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TE- and TM-Mode Competition in Subterahertz Gyrotron Using Axis-Encircling Electron Beam

IEEE transactions on electron devices, 2024-01, Vol.71 (1), p.815-821

2024

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Numerical technique with innovative strategies for performance enhancement in micro-probe measuring equipment

Microsystem technologies : sensors, actuators, systems integration, 2024, Vol.30 (1), p.65-81

2024

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Job-level computing with BOINC support

2016 Conference on Technologies and Applications of Artificial Intelligence (TAAI), 2016, p.200-206

2016

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Theoretical Investigation on Down-Taper-Type Frequency-Tunable Reflective Gyro-BWO

IEEE transactions on electron devices, 2024-11, Vol.71 (11), p.7112-7118

2024

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Abnormal Degradation Behaviors Under Negative Bias Stress in Flexible p-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors After Laser Lift-Off Process

IEEE transactions on electron devices, 2023-03, Vol.70 (3), p.1079-1084

2023

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Asymmetric Electrode Structure Induces Dual-Channel Phenomenon under Hot-Carrier Stress in Organic Thin-Film Transistors

IEEE electron device letters, 2023-09, Vol.44 (9), p.1-1

2023

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Analysis of Negative Bias Temperature Instability Degradation in p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors of Different Grain Sizes

IEEE electron device letters, 2019-11, Vol.40 (11), p.1768-1771

2019

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Improvement of Strained Negative Bias Temperature Instability in Flexible LTPS TFTs by a Stress-Release Design

IEEE transactions on electron devices, 2022-03, Vol.69 (3), p.1532-1537

2022

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Effect of ELA Energy Density on Self-Heating Stress in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

IEEE transactions on electron devices, 2020-08, Vol.67 (8), p.1-4

2020

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Suppression of Edge Effect Induced by Positive Gate Bias Stress in Low-Temperature Polycrystalline Silicon TFTs With Channel Width Extension Over Source/Drain Regions

IEEE transactions on electron devices, 2020-12, Vol.67 (12), p.5552-5556

2020

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Enhancing Reliability and 2 mm-Axial Mechanical Bending Endurance by Gate Insulator Improvements in Flexible Polycrystalline Silicon TFTs

IEEE transactions on electron devices, 2022-05, Vol.69 (5), p.2423-2429

2022

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Impact of AC Stress in Low Temperature Polycrystalline Silicon Thin Film Transistors Produced With Different Excimer Laser Annealing Energies

IEEE electron device letters, 2021-06, Vol.42 (6), p.847-850

2021

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Investigation of Degradation Behavior During Illuminated Negative Bias Temperature Stress in P-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors

IEEE electron device letters, 2021-05, Vol.42 (5), p.712-715

2021

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A Novel Structure to Reduce Degradation Under Mechanical Bending in Foldable Low Temperature Polysilicon TFTs Fabricated on Polyimide

IEEE electron device letters, 2020-05, Vol.41 (5), p.725-728

2020

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Enhancement of Mechanical Bending Stress Endurance Using an Organic Trench Structure in Foldable Polycrystalline Silicon TFTs

IEEE electron device letters, 2020-05, Vol.41 (5), p.721-724

2020

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Impact of Dehydrogenation Annealing Process Temperature on Reliability of Polycrystalline Silicon Thin Film Transistors

IEEE electron device letters, 2019-10, Vol.40 (10), p.1638-1641

2019

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A Low Energy Consumption 10-Bit 100kS/s SAR ADC with Timing Control Adaptive Window

2018 IEEE International Symposium on Circuits and Systems (ISCAS), 2018, p.1-4

2018

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Physical Mechanism of the Mechanical Bending of High-Performance Organic TFTs and the Effect of Atmospheric Factors

ACS applied electronic materials, 2022-06, Vol.4 (6), p.3000-3009

2022

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Effective power network prototyping via statistical-based clustering and sequential linear programming

2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013, p.1701-1706

2013

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Modified BER Test for SAR ADCs

2020 IEEE International Test Conference in Asia (ITC-Asia), 2020, p.100-105

2020

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A Novel Structural Design Serving as a Stress Relief Layer for Flexible LTPS TFTs

2019 IEEE International Electron Devices Meeting (IEDM), 2019, p.8.3.1-8.3.4

2019

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Hierarchical power network synthesis for multiple power domain designs

Thirteenth International Symposium on Quality Electronic Design (ISQED), 2012, p.477-482

2012

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TE- and TM-Mode Competition in Subterahertz Gyrotron Using Axis-Encircling Electron Beam

Numerical technique with innovative strategies for performance enhancement in micro-probe measuring equipment

Job-level computing with BOINC support

Theoretical Investigation on Down-Taper-Type Frequency-Tunable Reflective Gyro-BWO

Abnormal Degradation Behaviors Under Negative Bias Stress in Flexible p-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors After Laser Lift-Off Process

Asymmetric Electrode Structure Induces Dual-Channel Phenomenon under Hot-Carrier Stress in Organic Thin-Film Transistors

Analysis of Negative Bias Temperature Instability Degradation in p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors of Different Grain Sizes

Improvement of Strained Negative Bias Temperature Instability in Flexible LTPS TFTs by a Stress-Release Design

Effect of ELA Energy Density on Self-Heating Stress in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Suppression of Edge Effect Induced by Positive Gate Bias Stress in Low-Temperature Polycrystalline Silicon TFTs With Channel Width Extension Over Source/Drain Regions

Enhancing Reliability and 2 mm-Axial Mechanical Bending Endurance by Gate Insulator Improvements in Flexible Polycrystalline Silicon TFTs

Impact of AC Stress in Low Temperature Polycrystalline Silicon Thin Film Transistors Produced With Different Excimer Laser Annealing Energies

Investigation of Degradation Behavior During Illuminated Negative Bias Temperature Stress in P-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors

A Novel Structure to Reduce Degradation Under Mechanical Bending in Foldable Low Temperature Polysilicon TFTs Fabricated on Polyimide

Enhancement of Mechanical Bending Stress Endurance Using an Organic Trench Structure in Foldable Polycrystalline Silicon TFTs

Impact of Dehydrogenation Annealing Process Temperature on Reliability of Polycrystalline Silicon Thin Film Transistors

A Low Energy Consumption 10-Bit 100kS/s SAR ADC with Timing Control Adaptive Window

Physical Mechanism of the Mechanical Bending of High-Performance Organic TFTs and the Effect of Atmospheric Factors

Effective power network prototyping via statistical-based clustering and sequential linear programming

Modified BER Test for SAR ADCs

A Novel Structural Design Serving as a Stress Relief Layer for Flexible LTPS TFTs

Hierarchical power network synthesis for multiple power domain designs

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