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Characterization of organic thin films with resonant soft X-ray scattering and reflectivity near the carbon and fluorine absorption edges

The European physical journal. ST, Special topics, 2012-06, Vol.208 (1), p.305-318

Ade, H.

2012

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The utility of resonant soft x-ray scattering and reflectivity for the nanoscale characterization of polymers

The European physical journal. ST, Special topics, 2009-02, Vol.167 (1), p.121-126

2009

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Characterization of organic thin films with resonant soft X-ray scattering and reflectivity near the carbon and fluorine absorption edges: Resonant Elastic X-Ray Scattering in Condensed Matter

The European physical journal. ST, Special topics, 2012, Vol.208, p.305-318

ADE, H

2012

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Fertilizer use in semi-arid areas of Kenya: analysis of smallholder farmers' adoption behavior under liberalized markets

Nutrient cycling in agroecosystems, 2003-05, Vol.66 (1), p.23-31

2003

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Carbon-13 Labeling for Improved Tracer Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry

Journal of the American Society for Mass Spectrometry, 2006-08, Vol.17 (8), p.1142-1145

2006

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Orientation studies of Si-phthalocyanine sulfonic acids cast on SiO x substrates

Applied physics. A, Materials science & processing, 2003-02, Vol.76 (2), p.177-182

2003

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Real-Time Observation of Ti Silicide Epitaxial Islands Growth with the Photoelectron Emission Microscopy

MRS proceedings, 1998, Vol.533, Article 197

1998

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High-Resolution X-Ray Photoemission Electron Microscopy at the Advanced Light Source

MRS proceedings, 1998, Vol.524, Article 25

1998

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Chemical Speciation by NEXAFS Spectromicroscopy: Insights from Molecular Modelling of Polymers

MRS proceedings, 1996, Vol.437, Article 243

1996

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X-Ray Microscopy Of Multiphase Polymeric Materials

MRS proceedings, 1996, Vol.437, Article 99

1996

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Orientation studies of Si-phthalocyanine sulfonic acids cast on SiOx substrates

Applied physics. A, Materials science & processing, 2003-02, Vol.76 (2), p.177-182

2003

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Determination Of The α-Al2O3(0001) Surface Relaxation and Termination by Measurements of Crystal Truncation Rods

MRS proceedings, 1996, Vol.437

1996

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Real-Time Observation of Pt-Si Micro-Droplet Migration by Photo-Electron Emission Microscopy

MRS proceedings, 1999, Vol.584, Article 201

1999

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Iterative Gewinnung von Existenzaussagen für Randwertprobleme mit gewöhnlichen Differentialgleichungen 2. Ordnung

Computing, 1968-09, Vol.3 (3), p.227-238

Ade, H.

1968

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Characterization of Diamond Thin Films by Core-Level Photoabsorption and UV Excitation Raman Spectroscopy

MRS proceedings, 1996, Vol.437, Article 211

1996

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Solid-State Blending of Polymers by Cryogenic Mechanical Alloying

MRS proceedings, 2000, Vol.629, Article FF6.9

2000

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Fermi Surface Mapping Using A Third Generation Light Source

MRS proceedings, 1996-01, Vol.437, Article 47

1996

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Resonance Photoemission at the 2p Excitation Threshold of Ni3Al

MRS proceedings, 1996, Vol.437

1996

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X-Ray Absorption Fine Structure Applied to the Study of Systems with Lattice Instabilities

MRS proceedings, 1996, Vol.437, Article 189

1996

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High Resolution Synchrotron X-Ray Diffraction Tomography Of Large-Grained Samples

MRS proceedings, 1996, Vol.437, Article 125

1996

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Microbeam XAFS Investigations on Fluid Inclusions

MRS proceedings, 1996, Vol.437, Article 201

1996

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Application of Mxcd to Magnetic Thin-Film Sensors

MRS proceedings, 1996, Vol.437, Article 79

1996

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Anomalous X-Ray Scattering On Sr and Sr-Eu Metaphosphate Glasses

MRS proceedings, 1996, Vol.437, Article 161

1996

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XANES Studies at N and C K-Edge of Compounds in the Ternary System Si-C-N

MRS proceedings, 1996, Vol.437, Article 231

1996

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Static Atomic Displacements in Crystalline Solid Solution Alloys

MRS proceedings, 1996, Vol.437, Article 181

1996

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Characterization of organic thin films with resonant soft X-ray scattering and reflectivity near the carbon and fluorine absorption edges

The utility of resonant soft x-ray scattering and reflectivity for the nanoscale characterization of polymers

Characterization of organic thin films with resonant soft X-ray scattering and reflectivity near the carbon and fluorine absorption edges: Resonant Elastic X-Ray Scattering in Condensed Matter

Fertilizer use in semi-arid areas of Kenya: analysis of smallholder farmers' adoption behavior under liberalized markets

Carbon-13 Labeling for Improved Tracer Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry

Orientation studies of Si-phthalocyanine sulfonic acids cast on SiO x substrates

Real-Time Observation of Ti Silicide Epitaxial Islands Growth with the Photoelectron Emission Microscopy

High-Resolution X-Ray Photoemission Electron Microscopy at the Advanced Light Source

Chemical Speciation by NEXAFS Spectromicroscopy: Insights from Molecular Modelling of Polymers

X-Ray Microscopy Of Multiphase Polymeric Materials

Orientation studies of Si-phthalocyanine sulfonic acids cast on SiOx substrates

Determination Of The α-Al2O3(0001) Surface Relaxation and Termination by Measurements of Crystal Truncation Rods

Real-Time Observation of Pt-Si Micro-Droplet Migration by Photo-Electron Emission Microscopy

Iterative Gewinnung von Existenzaussagen für Randwertprobleme mit gewöhnlichen Differentialgleichungen 2. Ordnung

Characterization of Diamond Thin Films by Core-Level Photoabsorption and UV Excitation Raman Spectroscopy

Solid-State Blending of Polymers by Cryogenic Mechanical Alloying

Fermi Surface Mapping Using A Third Generation Light Source

Resonance Photoemission at the 2p Excitation Threshold of Ni3Al

X-Ray Absorption Fine Structure Applied to the Study of Systems with Lattice Instabilities

High Resolution Synchrotron X-Ray Diffraction Tomography Of Large-Grained Samples

Microbeam XAFS Investigations on Fluid Inclusions

Application of Mxcd to Magnetic Thin-Film Sensors

Anomalous X-Ray Scattering On Sr and Sr-Eu Metaphosphate Glasses

XANES Studies at N and C K-Edge of Compounds in the Ternary System Si-C-N

Static Atomic Displacements in Crystalline Solid Solution Alloys

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