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Thickness-dependent thermal properties of amorphous insulating thin films measured by photoreflectance microscopy

Thin solid films, 2017-11, Vol.642, p.157-162

2017

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Prospects for SiGe thermoelectric generators

Solid-state electronics, 2014-08, Vol.98, p.70-74

2014

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A simple method for high yield fabrication of sharp silicon tips

Microelectronic engineering, 2008-03, Vol.85 (3), p.625-630

2008

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Growth and characterisation of titanium sulphide nanostructures by surface-assisted vapour transport methods; from trisulphide ribbons to disulphide nanosheets

International journal of nanotechnology., 2012, Vol.9 (1/2), p.23

2012

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Batch fabricated dual cantilever resistive probe for scanning thermal microscopy

Microelectronic engineering, 2011-08, Vol.88 (8), p.2435-2438

2011

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Microfabricated temperature standard based on Johnson noise measurement for the calibration of micro- and nano-thermometers

Review of scientific instruments, 2005-05, Vol.76 (5), p.054901-054901-7

2005

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Pattern transfer of a 23 nm-period grating and sub-15 nm dots into CVD diamond

Microelectronic engineering, 2004-06, Vol.73, p.319-322

2004

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New Methods for Calibrated Scanning Thermal Microscopy (SThM)

2007 IEEE Sensors, 2007, p.708-711

2007

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Developments in Nanowire Scanning Electrochemical - Atomic Force Microscopy (SECM-AFM) Probes

2007 IEEE Sensors, 2007, p.712-715

2007

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The generation of point defects in GaAs by electron-hole recombination at dislocations

Solid-state electronics, 1978-11, Vol.21 (11-12), p.1413-1417

1978

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Ion beam milling of Cd 0.2Hg 0.8Te

Journal of crystal growth, 1985, Vol.73 (2), p.379-384

1985

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An electron microscope study of defects in Cr-doped CdTe

Journal of crystal growth, 1988-10, Vol.92 (1), p.208-214

1988

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An investigation of the nucleation of photo-deposited cadmium films on various substrates

Journal of crystal growth, 1989-11, Vol.98 (3), p.255-263

1989

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Ion beam milling of Cd0.2Hg0.8Te

Journal of crystal growth, 1985-01, Vol.73 (2), p.379-384

1985

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A cross-sectional tem study of MOVPE grown CdHgTe

Journal of crystal growth, 1990-06, Vol.102 (4), p.819-826

1990

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Transmission electron microscopy of LPE grown CdHgTe

Journal of crystal growth, 1989-06, Vol.96 (2), p.348-356

1989

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Surface damage of CdTe by mechanical polishing investigated by cross-sectional TEM

Journal of crystal growth, 1990-06, Vol.102 (4), p.1069-1073

1990

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Point defect generation during the oxidation of silicon

Proceedings, annual meeting, Electron Microscopy Society of America, 1978, Vol.36 (1), p.320-321

1978

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Defects in ion implanted silicon

Proceedings, annual meeting, Electron Microscopy Society of America, 1978, Vol.36 (1), p.386-387

1978

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The origin of dislocation climb during laser operation

Applied physics letters, 1977-04, Vol.30 (8), p.368-371

1977

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Surface inhomogeneities on arsenic-implanted silicon

Journal of applied physics, 1978-12, Vol.49 (12), p.5843-5845

1978

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Precipitation of boron in silicon

Journal of crystal growth, 1968, Vol.3, p.209-213

1968

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The influence of doping additions on the oxidation of zinc

Scripta metallurgica, 1975-05, Vol.9 (5), p.xviii-xix

1975

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Comments on “Stacking fault energies of some close-packed hexagonal metals”

Scripta metallurgica, 1970-01, Vol.4 (5), p.345-346

1970

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The influence of doping additions on the oxidation of zinc

Acta metallurgica, 1975-01, Vol.23 (8), p.911-918

1975

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Thickness-dependent thermal properties of amorphous insulating thin films measured by photoreflectance microscopy

Prospects for SiGe thermoelectric generators

A simple method for high yield fabrication of sharp silicon tips

Growth and characterisation of titanium sulphide nanostructures by surface-assisted vapour transport methods; from trisulphide ribbons to disulphide nanosheets

Batch fabricated dual cantilever resistive probe for scanning thermal microscopy

Microfabricated temperature standard based on Johnson noise measurement for the calibration of micro- and nano-thermometers

Pattern transfer of a 23 nm-period grating and sub-15 nm dots into CVD diamond

New Methods for Calibrated Scanning Thermal Microscopy (SThM)

Developments in Nanowire Scanning Electrochemical - Atomic Force Microscopy (SECM-AFM) Probes

The generation of point defects in GaAs by electron-hole recombination at dislocations

Ion beam milling of Cd 0.2Hg 0.8Te

An electron microscope study of defects in Cr-doped CdTe

An investigation of the nucleation of photo-deposited cadmium films on various substrates

Ion beam milling of Cd0.2Hg0.8Te

A cross-sectional tem study of MOVPE grown CdHgTe

Transmission electron microscopy of LPE grown CdHgTe

Surface damage of CdTe by mechanical polishing investigated by cross-sectional TEM

Point defect generation during the oxidation of silicon

Defects in ion implanted silicon

The origin of dislocation climb during laser operation

Surface inhomogeneities on arsenic-implanted silicon

Precipitation of boron in silicon

The influence of doping additions on the oxidation of zinc

Comments on “Stacking fault energies of some close-packed hexagonal metals”

The influence of doping additions on the oxidation of zinc

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