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Quantum confinement and electronic properties of silicon nanowires

Physical review letters, 2004-06, Vol.92 (23), p.236805.1-236805.4, Article 236805

2004

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Thermal stability and electronic structure of atomically uniform pb films on Si(111)

Physical review letters, 2004-07, Vol.93 (2), p.026802.1-026802.4, Article 026802

2004

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Alternating layer and island growth of Pb on Si by spontaneous quantum phase separation

Physical review letters, 2003-02, Vol.90 (7), p.076104-076104, Article 076104

2003

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Structure determination of surface magic clusters

Physical review letters, 2004-02, Vol.92 (6), p.066103-066103, Article 066103

2004

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Hydrogenation-induced insulating state in the intermetallic compound LaMg2Ni

Physical review letters, 2005-02, Vol.94 (6), p.066403.1-066403.4

2005

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Structure determination of the Si3N4/Si(111)- (8 x 8) surface: a combined study of Kikuchi electron holography, scanning tunneling microscopy, and ab initio calculations

Physical review letters, 2001-03, Vol.86 (13), p.2818-2821

2001

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Broken even-odd symmetry in self-selection of distances between nanoclusters due to the presence or absence of topological solitons

Physical review letters, 2011-04, Vol.106 (16), p.166101-166101, Article 166101

2011

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Self-diffusion of small clusters on fcc metal (111) surfaces

Physical review letters, 2000-07, Vol.85 (5), p.1044-1047

2000

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Correlated Thermal Diffuse Scattering in Low to Medium Energy Electron Diffraction: A New Structural Tool

Physical review letters, 1999, Vol.82 (2), p.335-338

1999

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Direct structural determination by inversion of experimental diffuse low-energy electron diffraction intensities

Physical review letters, 1994-04, Vol.72 (15), p.2434-2437

1994

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Phase-shift correction in three-dimensional imaging using foward-scattering photoemission and Auger spectoscopies

Physical review letters, 1991-01, Vol.66 (1), p.60-63

1991

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Growth of Co layers on Cu(111) studied by forward-focusing angle-resolved x-ray photoemission spectroscopy and real-space imaging

Physical review letters, 1990-10, Vol.65 (18), p.2278-2281

1990

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Direct Three-Dimensional Patterson Inversion of Low-Energy Electron Diffraction I ( E ) Curves

Physical review letters, 1999-09, Vol.83 (13), p.2580-2583

1999

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Large Fermi Density Waves on the Reconstructed Pt(100) Surface

Physical review letters, 1999-09, Vol.83 (13), p.2604-2607

1999

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Quantitative structural determination of metallic film growth on a semiconductor crystal: (√3×√3)R30°→(1×) Pb on Ge(111)

Physical review letters, 1989, Vol.62 (5), p.559-562

1989

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Zhao et al. Reply

Physical review letters, 2005-06, Vol.94 (21), Article 219702

2005

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Hydrogenation-Induced Insulating State in the Intermetallic Compound L a M g 2 N i

Physical review letters, 2005-02, Vol.94 (6), Article 066403

2005

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Direct Structural Determination by Inversion of Experimental Diffuse Low-Energy Electron Diffraction Intensities

Physical review letters, 1994-08, Vol.73 (6), p.912-912

1994

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Huang et al. reply

Physical review letters, 1990-03, Vol.64 (10), p.1183-1183

1990

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Structure Determination of the Si 3 N 4 / Si ( 111 ) - ( 8 × 8 ) Surface: A Combined Study of Kikuchi Electron Holography, Scanning Tunneling Microscopy, and ab initio Calculations

Physical review letters, 2001-03, Vol.86 (13), p.2818-2821

2001

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Field evaporation of silicon in the field ion microscope and scanning tunneling microscope configurations

Physical review letters, 1992-10, Vol.69 (16), p.2427-2430

1992

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Grwoth of Co layers on Cu(111) studied by forward-focusing angle-resolved X-ray photoemission spectroscopy and real-space imaging

Physical review letters, 1990, Vol.65 (18), p.2278-2281

1990

Volltextzugriff (PDF)

Phase-shift correction in three-dimensional imaging using forward-scattering photoemission and Auger-spectroscopies

Physical review letters, 1991, Vol.66 (1), p.60-63

1991

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Quantum Interference between Light Sources Separated by 150 Million Kilometers

Physical review letters, 2019-08, Vol.123 (8), p.080401-080401, Article 080401

2019

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Comment on quantitative structural determination of metallic film growth on a semiconductor crystal : (√3 × √3)R30° → (1 × 1) Pb on Ge(111). Reply

Physical review letters, 1990, Vol.64 (10), p.1182-1183

1990

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Quantum confinement and electronic properties of silicon nanowires

Thermal stability and electronic structure of atomically uniform pb films on Si(111)

Alternating layer and island growth of Pb on Si by spontaneous quantum phase separation

Structure determination of surface magic clusters

Hydrogenation-induced insulating state in the intermetallic compound LaMg2Ni

Structure determination of the Si3N4/Si(111)- (8 x 8) surface: a combined study of Kikuchi electron holography, scanning tunneling microscopy, and ab initio calculations

Broken even-odd symmetry in self-selection of distances between nanoclusters due to the presence or absence of topological solitons

Self-diffusion of small clusters on fcc metal (111) surfaces

Correlated Thermal Diffuse Scattering in Low to Medium Energy Electron Diffraction: A New Structural Tool

Direct structural determination by inversion of experimental diffuse low-energy electron diffraction intensities

Phase-shift correction in three-dimensional imaging using foward-scattering photoemission and Auger spectoscopies

Growth of Co layers on Cu(111) studied by forward-focusing angle-resolved x-ray photoemission spectroscopy and real-space imaging

Direct Three-Dimensional Patterson Inversion of Low-Energy Electron Diffraction I ( E ) Curves

Large Fermi Density Waves on the Reconstructed Pt(100) Surface

Quantitative structural determination of metallic film growth on a semiconductor crystal: (√3×√3)R30°→(1×) Pb on Ge(111)

Zhao et al. Reply

Hydrogenation-Induced Insulating State in the Intermetallic Compound L a M g 2 N i

Direct Structural Determination by Inversion of Experimental Diffuse Low-Energy Electron Diffraction Intensities

Huang et al. reply

Structure Determination of the Si 3 N 4 / Si ( 111 ) - ( 8 × 8 ) Surface: A Combined Study of Kikuchi Electron Holography, Scanning Tunneling Microscopy, and ab initio Calculations

Field evaporation of silicon in the field ion microscope and scanning tunneling microscope configurations

Grwoth of Co layers on Cu(111) studied by forward-focusing angle-resolved X-ray photoemission spectroscopy and real-space imaging

Phase-shift correction in three-dimensional imaging using forward-scattering photoemission and Auger-spectroscopies

Quantum Interference between Light Sources Separated by 150 Million Kilometers

Comment on quantitative structural determination of metallic film growth on a semiconductor crystal : (√3 × √3)R30° → (1 × 1) Pb on Ge(111). Reply

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