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Cell-Aware Defect Diagnosis of Customer Returns Based on Supervised Learning

IEEE transactions on device and materials reliability, 2020-06, Vol.20 (2), p.329-340

2020

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IEEE_Xplore

ESI launches simulation software for composites

Reinforced plastics (London), 2017-01, Vol.61 (1), p.23-23

2017

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Procedural Defect Modeling for Virtual Surface Inspection Environments

IEEE computer graphics and applications, 2023-03, Vol.PP (2), p.1-10

2023

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IEEE_Xplore

Correlation Study of Bulk Si Stress and Lithography Defects Using Polarized Stress Imager

IEEE transactions on device and materials reliability, 2020-03, Vol.20 (1), p.221-223

2020

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IEEE_Xplore

Multiple Defects Cause Degradation After High Field Stress in AlGaN/GaN HEMTs

IEEE transactions on device and materials reliability, 2018-09, Vol.18 (3), p.364-376

2018

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IEEE_Xplore

Effect of Hydrogen Molecule Release on NBTI by Low-Temperature Pre-Treatment in P-Channel Power VDMOS Transistors

IEEE transactions on device and materials reliability, 2024-06, Vol.24 (2), p.211-218

2024

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IEEE_Xplore

A DLTS Study on Deep Trench Processing-Induced Trap States in Silicon Photodiodes

IEEE transactions on device and materials reliability, 2024-06, Vol.24 (2), p.161-167

2024

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Failure Characterization of Carbon Nanotube FETs Under Process Variations: Technology Scaling Issues

IEEE transactions on device and materials reliability, 2016-06, Vol.16 (2), p.164-171

2016

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IEEE_Xplore

Online Calculation of the Increase in Thermal Resistance Caused by Solder Fatigue for IGBT Modules

IEEE transactions on device and materials reliability, 2017-12, Vol.17 (4), p.785-794

2017

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IEEE_Xplore

DRIVE SELECTION: How to match motors, drives: Size a variable-speed drive (VSD) for the application, and ask if a general-purpose drive will do or if more embedded intelligence is needed

Control engineering, 2020-11, Vol.67 (11), p.34

Jagnanan, Joshua

2020

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Overview of Bias Temperature Instability in Scaled DRAM Logic for Memory Transistors

IEEE transactions on device and materials reliability, 2020-06, Vol.20 (2), p.258-268

2020

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IEEE_Xplore

Through Silicon Via Reliability

IEEE transactions on device and materials reliability, 2012-06, Vol.12 (2), p.285-295

2012

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IEEE_Xplore

Degradation of UV-A LEDs: Physical Origin and Dependence on Stress Conditions

IEEE transactions on device and materials reliability, 2016-06, Vol.16 (2), p.213-219

2016

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IEEE_Xplore

IIT Madras & University Of Nairobi Researchers Use Metamaterials To Enhance Detection Resolution Of Defects By Guided Wave Ultrasound

Business world (India), 2020-07

2020

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Unveiling the Failure Mechanism of Electrical Interconnection in Thermal-Aged PV Modules

IEEE transactions on device and materials reliability, 2020-03, Vol.20 (1), p.24-32

2020

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IEEE_Xplore

"Surface Defects Are Cost-Intensive Disturbances – But Avoidable"

Kunststoffe International, 2018-03 (3), p.50

Doriat, Dr Clemens

2018

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Qualitative and Quantitative Diagnostic Device for Detecting Defects in Crystalline Silicon PV Cells

IEEE transactions on device and materials reliability, 2021-12, Vol.21 (4), p.647-657

de Carvalho Neto, Jo ao T.

