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Operational SER Calculations on the SAC-C Orbit Using the Multi-Scales Single Event Phenomena Predictive Platform (MUSCA ^)

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3032-3042

2009

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IEEE_Xplore

LET spectra of proton energy levels from 50 to 500 MeV and their effectiveness for single event effects characterization of microelectronics

IEEE transactions on nuclear science, 2003-12, Vol.50 (6), p.2245-2250

2003

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IEEE_Xplore

Comparative Analysis of Methods for Isochronous Magnetic-Field Calculation

IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.3531-3538

2008

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IEEE_Xplore

The SEU figure of merit and proton upset rate calculations

IEEE transactions on nuclear science, 1998-12, Vol.45 (6), p.2550-2562

Petersen, E.L.

1998

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IEEE_Xplore

Implementation of a "Design of Experiments" Methodology for the Prediction of Phototransistor Degradation in a Space Environment

IEEE transactions on nuclear science, 2009-08, Vol.56 (4), p.2465-2472

2009

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IEEE_Xplore

Comparison of Circular and Polygonal Planar Orbits for Pinhole and Slit-Slat SPECT

IEEE transactions on nuclear science, 2009-06, Vol.56 (3), p.694-703

2009

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IEEE_Xplore

Rate predictions for single-event effects - critique II

IEEE transactions on nuclear science, 2005-12, Vol.52 (6), p.2158-2167

2005

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IEEE_Xplore

Multi-Processor Based Fast Data Acquisition for a Free Electron Laser and Experiments

IEEE transactions on nuclear science, 2008-02, Vol.55 (1), p.256-260

2008

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IEEE_Xplore

Measurement of Single-Event Effects on a Large Number of Commercial DRAMs

IEEE transactions on nuclear science, 2006-08, Vol.53 (4), p.1806-1812

2006

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IEEE_Xplore

Extensions of the burst generation rate method for wider application to proton/neutron-induced single event effects

IEEE transactions on nuclear science, 1998-12, Vol.45 (6), p.2904-2914

Normand, E.

1998

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IEEE_Xplore

Use of light-ion-induced SEU in devices under reduced bias to evaluate their SEU cross section

IEEE transactions on nuclear science, 2004-12, Vol.51 (6), p.3486-3493

2004

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IEEE_Xplore

An empirical model for predicting proton induced upset

IEEE transactions on nuclear science, 1996-12, Vol.43 (6), p.2827-2832

1996

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IEEE_Xplore

A new model for the low altitude trapped proton environment

IEEE transactions on nuclear science, 1998-12, Vol.45 (6), p.2972-2978

1998

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IEEE_Xplore

Predictions and observations of SEU rates in space

IEEE transactions on nuclear science, 1997-12, Vol.44 (6), p.2174-2187

Petersen, E.L.

1997

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IEEE_Xplore

Contribution of GEANT4 to the determination of sensitive volumes in case of high-integrated RAMs

IEEE transactions on nuclear science, 2002-06, Vol.49 (3), p.1480-1485

2002

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IEEE_Xplore

Approaches to proton single-event rate calculations

IEEE transactions on nuclear science, 1996-04, Vol.43 (2), p.496-504

Petersen, E.L.

1996

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IEEE_Xplore

On the figure of merit model for SEU rate calculations

IEEE transactions on nuclear science, 1999-12, Vol.46 (6), p.1504-1510

1999

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IEEE_Xplore

Empirical modeling of proton induced SEU rates

IEEE transactions on nuclear science, 2000-06, Vol.47 (3), p.545-550

Barak, J.

2000

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IEEE_Xplore

Angular and energy dependence of proton upset in optocouplers

IEEE transactions on nuclear science, 1999-12, Vol.46 (6), p.1335-1341

1999

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IEEE_Xplore

Single event upsets in the dual-port-board SRAMs of the MPTB experiment

IEEE transactions on nuclear science, 2000-06, Vol.47 (3), p.712-717

2000

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IEEE_Xplore

Effectiveness of IC shielded packages against space radiation

IEEE transactions on nuclear science, 1997-12, Vol.44 (6), p.2018-2025

1997

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IEEE_Xplore

A simple algorithm for predicting proton SEU rates in space compared to the rates measured on the CRRES satellite

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1994-12, Vol.41 (6), p.2389-2395

1994

Link zum Volltext
IEEE_Xplore

Effects of material and/or structure on shielding of electronic devices

IEEE transactions on nuclear science, 1996-12, Vol.43 (6), p.2665-2670

1996

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IEEE_Xplore

Space radiation evaluation of 16 Mbit DRAMs for mass memory applications

IEEE transactions on nuclear science, 1994-12, Vol.41 (6), p.2267-2271

1994

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IEEE_Xplore

SEE rate calculations using the effective flux approach and a generalized figure of merit approximation

IEEE transactions on nuclear science, 1995-12, Vol.42 (6), p.1995-2003

Petersen, E.L.

1995

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IEEE_Xplore

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Operational SER Calculations on the SAC-C Orbit Using the Multi-Scales Single Event Phenomena Predictive Platform (MUSCA ^)

LET spectra of proton energy levels from 50 to 500 MeV and their effectiveness for single event effects characterization of microelectronics

Comparative Analysis of Methods for Isochronous Magnetic-Field Calculation

The SEU figure of merit and proton upset rate calculations

Implementation of a "Design of Experiments" Methodology for the Prediction of Phototransistor Degradation in a Space Environment

Comparison of Circular and Polygonal Planar Orbits for Pinhole and Slit-Slat SPECT

Rate predictions for single-event effects - critique II

Multi-Processor Based Fast Data Acquisition for a Free Electron Laser and Experiments

Measurement of Single-Event Effects on a Large Number of Commercial DRAMs

Extensions of the burst generation rate method for wider application to proton/neutron-induced single event effects

Use of light-ion-induced SEU in devices under reduced bias to evaluate their SEU cross section

An empirical model for predicting proton induced upset

A new model for the low altitude trapped proton environment

Predictions and observations of SEU rates in space

Contribution of GEANT4 to the determination of sensitive volumes in case of high-integrated RAMs

Approaches to proton single-event rate calculations

On the figure of merit model for SEU rate calculations

Empirical modeling of proton induced SEU rates

Angular and energy dependence of proton upset in optocouplers

Single event upsets in the dual-port-board SRAMs of the MPTB experiment

Effectiveness of IC shielded packages against space radiation

A simple algorithm for predicting proton SEU rates in space compared to the rates measured on the CRRES satellite

Effects of material and/or structure on shielding of electronic devices

Space radiation evaluation of 16 Mbit DRAMs for mass memory applications

SEE rate calculations using the effective flux approach and a generalized figure of merit approximation

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