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Digital Computation in Subthreshold Region for Ultralow-Power Operation: A Device-Circuit-Architecture Codesign Perspective

Proceedings of the IEEE, 2010-02, Vol.98 (2), p.160-190

2010

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IEEE_Xplore

Brain MRI-based Wilson disease tissue classification: an optimised deep transfer learning approach

Electronics letters, 2020-12, Vol.56 (25), p.1395-1398

2020

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LT-RTPG: a new test-per-scan BIST TPG for low switching activity

IEEE transactions on computer-aided design of integrated circuits and systems, 2006-08, Vol.25 (8), p.1565-1574

2006

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IEEE_Xplore

A 1-GS/s 11-bit ADC With 55-dB SNDR, 250-mW Power Realized by a High Bandwidth Scalable Time-Interleaved Architecture

IEEE journal of solid-state circuits, 2006-12, Vol.41 (12), p.2650-2657

2006

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IEEE_Xplore

Abstractive summarization: An overview of the state of the art

Expert systems with applications, 2019-05, Vol.121, p.49-65

2019

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On basic arithmetic operations for interval-valued intuitionistic fuzzy sets using the Hamming distance with their application in decision making

Expert systems with applications, 2024-04, Vol.239, p.122429, Article 122429

2024

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Multi-category intuitionistic fuzzy twin support vector machines with an application to plant leaf recognition

Engineering applications of artificial intelligence, 2022-04, Vol.110, p.104687, Article 104687

2022

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Threshold Testing: Improving Yield for Nanoscale VLSI

IEEE transactions on computer-aided design of integrated circuits and systems, 2009-12, Vol.28 (12), p.1883-1895

2009

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IEEE_Xplore

DS-LFSR: a BIST TPG for low switching activity

IEEE transactions on computer-aided design of integrated circuits and systems, 2002-07, Vol.21 (7), p.842-851

2002

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IEEE_Xplore

On Pareto optimality using novel goal programming approach for fully intuitionistic fuzzy multiobjective quadratic problems

Expert systems with applications, 2024-06, Vol.243, p.122816, Article 122816

2024

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Compact modeling of the effects of parasitic internal fringe capacitance on the threshold voltage of high-k gate-dielectric nanoscale SOI MOSFETs

IEEE transactions on electron devices, 2006-04, Vol.53 (4), p.706-711

2006

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IEEE_Xplore

An automatic test pattern generator for minimizing switching activity during scan testing activity

IEEE transactions on computer-aided design of integrated circuits and systems, 2002-08, Vol.21 (8), p.954-968

2002

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IEEE_Xplore

On optimistic, pessimistic and mixed approaches under different membership functions for fully intuitionistic fuzzy multiobjective nonlinear programming problems

Expert systems with applications, 2021-04, Vol.168, p.114309, Article 114309

2021

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ATPG for heat dissipation minimization during test application

IEEE transactions on computers, 1998-02, Vol.47 (2), p.256-262

1998

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IEEE_Xplore

Analytical models for crosstalk excitation and propagation in VLSI circuits

IEEE transactions on computer-aided design of integrated circuits and systems, 2002-10, Vol.21 (10), p.1117-1131

2002

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IEEE_Xplore

On the parasitic gate capacitance of small-geometry MOSFETs

IEEE transactions on electron devices, 2005-07, Vol.52 (7), p.1676-1677

2005

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IEEE_Xplore

First Principles Investigation of the Elastic, Optoelectronic and Thermal Properties of XRuSb: (X = V, Nb, Ta) Semi-Heusler Compounds Using the mBJ Exchange Potential

Journal of electronic materials, 2016-07, Vol.45 (7), p.3479-3490

2016

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An extraction-based verification methodology for MEMS

Journal of microelectromechanical systems, 2002-02, Vol.11 (1), p.2-11

2002

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IEEE_Xplore

Path delay fault diagnosis in combinational circuits with implicit fault enumeration

IEEE transactions on computer-aided design of integrated circuits and systems, 2001-10, Vol.20 (10), p.1226-1235, Article 1226

2001

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IEEE_Xplore

Novel test pattern generators for pseudoexhaustive testing

IEEE transactions on computers, 2000-11, Vol.49 (11), p.1228-1240

2000

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IEEE_Xplore

Region-based image retrieval using integrated color, shape, and location index

Computer vision and image understanding, 2004-04, Vol.94 (1), p.193-233

2004

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A Re-design Technique for Datapath Modules in Error Tolerant Applications

2008 17th Asian Test Symposium, 2008, p.431-437

2008

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IEEE_Xplore

Defect and error tolerance in the presence of massive numbers of defects

IEEE design & test of computers, 2004-05, Vol.21 (3), p.216-227

2004

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IEEE_Xplore

Surface studies and measurement of pumping characteristic of NEG coating (Ti-V-Zr)

2014 International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV), 2014, p.529-532

2014

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IEEE_Xplore

RF cavity design and qualification for proton accelerator

2014 International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV), 2014, p.641-643

2014

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IEEE_Xplore

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Digital Computation in Subthreshold Region for Ultralow-Power Operation: A Device-Circuit-Architecture Codesign Perspective

Brain MRI-based Wilson disease tissue classification: an optimised deep transfer learning approach

LT-RTPG: a new test-per-scan BIST TPG for low switching activity

A 1-GS/s 11-bit ADC With 55-dB SNDR, 250-mW Power Realized by a High Bandwidth Scalable Time-Interleaved Architecture

Abstractive summarization: An overview of the state of the art

On basic arithmetic operations for interval-valued intuitionistic fuzzy sets using the Hamming distance with their application in decision making

Multi-category intuitionistic fuzzy twin support vector machines with an application to plant leaf recognition

Threshold Testing: Improving Yield for Nanoscale VLSI

DS-LFSR: a BIST TPG for low switching activity

On Pareto optimality using novel goal programming approach for fully intuitionistic fuzzy multiobjective quadratic problems

Compact modeling of the effects of parasitic internal fringe capacitance on the threshold voltage of high-k gate-dielectric nanoscale SOI MOSFETs

An automatic test pattern generator for minimizing switching activity during scan testing activity

On optimistic, pessimistic and mixed approaches under different membership functions for fully intuitionistic fuzzy multiobjective nonlinear programming problems

ATPG for heat dissipation minimization during test application

Analytical models for crosstalk excitation and propagation in VLSI circuits

On the parasitic gate capacitance of small-geometry MOSFETs

First Principles Investigation of the Elastic, Optoelectronic and Thermal Properties of XRuSb: (X = V, Nb, Ta) Semi-Heusler Compounds Using the mBJ Exchange Potential

An extraction-based verification methodology for MEMS

Path delay fault diagnosis in combinational circuits with implicit fault enumeration

Novel test pattern generators for pseudoexhaustive testing

Region-based image retrieval using integrated color, shape, and location index

A Re-design Technique for Datapath Modules in Error Tolerant Applications

Defect and error tolerance in the presence of massive numbers of defects

Surface studies and measurement of pumping characteristic of NEG coating (Ti-V-Zr)

RF cavity design and qualification for proton accelerator

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