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Automatically Testing Database Systems: DBMS testing with test oracles, transaction history, and fuzzing

ACM queue, 2023-12, Vol.21 (6), p.128-135

2023

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OCCAM-v2: Combining Static and Dynamic Analysis for Effective and Efficient Whole-program Specialization: Leveraging scalable pointer analysis, value analysis, and dynamic analysis

ACM queue, 2022-10, Vol.20 (5), p.58-85

2022

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The Fun in Fuzzing: The debugging technique comes into its own

ACM queue, 2022-12, Vol.20 (6), p.80-87

2022

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Taking Flight with Copilot: Early insights and opportunities of AI-powered pair-programming tools

ACM queue, 2022-12, Vol.20 (6), p.35-57

2022

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Getting Off the Mad Path: Debuggers and assertions

ACM queue, 2021-12, Vol.19 (6), p.18-21

Neville-Neil, George V.

2021

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Improving Testing of Deep-learning Systems: A combination of differential and mutation testing results in better test data

ACM queue, 2023-10, Vol.21 (5), p.54-65

2023

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When Should a Black Box Be Transparent?: When is a replacement not a replacement?

ACM queue, 2022-04, Vol.20 (2), p.11-15

Neville-Neil, George V.

2022

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Divide and Conquer: The use and limits of bisection

ACM queue, 2021-06, Vol.19 (3), p.37-39

Neville-Neil, George V.

2021

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Debugging Incidents in Google’s Distributed Systems: How experts debug production issues in complex distributed systems

ACM queue, 2020-04, Vol.18 (2), p.47-66

2020

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To Catch a Failure: The Record-and-Replay Approach to Debugging: A discussion with Robert O’Callahan, Kyle Huey, Devon O’Dell, and Terry Coatta

ACM queue, 2020-02, Vol.18 (1), p.61-79

2020

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EngageCSEduAssignments: to re-use or not re-use? That is the question

ACM Inroads, 2021-09, Vol.12 (3), p.18-20

2021

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Writing an online debugging program for the experienced user

Communications of the ACM, 1968-06, Vol.11 (6), p.423-427

Brady, Paul T.

1968

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Ultra-Low Noise Defect Probing Instrument for Defect Spectroscopy of MOS Transistors

IEEE transactions on device and materials reliability, 2020-06, Vol.20 (2), p.242-250

Waltl, Michael

2020

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Aging and Sintered Layer Defect Detection of Discrete MOSFETs Using Frequency Domain Reflectometry Associated With Parasitic Resistance

IEEE transactions on device and materials reliability, 2024-03, Vol.24 (1), p.1-1

2024

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An automated cucumber inspection system based on neural network

Journal of food process engineering, 2022-09, Vol.45 (9), p.n/a

2022

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Machine Learning Approach for Prediction of Point Defect Effect in FinFET

IEEE transactions on device and materials reliability, 2021-06, Vol.21 (2), p.252-257

2021

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IEEE_Xplore

Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO2Transistors

IEEE transactions on device and materials reliability, 2023-09, Vol.23 (3), p.355

2023

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LCHC-DFT: A Low-Cost High-Coverage Design-for-Testability Technique to Detect Hard-to-Detect Faults in STT-MRAMs in the Presence of Process Variations

IEEE transactions on device and materials reliability, 2022-12, Vol.22 (4), p.477-487

2022

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IEEE_Xplore

A deep reinforcement learning‐based maintenance optimization for vacuum packaging machines considering product quality degradation

Journal of food process engineering, 2023-11, Vol.46 (11)

2023

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Assessing AMS-RF Test Quality by Defect Simulation

IEEE transactions on device and materials reliability, 2019-03, Vol.19 (1), p.55-63

2019

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IEEE_Xplore

Extraction of Statistical Gate Oxide Parameters From Large MOSFET Arrays

IEEE transactions on device and materials reliability, 2020-06, Vol.20 (2), p.251-257

2020

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IEEE_Xplore

CD-DFT: A Current-Difference Design-for-Testability to Detect Short Defects of STT-MRAM Under Process Variations

IEEE transactions on device and materials reliability, 2021-09, Vol.21 (3), p.436-443

2021

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IEEE_Xplore

On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors

IEEE transactions on device and materials reliability, 2021-06, Vol.21 (2), p.199-206

2021

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IEEE_Xplore

Cell-Aware Defect Diagnosis of Customer Returns Based on Supervised Learning

IEEE transactions on device and materials reliability, 2020-06, Vol.20 (2), p.329-340

2020

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IEEE_Xplore

Online Calculation of the Increase in Thermal Resistance Caused by Solder Fatigue for IGBT Modules

IEEE transactions on device and materials reliability, 2017-12, Vol.17 (4), p.785-794

2017

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IEEE_Xplore

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Automatically Testing Database Systems: DBMS testing with test oracles, transaction history, and fuzzing

OCCAM-v2: Combining Static and Dynamic Analysis for Effective and Efficient Whole-program Specialization: Leveraging scalable pointer analysis, value analysis, and dynamic analysis

The Fun in Fuzzing: The debugging technique comes into its own

Taking Flight with Copilot: Early insights and opportunities of AI-powered pair-programming tools

Getting Off the Mad Path: Debuggers and assertions

Improving Testing of Deep-learning Systems: A combination of differential and mutation testing results in better test data

When Should a Black Box Be Transparent?: When is a replacement not a replacement?

Divide and Conquer: The use and limits of bisection

Debugging Incidents in Google’s Distributed Systems: How experts debug production issues in complex distributed systems

To Catch a Failure: The Record-and-Replay Approach to Debugging: A discussion with Robert O’Callahan, Kyle Huey, Devon O’Dell, and Terry Coatta

EngageCSEduAssignments: to re-use or not re-use? That is the question

Writing an online debugging program for the experienced user

Ultra-Low Noise Defect Probing Instrument for Defect Spectroscopy of MOS Transistors

Aging and Sintered Layer Defect Detection of Discrete MOSFETs Using Frequency Domain Reflectometry Associated With Parasitic Resistance

An automated cucumber inspection system based on neural network

Machine Learning Approach for Prediction of Point Defect Effect in FinFET

Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO2Transistors

LCHC-DFT: A Low-Cost High-Coverage Design-for-Testability Technique to Detect Hard-to-Detect Faults in STT-MRAMs in the Presence of Process Variations

A deep reinforcement learning‐based maintenance optimization for vacuum packaging machines considering product quality degradation

Assessing AMS-RF Test Quality by Defect Simulation

Extraction of Statistical Gate Oxide Parameters From Large MOSFET Arrays

CD-DFT: A Current-Difference Design-for-Testability to Detect Short Defects of STT-MRAM Under Process Variations

On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors

Cell-Aware Defect Diagnosis of Customer Returns Based on Supervised Learning

Online Calculation of the Increase in Thermal Resistance Caused by Solder Fatigue for IGBT Modules

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