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IEEE transactions on circuits and systems. I, Regular papers, 2019-06, Vol.66 (6), p.1998-2006
2019
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Analog integrated circuits and signal processing, 2018-12, Vol.97 (3), p.417-425
2018
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IEEE transactions on electron devices, 2019-01, Vol.66 (1), p.60-65
2019
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IEEE transactions on computer-aided design of integrated circuits and systems, 2020-12, Vol.39 (12), p.4842-4853
2020
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IEEE transactions on circuits and systems. I, Regular papers, 2017-12, Vol.64 (12), p.3150-3159
2017
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International journal of electronics, 2020-03, Vol.107 (3), p.403-416
2020
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IEEE access, 2021, Vol.9, p.91387-91401
2021
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IEEE sensors journal, 2014-07, Vol.14 (7), p.2102-2111
2014
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IEEE journal of radio frequency identification (Online), 2021-09, Vol.5 (3), p.278-286
2021
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Sensors (Basel, Switzerland), 2017-04, Vol.17 (4), p.761
2017
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Analog integrated circuits and signal processing, 2017-09, Vol.92 (3), p.415-426
2017
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IEEE transactions on circuits and systems. II, Express briefs, 2017-10, Vol.64 (10), p.1162-1166
2017
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Analog integrated circuits and signal processing, 2016-04, Vol.87 (1), p.81-91
2016
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Microelectronics and reliability, 2021-03, Vol.118, p.114044, Article 114044
2021
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Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017, 2017, p.1378-1383
2017
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Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017, 2017, p.1663-1666
2017
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2020 IEEE International Symposium on Circuits and Systems (ISCAS), 2020, p.1-5
2020
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2020 54th Asilomar Conference on Signals, Systems, and Computers, 2020, p.1033-1036
2020
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2019 53rd Asilomar Conference on Signals, Systems, and Computers, 2019, p.1967-1971
2019
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2022 IEEE International Symposium on Circuits and Systems (ISCAS), 2022, p.258-262
2022
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Microprocessors and microsystems, 2017-02, Vol.48, p.48-55
2017
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IEEE transactions on communications, 2013-09, Vol.61 (9), p.3781-3793
2013
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2015 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015, p.948-953
2015
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2020 54th Asilomar Conference on Signals, Systems, and Computers, 2020, p.1037-1040
2020
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Microelectronics and reliability, 2018-01, Vol.80, p.184-197
2018
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