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Development of General-purpose Dielectric Constant Imaging Unit for SEM and Direct Observation of Samples in Aqueous Solution

Microscopy and microanalysis, 2023-06, Vol.29 (3), p.1037-1046

2023

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Performance of High-Resolution SEM/EDX Systems Equipped with Transmission Mode (TSEM) for Imaging and Measurement of Size and Size Distribution of Spherical Nanoparticles

Microscopy and microanalysis, 2014-04, Vol.20 (2), p.602-612

2014

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Characterization of Anomalous Grains in FeCo Magnetic Alloys

Microscopy and microanalysis, 2023-06, Vol.29 (3), p.913-918

2023

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Understanding Ion-Beam Damage to Air-Sensitive Lithium Metal With Cryogenic Electron and Ion Microscopy

Microscopy and microanalysis, 2023-07, Vol.29 (4), p.1350-1356

2023

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A Retrofittable Photoelectron Gun for Low-Voltage Imaging Applications in the Scanning Electron Microscope

Microscopy and microanalysis, 2023-09, Vol.29 (5), p.1610-1617

2023

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Comparison of Laboratory Diffraction Contrast Tomography and Electron Backscatter Diffraction Results: Application to Naturally Occurring Chromites

Microscopy and microanalysis, 2023-12, Vol.29 (6), p.1901-1920

2023

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Biological Aspects of the Tongue and Oropharyngeal Cavity of the Eurasian Collared Dove ( Streptopelia decaocto , Columbiformes, Columbidae): Anatomical, Histochemical, and Ultrastructure Study

Microscopy and microanalysis, 2021-10, Vol.27 (5), p.1-1250

2021

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The Phase Transformations Induced by High-Pressure Torsion in Ti–Nb-Based Alloys

Microscopy and microanalysis, 2022-06, Vol.28 (3), p.946-952

2022

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Structural and Functional Characterization of the Tongue and Digestive Tract of Psammophis sibilans (Squamata, Lamprophiidae): Adaptive Strategies for Foraging and Feeding Behaviors

Microscopy and microanalysis, 2020-06, Vol.26 (3), p.524-541

2020

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Investigation of the Image Contrast in an Ultra-Low Voltage Scanning Electron Microscope Using an Auger Electron Spectrometer

Microscopy and microanalysis, 2020-08, Vol.26 (4), p.758-767

2020

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Chemical State Information of Bulk Specimens Obtained by SEM-Based Soft-X-Ray Emission Spectrometry

Microscopy and microanalysis, 2014-06, Vol.20 (3), p.692-697

2014

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Mapping Local Surface Plasmon Modes in a Nanoplasmonic Trimer Using Cathodoluminescence in the Scanning Electron Microscope

Microscopy and microanalysis, 2020-08, Vol.26 (4), p.808-813

2020

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Secondary Electron Energy Contrast of Localized Buried Charge in Metal–Insulator–Silicon Structures

Microscopy and microanalysis, 2018-10, Vol.24 (5), p.453-460

2018

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Depth Resolution Dependence on Sample Thickness and Incident Energy in On-Axis Transmission Kikuchi Diffraction in Scanning Electron Microscope (SEM)

Microscopy and microanalysis, 2017-12, Vol.23 (6), p.1096-1106

2017

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The f-Ratio Quantification Method for X-ray Microanalysis Applied to Mg–Al–Zn Alloys

Microscopy and microanalysis, 2019-02, Vol.25 (1), p.58-69

2019

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Use of an Annular Silicon Drift Detector (SDD) Versus a Conventional SDD Makes Phase Mapping a Practical Solution for Rare Earth Mineral Characterization

Microscopy and microanalysis, 2018-06, Vol.24 (3), p.238-248

2018

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High Energy BSE/SE/STEM Imaging of 8 um Thick Semiconductor Interconnects

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.8-9

2014

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Ionic Liquid Used for Charge Compensation for High-Resolution Imaging and Analysis in the FE-SEM

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.38-39

2014

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Model-Based Library for Critical Dimension Metrology by CD-SEM

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.6-7

2014

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Low-kV SEM Imaging of Epitaxial Graphene Grown on Various Substrates

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.18-19

2014

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Improved SEM Image Resolution Through the Use of Image Restoration Techniques

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.12-13

2014

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SEM Through Dielectric Membranes: Secondary Electron Contrast Reversal

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.24-25

2014

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A Novel Transmission Electron Imaging Technique for Observation of Whole Cells

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.32-33

2014

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Ultra Low Voltage Secondary and Backscatter Imaging in FE-SEM - Successes and Challenges

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.20-21

2014

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Spatial Resolution of Scanning Electron Microscopy without a Vacuum Chamber

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.26-27

2014

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Development of General-purpose Dielectric Constant Imaging Unit for SEM and Direct Observation of Samples in Aqueous Solution

Performance of High-Resolution SEM/EDX Systems Equipped with Transmission Mode (TSEM) for Imaging and Measurement of Size and Size Distribution of Spherical Nanoparticles

Characterization of Anomalous Grains in FeCo Magnetic Alloys

Understanding Ion-Beam Damage to Air-Sensitive Lithium Metal With Cryogenic Electron and Ion Microscopy

A Retrofittable Photoelectron Gun for Low-Voltage Imaging Applications in the Scanning Electron Microscope

Comparison of Laboratory Diffraction Contrast Tomography and Electron Backscatter Diffraction Results: Application to Naturally Occurring Chromites

Biological Aspects of the Tongue and Oropharyngeal Cavity of the Eurasian Collared Dove ( Streptopelia decaocto , Columbiformes, Columbidae): Anatomical, Histochemical, and Ultrastructure Study

The Phase Transformations Induced by High-Pressure Torsion in Ti–Nb-Based Alloys

Structural and Functional Characterization of the Tongue and Digestive Tract of Psammophis sibilans (Squamata, Lamprophiidae): Adaptive Strategies for Foraging and Feeding Behaviors

Investigation of the Image Contrast in an Ultra-Low Voltage Scanning Electron Microscope Using an Auger Electron Spectrometer

Chemical State Information of Bulk Specimens Obtained by SEM-Based Soft-X-Ray Emission Spectrometry

Mapping Local Surface Plasmon Modes in a Nanoplasmonic Trimer Using Cathodoluminescence in the Scanning Electron Microscope

Secondary Electron Energy Contrast of Localized Buried Charge in Metal–Insulator–Silicon Structures

Depth Resolution Dependence on Sample Thickness and Incident Energy in On-Axis Transmission Kikuchi Diffraction in Scanning Electron Microscope (SEM)

The f-Ratio Quantification Method for X-ray Microanalysis Applied to Mg–Al–Zn Alloys

Use of an Annular Silicon Drift Detector (SDD) Versus a Conventional SDD Makes Phase Mapping a Practical Solution for Rare Earth Mineral Characterization

High Energy BSE/SE/STEM Imaging of 8 um Thick Semiconductor Interconnects

Ionic Liquid Used for Charge Compensation for High-Resolution Imaging and Analysis in the FE-SEM

Model-Based Library for Critical Dimension Metrology by CD-SEM

Low-kV SEM Imaging of Epitaxial Graphene Grown on Various Substrates

Improved SEM Image Resolution Through the Use of Image Restoration Techniques

SEM Through Dielectric Membranes: Secondary Electron Contrast Reversal

A Novel Transmission Electron Imaging Technique for Observation of Whole Cells

Ultra Low Voltage Secondary and Backscatter Imaging in FE-SEM - Successes and Challenges

Spatial Resolution of Scanning Electron Microscopy without a Vacuum Chamber

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