, 2019-07, Vol.66 (7), p.1398-1403

2019

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IEEE_Xplore

Impact of Irradiation Side on Neutron-Induced Single-Event Upsets in 65-nm Bulk SRAMs

IEEE transactions on nuclear science, 2019-07, Vol.66 (7), p.1374-1380

2019

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IEEE_Xplore

Impact of the Angle of Incidence on Negative Muon-Induced SEU Cross Sections of 65-nm Bulk and FDSOI SRAMs

IEEE transactions on nuclear science, 2020-07, Vol.67 (7), p.1566-1572

2020

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IEEE_Xplore

A Nonlinearity-Compensated All-MOS Voltage-to-Current Converter

IEEE transactions on circuits and systems. II, Express briefs, 2016-02, Vol.63 (2), p.156-160

2016

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IEEE_Xplore

Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs

IEEE transactions on nuclear science, 2018-08, Vol.65 (8), p.1734-1741

2018

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IEEE_Xplore

Soft error rate estimation with TCAD and machine learning

2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2017, p.129-132

2017

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IEEE_Xplore

Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs

IEEE transactions on nuclear science, 2018-08, Vol.65 (8), p.1742-1749

2018

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IEEE_Xplore

Coherent Injection-Locking of Long-Cavity Colorless Laser Diodes With Low Front-Facet Reflectance for DWDM-PON Transmission

IEEE journal of selected topics in quantum electronics, 2013-07, Vol.19 (4), p.1501011-1501011

2013

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IEEE_Xplore

Neural Opacity Point Cloud

IEEE transactions on pattern analysis and machine intelligence, 2020-07, Vol.42 (7), p.1570-1581

2020

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IEEE_Xplore

Improving DFA attacks on AES with unknown and random faults

Science China. Information sciences, 2017-04, Vol.60 (4), p.162-175, Article 042401

2017

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Characterizing Energetic Dependence of Low-Energy Neutron-Induced SEU and MCU and Its Influence on Estimation of Terrestrial SER in 65-nm Bulk SRAM

IEEE transactions on nuclear science, 2021-06, Vol.68 (6), p.1228-1234

2021

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IEEE_Xplore

Similarity Analysis on Neutron- and Negative Muon-Induced MCUs in 65-nm Bulk SRAM

IEEE transactions on nuclear science, 2019-07, Vol.66 (7), p.1390-1397

2019

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IEEE_Xplore

Unsupervised feature selection based on Markov blanket and particle swarm optimization

Journal of systems engineering and electronics, 2017-02, Vol.28 (1), p.151-161

2017

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Irradiation Test of 65-nm Bulk SRAMs With DC Muon Beam at RCNP-MuSIC Facility

IEEE transactions on nuclear science, 2020-07, Vol.67 (7), p.1555-1559

2020

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IEEE_Xplore

A novel mode add/drop multiplexer based on two parallel combinative long period fiber gratings

Optical and quantum electronics, 2016-07, Vol.48 (7), Article 359

2016

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Measurement of Single-Event Upsets in 65-nm SRAMs Under Irradiation of Spallation Neutrons at J-PARC MLF

IEEE transactions on nuclear science, 2020-07, Vol.67 (7), p.1599-1605

2020

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IEEE_Xplore

Q3DE: A fault-tolerant quantum computer architecture for multi-bit burst errors by cosmic rays

2022 55th IEEE/ACM International Symposium on Microarchitecture (MICRO), 2022, p.1110-1125

2022

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A Terrestrial SER Estimation Methodology based on Simulation coupled with One-Time Neutron Irradiation Testing

IEEE transactions on nuclear science, 2023-08, Vol.70 (8), p.1-1

2023

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PSVM： a preference-enhanced SVM model using preference data for classification

Science China. Information sciences, 2017-12, Vol.60 (12), p.161-174, Article 122103

2017

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A 65 mW fully integrated UHF-band CMMB tuner in 65 nm CMOS process

Science China. Information sciences, 2013, Vol.56 (1), p.232-236

2013

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An improved extreme learning algorithm based on truncated singular value decomposition

The 27th Chinese Control and Decision Conference (2015 CCDC), 2015, p.1697-1701

2015

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IEEE_Xplore

Fast implementation of kernel simplex volume analysis based on modified Cholesky factorization for endmember extraction

Frontiers of information technology & electronic engineering, 2016-03, Vol.17 (3), p.250-257

2016

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Bi‐level optimization of multi‐regional power system considering low‐carbon oriented synergy of both source and load sides

Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: From Bit Upset to SEFI and Erroneous Behavior

Research on Model of Micro-grid Green Power Transaction Based on Blockchain Technology and Double Auction Mechanism

Estimation of Muon-Induced SEU Rates for 65-nm Bulk and UTBB-SOI SRAMs

Impact of Irradiation Side on Neutron-Induced Single-Event Upsets in 65-nm Bulk SRAMs

Impact of the Angle of Incidence on Negative Muon-Induced SEU Cross Sections of 65-nm Bulk and FDSOI SRAMs

A Nonlinearity-Compensated All-MOS Voltage-to-Current Converter

Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs

Soft error rate estimation with TCAD and machine learning

Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs

Coherent Injection-Locking of Long-Cavity Colorless Laser Diodes With Low Front-Facet Reflectance for DWDM-PON Transmission

Neural Opacity Point Cloud

Improving DFA attacks on AES with unknown and random faults

Characterizing Energetic Dependence of Low-Energy Neutron-Induced SEU and MCU and Its Influence on Estimation of Terrestrial SER in 65-nm Bulk SRAM

Similarity Analysis on Neutron- and Negative Muon-Induced MCUs in 65-nm Bulk SRAM

Unsupervised feature selection based on Markov blanket and particle swarm optimization

Irradiation Test of 65-nm Bulk SRAMs With DC Muon Beam at RCNP-MuSIC Facility

A novel mode add/drop multiplexer based on two parallel combinative long period fiber gratings

Measurement of Single-Event Upsets in 65-nm SRAMs Under Irradiation of Spallation Neutrons at J-PARC MLF

Q3DE: A fault-tolerant quantum computer architecture for multi-bit burst errors by cosmic rays

A Terrestrial SER Estimation Methodology based on Simulation coupled with One-Time Neutron Irradiation Testing

PSVM： a preference-enhanced SVM model using preference data for classification

A 65 mW fully integrated UHF-band CMMB tuner in 65 nm CMOS process

An improved extreme learning algorithm based on truncated singular value decomposition

Fast implementation of kernel simplex volume analysis based on modified Cholesky factorization for endmember extraction

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