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Mixture Experiments: ILL-Conditioning and Quadratic Model Specification

Technometrics, 2002-08, Vol.44 (3), p.260-268

2002

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Projection Properties of Plackett and Burman Designs

Technometrics, 1992-11, Vol.34 (4), p.423-428

1992

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Mixture Designs for Four Components in Orthogonal Blocks

Technometrics, 1993-08, Vol.35 (3), p.268-276

1993

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Isolation of Degrees of Freedom for Box-Behnken Designs

Technometrics, 1994-08, Vol.36 (3), p.283-291

1994

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D-Optimality for Regression Designs: A Review

Technometrics, 1975-02, Vol.17 (1), p.15-23

1975

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Response-Surface Designs for Quantitative and Qualitative Variables

Technometrics, 1988-11, Vol.30 (4), p.423-428

1988

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Generalized Ridge Analysis Under Linear Restrictions, With Particular Applications to Mixture Experiments Problems

Technometrics, 2002-08, Vol.44 (3), p.250-259

2002

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Small Response-Surface Designs

Technometrics, 1990-05, Vol.32 (2), p.187-194

1990

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Another Look at Rotatability

Technometrics, 1990-05, Vol.32 (2), p.195-202

1990

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Small Composite Designs

Technometrics, 1985-05, Vol.27 (2), p.173-180

Draper, Norman R.

1985

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Confidence Regions Around the Ridge of Optimal Response on Fitted Second-Order Response Surfaces

Technometrics, 2003-11, Vol.45 (4), p.333-339

2003

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An Index of Rotatability

Technometrics, 1988-02, Vol.30 (1), p.105-111

1988

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Influential Observations and Outliers in Regression

Technometrics, 1981-02, Vol.23 (1), p.21-26

1981

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The Editor: Technometrics

Technometrics, 1983-05, Vol.25 (2), p.217-217

Draper, N. R.

1983

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Cubic Lack of Fit for Three-Level Second-Order Response Surface Designs

Technometrics, 1983-05, Vol.25 (2), p.217-217

Draper, N. R.

1983

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Factorial Designs, the |X′X| Criterion, and Some Related Matters

Technometrics, 1971-11, Vol.13 (4), p.731-742

1971

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Bayesian Estimation of the Binomial Parameter

Technometrics, 1971-08, Vol.13 (3), p.667-673

1971

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RESPONSE

Technometrics, 1995-02, Vol.37 (1), p.132-132

1995

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RESPONSE

Technometrics, 1995-02, Vol.37 (1), p.132-132

1995

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COMMENTS ON DRAPER, PRESCOTT, LEWIS, DEAN, JOHN, AND TUCK (1993): UNDERSTANDING FORMULATION SYSTEMS

Technometrics, 1995-02, Vol.37 (1), p.131-132

Snee, Ronald D.

1995

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A Comparison of Alternative Tests for Lack of Fit

Technometrics, 1987-02, Vol.29 (1), p.91-93

1987

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Designs for Minimum Bias Estimation

Technometrics, 1988-08, Vol.30 (3), p.319-325

1988

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Connections between Two-Level Designs of Resolutions III and V

Technometrics, 1990-08, Vol.32 (3), p.283-288

1990

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On Testing for Two Outliers or One Outlier in Two-Way Tables

Technometrics, 1978-02, Vol.20 (1), p.69-78

1978

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Testing for Three or Fewer Outliers in Two-Way Tables

Technometrics, 1980-02, Vol.22 (1), p.9-15

1980

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Sciences And Techniques Of General Use
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Experimental Design
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Factorials
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Mixture Experiments: ILL-Conditioning and Quadratic Model Specification

Projection Properties of Plackett and Burman Designs

Mixture Designs for Four Components in Orthogonal Blocks

Isolation of Degrees of Freedom for Box-Behnken Designs

D-Optimality for Regression Designs: A Review

Response-Surface Designs for Quantitative and Qualitative Variables

Generalized Ridge Analysis Under Linear Restrictions, With Particular Applications to Mixture Experiments Problems

Small Response-Surface Designs

Another Look at Rotatability

Small Composite Designs

Confidence Regions Around the Ridge of Optimal Response on Fitted Second-Order Response Surfaces

An Index of Rotatability

Influential Observations and Outliers in Regression

The Editor: Technometrics

Cubic Lack of Fit for Three-Level Second-Order Response Surface Designs

Factorial Designs, the |X′X| Criterion, and Some Related Matters

Bayesian Estimation of the Binomial Parameter

RESPONSE

RESPONSE

COMMENTS ON DRAPER, PRESCOTT, LEWIS, DEAN, JOHN, AND TUCK (1993): UNDERSTANDING FORMULATION SYSTEMS

A Comparison of Alternative Tests for Lack of Fit

Designs for Minimum Bias Estimation

Connections between Two-Level Designs of Resolutions III and V

On Testing for Two Outliers or One Outlier in Two-Way Tables

Testing for Three or Fewer Outliers in Two-Way Tables

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