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Polarized X-ray scattering reveals non-crystalline orientational ordering in organic films

Nature materials, 2012-04, Vol.11 (6), p.536-543

2012

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Calibrated NEXAFS spectra of common conjugated polymers

The Journal of chemical physics, 2011-01, Vol.134 (2), p.024702-024702-15

2011

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Rigid valence band shift due to molecular surface counter-doping of MoS2

Surface science, 2019-01, Vol.679, p.254-258

2019

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Additive-assisted supramolecular manipulation of polymer:fullerene blend phase morphologies and its influence on photophysical processes

Materials horizons, 2014-03, Vol.1 (2), p.270-279

2014

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Spectromicroscopy of Poly(ethylene terephthalate): Comparison of Spectra and Radiation Damage Rates in X-ray Absorption and Electron Energy Loss

The journal of physical chemistry. B, 1997-03, Vol.101 (11), p.1950-1960

1997

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Towards a detailed understanding of the NEXAFS spectra of bulk polyethylene copolymers and related alkanes

Chemical physics letters, 2003-03, Vol.370 (5), p.834-841

2003

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Tuning Substrate Surface Energies for Blends of Polystyrene and Poly(methyl methacrylate)

Langmuir, 2003-09, Vol.19 (20), p.8526-8535

2003

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A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source

Review of scientific instruments, 1998-08, Vol.69 (8), p.2964-2973

1998

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Carbon-13 Labeling for Improved Tracer Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry

Journal of the American Society for Mass Spectrometry, 2006-08, Vol.17 (8), p.1142-1145

2006

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Carbon-13 Labeled Polymers: An Alternative Tracer for Depth Profiling of Polymer Films and Multilayers Using Secondary Ion Mass Spectrometry

Analytical chemistry (Washington), 2006-05, Vol.78 (10), p.3452-3460

2006

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Thermally Induced Dewetting in Ultrathin C 60 Films on Copper Phthalocyanine

Journal of physical chemistry. C, 2013-12, Vol.117 (49), p.26007-26012

2013

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Chemical and vibronic effects in the high-resolution near-edge X-ray absorption fine structure spectra of polystyrene isotopomers

Chemical physics letters, 2000-05, Vol.322 (5), p.412-418

2000

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High-Energy Cryogenic Blending and Compatibilizing of Immiscible Polymers

Advanced materials (Weinheim), 1999-10, Vol.11 (15), p.1277-1281

1999

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Inner-Shell Excitation Spectroscopy of Polymer and Monomer Isomers of Dimethyl Phthalate

The journal of physical chemistry. B, 1997-03, Vol.101 (13), p.2267-2276

1997

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Effect of an Interactive Surface on the Equilibrium Contact Angles in Bilayer Polymer Films

Langmuir, 2000-03, Vol.16 (5), p.2369-2375

2000

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Electron emission properties of crystalline diamond and III-nitride surfaces

Applied surface science, 1998-06, Vol.130, p.694-703

1998

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Near-Edge X-ray Absorption Fine Structure Spectroscopy on Ordered Films of an Amphiphilic Derivate of 2,5-Diphenyl-1,3,4-Oxadiazole

Langmuir, 1999-02, Vol.15 (4), p.1291-1298

1999

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Phase Separation of Polystyrene and Bromo−Polystyrene Mixtures in Equilibrium Structures in Thin Films

Langmuir, 1998-08, Vol.14 (17), p.4860-4864

1998

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Observation of Polymer Birefringence in Near-Field Optical Microscopy

Langmuir, 1996-01, Vol.12 (2), p.231-234

1996

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Direct Imaging and Spectroscopic Characterization of Stimulus-Responsive Microgels

Journal of the American Chemical Society, 2005-12, Vol.127 (48), p.16808-16809

2005

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Solid state effects in the NEXAFS spectra of alkane-based van der Waals crystals: Breakdown of molecular model

Chemical physics letters, 2006-10, Vol.430 (4), p.287-292

2006

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Imaging electron emission from diamond and III–V nitride surfaces with photo-electron emission microscopy

Applied surface science, 1999-05, Vol.146 (1), p.287-294

1999

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Electronic structure of transition metal high-k dielectrics: interfacial band offset energies for microelectronic devices

Applied surface science, 2003-05, Vol.212-213, p.563-569

2003

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Near-Edge X-ray Absorption Fine Structure Spectroscopy of MDI and TDI Polyurethane Polymers

The journal of physical chemistry. B, 1999-06, Vol.103 (22), p.4603-4610

1999

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Improved images with the scanning photoelectron microscope at the national synchrotron light source

Surface and interface analysis, 1992-06, Vol.19 (1-12), p.17-22

1992

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Polarized X-ray scattering reveals non-crystalline orientational ordering in organic films

Calibrated NEXAFS spectra of common conjugated polymers

Rigid valence band shift due to molecular surface counter-doping of MoS2

Additive-assisted supramolecular manipulation of polymer:fullerene blend phase morphologies and its influence on photophysical processes

Spectromicroscopy of Poly(ethylene terephthalate): Comparison of Spectra and Radiation Damage Rates in X-ray Absorption and Electron Energy Loss

Towards a detailed understanding of the NEXAFS spectra of bulk polyethylene copolymers and related alkanes

Tuning Substrate Surface Energies for Blends of Polystyrene and Poly(methyl methacrylate)

A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source

Carbon-13 Labeling for Improved Tracer Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry

Carbon-13 Labeled Polymers: An Alternative Tracer for Depth Profiling of Polymer Films and Multilayers Using Secondary Ion Mass Spectrometry

Thermally Induced Dewetting in Ultrathin C 60 Films on Copper Phthalocyanine

Chemical and vibronic effects in the high-resolution near-edge X-ray absorption fine structure spectra of polystyrene isotopomers

High-Energy Cryogenic Blending and Compatibilizing of Immiscible Polymers

Inner-Shell Excitation Spectroscopy of Polymer and Monomer Isomers of Dimethyl Phthalate

Effect of an Interactive Surface on the Equilibrium Contact Angles in Bilayer Polymer Films

Electron emission properties of crystalline diamond and III-nitride surfaces

Near-Edge X-ray Absorption Fine Structure Spectroscopy on Ordered Films of an Amphiphilic Derivate of 2,5-Diphenyl-1,3,4-Oxadiazole

Phase Separation of Polystyrene and Bromo−Polystyrene Mixtures in Equilibrium Structures in Thin Films

Observation of Polymer Birefringence in Near-Field Optical Microscopy

Direct Imaging and Spectroscopic Characterization of Stimulus-Responsive Microgels

Solid state effects in the NEXAFS spectra of alkane-based van der Waals crystals: Breakdown of molecular model

Imaging electron emission from diamond and III–V nitride surfaces with photo-electron emission microscopy

Electronic structure of transition metal high-k dielectrics: interfacial band offset energies for microelectronic devices

Near-Edge X-ray Absorption Fine Structure Spectroscopy of MDI and TDI Polyurethane Polymers

Improved images with the scanning photoelectron microscope at the national synchrotron light source

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