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RC-triggered ESD clamp with low turn-on voltage

2017 IEEE Custom Integrated Circuits Conference (CICC), 2017, p.1-4

2017

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Auswirkungen verschiedener Anästhesievarianten auf die F-Wellen des Nervus ischiadicus der Ratte

Klinische Neurophysiologie, 2013, Vol.44 (1)

2013

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Einfluss von Eisen auf die Entwicklung einer diabetischen Neuropathie bei Ratten

Klinische Neurophysiologie, 2013, Vol.44 (1)

2013

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An on-chip detector of transient stress events

2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), 2017, p.146-151

2017

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Microstructural Assessment of IN718: A Closed-Loop Fatigue Approach

Materials science forum, 2012, Vol.706-709, p.2468-2473

2012

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Determination of the Mechanism of Restoration in Subtransus Hot Deformation of Ti-6Al-4V

Materials science forum, 2012, Vol.706-709, p.252-257

2012

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Introduction to an approach based on the (α+β) microstructure of elements of alloy Ti-6Al-4V

Procedia engineering, 2009, Vol.1 (1), p.31-34

2009

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Feature Extraction from Micrographs of Forged Nickel Based Alloy

18th International Conference on Pattern Recognition (ICPR'06), 2006, Vol.2, p.391-394

2006

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On-Chip sensors to measure level of transient events

2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2017, p.1-10

2017

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Characterization and modeling of three CMOS diode structures in the CDM to HBM timeframe

2006 Electrical Overstress/Electrostatic Discharge Symposium, 2006, p.46-53

2006

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An integrated current-controlled current source with programmable gain for charge amplifier applications

IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings, 1997, Vol.2, p.1154-1159 vol.2

1997

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A CDM robust 5V distributed ESD clamp network leveraging both active MOS and lateral NPN conduction

EOS/ESD Symposium Proceedings, 2011, p.1-9

2011

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Advanced ESD rail clamp network design for high voltage CMOS applications

2004 Electrical Overstress/Electrostatic Discharge Symposium, 2004, p.1-9

2004

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When good trigger circuits go bad: A case history

EOS/ESD Symposium Proceedings, 2011, p.1-6

2011

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A novel testing approach for full-chip CDM characterization

2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2007, p.5A.3-1-5A.3-8

2007

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Closed-Loop CMOS Gate Delay Time Optimization

29th European Solid-State Device Research Conference, 1999, Vol.1, p.504-507

1999

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CDM protection design for CMOS applications using RC-triggered rail clamps

2009 31st EOS/ESD Symposium, 2009, p.1-10

2009

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ESD protection for advanced CMOS SOI technologies

2005 Electrical Overstress/Electrostatic Discharge Symposium, 2005, p.1-10

2005

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Comprehensive ESD protection for flip-chip products in a dual gate oxide 65nm CMOS technology

2006 Electrical Overstress/Electrostatic Discharge Symposium, 2006, p.186-195

2006

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Engineering single NMOS and PMOS output buffers for maximum failure voltage in advanced CMOS technologies

2004 Electrical Overstress/Electrostatic Discharge Symposium, 2004, p.1-10

2004

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Boosted and distributed rail clamp networks for ESD protection in advanced CMOS technologies

2003 Electrical Overstress/Electrostatic Discharge Symposium, 2003, p.1-10

2003

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Modular, portable, and easily simulated ESD protection networks for advanced CMOS technologies

2001 Electrical Overstress/Electrostatic Discharge Symposium, 2001, p.81-94

2001

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P29 Manuka honey downregulates IL-4-induced CCL26 via activation of the aryl hydrocarbon receptor

BRITISH JOURNAL OF DERMATOLOGY, 2023, Vol.189 (1), p.e25-e26

2023

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Muon ( g − 2) in the Standard Model and supersymmetric extensions

EPJ Web of Conferences, 2016, Vol.118, p.1034

2016

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Metadynamic recrystallization of the nickel-based superalloy Allvac 718Plus(TM)

Materials science forum, 2010, Vol.638-642, p.2327-2332

2010

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RC-triggered ESD clamp with low turn-on voltage

Auswirkungen verschiedener Anästhesievarianten auf die F-Wellen des Nervus ischiadicus der Ratte

Einfluss von Eisen auf die Entwicklung einer diabetischen Neuropathie bei Ratten

An on-chip detector of transient stress events

Microstructural Assessment of IN718: A Closed-Loop Fatigue Approach

Determination of the Mechanism of Restoration in Subtransus Hot Deformation of Ti-6Al-4V

Introduction to an approach based on the (α+β) microstructure of elements of alloy Ti-6Al-4V

Feature Extraction from Micrographs of Forged Nickel Based Alloy

On-Chip sensors to measure level of transient events

Characterization and modeling of three CMOS diode structures in the CDM to HBM timeframe

An integrated current-controlled current source with programmable gain for charge amplifier applications

A CDM robust 5V distributed ESD clamp network leveraging both active MOS and lateral NPN conduction

Advanced ESD rail clamp network design for high voltage CMOS applications

When good trigger circuits go bad: A case history

A novel testing approach for full-chip CDM characterization

Closed-Loop CMOS Gate Delay Time Optimization

CDM protection design for CMOS applications using RC-triggered rail clamps

ESD protection for advanced CMOS SOI technologies

Comprehensive ESD protection for flip-chip products in a dual gate oxide 65nm CMOS technology

Engineering single NMOS and PMOS output buffers for maximum failure voltage in advanced CMOS technologies

Boosted and distributed rail clamp networks for ESD protection in advanced CMOS technologies

Modular, portable, and easily simulated ESD protection networks for advanced CMOS technologies

P29 Manuka honey downregulates IL-4-induced CCL26 via activation of the aryl hydrocarbon receptor

Muon ( g − 2) in the Standard Model and supersymmetric extensions

Metadynamic recrystallization of the nickel-based superalloy Allvac 718Plus(TM)

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