2021

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IEEE_Xplore

Reliability of Highly Stable Amorphous-Silicon Thin-Film Transistors Under Low Gate-Field Stress-Part I: Two-Stage Model for Lifetime Prediction

IEEE transactions on device and materials reliability, 2016-06, Vol.16 (2), p.243-254

2016

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IEEE_Xplore

Test and Repair Methodology for FinFET-Based Memories

IEEE transactions on device and materials reliability, 2015-03, Vol.15 (1), p.3-9

2015

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IEEE_Xplore

Nondestructive and Quantitative Evaluation of a GaAs Epitaxial Layer Covered with a Silicon Nitride Insulating Thin Film after a Highly Accelerated Temperature and Humidity Stress with the use of Photoreflectance Spectroscopy

IEEE transactions on device and materials reliability, 2023-03, Vol.23 (1), p.1-1

Takeuchi, Hideo

2023

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Separation of Interface Traps and Oxide Charge in Ionization Damaged Silicon Bipolar Transistors Based on Experimental Observation

IEEE transactions on device and materials reliability, 2015-06, Vol.15 (2), p.258-260

2015

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IEEE_Xplore

Current Status of Reliability in Extended and Beyond CMOS Devices

IEEE transactions on device and materials reliability, 2016-12, Vol.16 (4), p.647-666

Islam, Ahmad Ehteshamul

2016

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IEEE_Xplore

Applied AI in Defect Detection for Additive Manufacturing: Current Literature, Metrics, Datasets, and Open Challenges

IEEE instrumentation & measurement magazine, 2024-06, Vol.27 (4), p.46-53

2024

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IEEE_Xplore

Experimental Investigation of NBTI Degradation in Power VDMOS Transistors Under Low Magnetic Field

IEEE transactions on device and materials reliability, 2017-03, Vol.17 (1), p.99-105

2017

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IEEE_Xplore

Prevention of Cracking From RDL Stress and Dicing Defects in Glass Substrates

IEEE transactions on device and materials reliability, 2016-03, Vol.16 (1), p.43-49

2016

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IEEE_Xplore

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Cell-Aware Defect Diagnosis of Customer Returns Based on Supervised Learning

ESI launches simulation software for composites

Procedural Defect Modeling for Virtual Surface Inspection Environments

Correlation Study of Bulk Si Stress and Lithography Defects Using Polarized Stress Imager

Multiple Defects Cause Degradation After High Field Stress in AlGaN/GaN HEMTs

Effect of Hydrogen Molecule Release on NBTI by Low-Temperature Pre-Treatment in P-Channel Power VDMOS Transistors

A DLTS Study on Deep Trench Processing-Induced Trap States in Silicon Photodiodes

Failure Characterization of Carbon Nanotube FETs Under Process Variations: Technology Scaling Issues

Online Calculation of the Increase in Thermal Resistance Caused by Solder Fatigue for IGBT Modules

DRIVE SELECTION: How to match motors, drives: Size a variable-speed drive (VSD) for the application, and ask if a general-purpose drive will do or if more embedded intelligence is needed

Overview of Bias Temperature Instability in Scaled DRAM Logic for Memory Transistors

Through Silicon Via Reliability

Degradation of UV-A LEDs: Physical Origin and Dependence on Stress Conditions

IIT Madras & University Of Nairobi Researchers Use Metamaterials To Enhance Detection Resolution Of Defects By Guided Wave Ultrasound

Unveiling the Failure Mechanism of Electrical Interconnection in Thermal-Aged PV Modules

"Surface Defects Are Cost-Intensive Disturbances – But Avoidable"

Qualitative and Quantitative Diagnostic Device for Detecting Defects in Crystalline Silicon PV Cells

Reliability of Highly Stable Amorphous-Silicon Thin-Film Transistors Under Low Gate-Field Stress-Part I: Two-Stage Model for Lifetime Prediction

Test and Repair Methodology for FinFET-Based Memories

Nondestructive and Quantitative Evaluation of a GaAs Epitaxial Layer Covered with a Silicon Nitride Insulating Thin Film after a Highly Accelerated Temperature and Humidity Stress with the use of Photoreflectance Spectroscopy

Separation of Interface Traps and Oxide Charge in Ionization Damaged Silicon Bipolar Transistors Based on Experimental Observation

Current Status of Reliability in Extended and Beyond CMOS Devices

Applied AI in Defect Detection for Additive Manufacturing: Current Literature, Metrics, Datasets, and Open Challenges

Experimental Investigation of NBTI Degradation in Power VDMOS Transistors Under Low Magnetic Field

Prevention of Cracking From RDL Stress and Dicing Defects in Glass Substrates

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