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Soft x-ray resonant reflectivity of low- Z material thin films

Applied physics letters, 2005-11, Vol.87 (21), p.214109-214109-3

2005

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Effect of type of Fe(III) salts and reaction temperature in the synthesis of Fe(III)-Mn(II)-Tartrate heteronuclear complex

AIP Conference Proceedings, 2023, Vol.2958 (1)

2023

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Substrate effect on the melting temperature of thin polyethylene films

Physical review letters, 2006-01, Vol.96 (2), p.028303-028303, Article 028303

2006

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The PolLux Microspectroscopy Beam line at the Swiss Light Source

AIP conference proceedings, 2007, Vol.879 (1), p.505-508

2007

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Chemical Contrast in X-ray Microscopy and Spatially Resolved XANES Spectroscopy of Organic Specimens

Science (American Association for the Advancement of Science), 1992-11, Vol.258 (5084), p.972-975

1992

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X-ray Linear Dichroism Microscopy

Science (American Association for the Advancement of Science), 1993-11, Vol.262 (5138), p.1427-1429

1993

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Attractive migration and coalescence: a significant process in the coarsening of TiSi2 islands on the Si(111) surface

Physical review letters, 2003-04, Vol.90 (13), p.136102-136102

2003

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Confinement-induced miscibility in polymer blends

Nature (London), 1999-07, Vol.400 (6739), p.49-51

1999

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Stability and dynamics of Pt-Si liquid microdroplets on Si(001)

Physical review. B, Condensed matter and materials physics, 2004-01, Vol.69 (4), Article 045421

2004

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Electronic structure of noncrystalline transition metal silicate and aluminate alloys

Applied physics letters, 2001-09, Vol.79 (12), p.1775-1777

2001

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Secondary ion mass spectrometry depth profiling of amorphous polymer multilayers using O 2 + and Cs + ion bombardment with a magnetic sector instrument

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2006-03, Vol.24 (2), p.362-368

2006

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Electronic structure of high-k transition metal oxides and their silicate and aluminate alloys

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2002-07, Vol.20 (4), p.1739-1747

2002

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X-ray absorption spectra for transition metal high-κ dielectrics: Final state differences for intra- and inter-atomic transitions

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2004-07, Vol.22 (4), p.2132-2138

2004

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Lowest energy Frenkel and charge transfer exciton intermixing in one-dimensional copper phthalocyanine molecular lattice

Applied physics letters, 2016-11, Vol.109 (21)

2016

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Phase segregation in polymer thin films: Elucidations by X-ray and scanning force microscopy

Europhysics letters, 1999-02, Vol.45 (4), p.526-532

1999

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Bulk and surface characterization of a dewetting thin film polymer bilayer

Applied physics letters, 1998-12, Vol.73 (25), p.3775-3777

1998

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Application of Scanning Transmission X-Ray Microscopy to the Rubber Industry

Rubber chemistry and technology, 2003-09, Vol.76 (4), p.803-811

2003

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X-ray spectromicroscopy with a zone plate generated microprobe

Applied physics letters, 1990-05, Vol.56 (19), p.1841-1843

1990

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Secondary ion mass spectrometry depth profiling of amorphous polymer multilayers using O2+ and Cs+ ion bombardment with a magnetic sector instrument

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2006-03, Vol.24 (2), p.362-368

2006

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Quantitative orientational analysis of a polymeric material (Kevlar® fibers) with x-ray microspectroscopy

Applied physics letters, 1996-12, Vol.69 (25), p.3833-3835

1996

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Astigmatism correction in x-ray scanning photoemission microscope with use of elliptical zone plate

Applied physics letters, 1992-03, Vol.60 (9), p.1040-1042

1992

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Resonant Soft X-ray Reflectivity of Organic Thin Films: Capabilities and Limitations

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2007-01, Vol.A25

2007

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Substrate effect on the melting temperature of thin polyethylenefilms

Physical review letters, 2006-01, Vol.96

2006

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Attractive Migration and Coalescence: A Significant Process in the Coarsening of T i S i 2 Islands on the Si(111) Surface

Physical review letters, 2003-04, Vol.90 (13), Article 136102

2003

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Images of a microelectronic device with the X1‐SPEM, a first generation scanning photoemission microscope at the National Synchrotron Light Source

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1991-05, Vol.9 (3), p.1902-1906

1991

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Soft x-ray resonant reflectivity of low- Z material thin films

Effect of type of Fe(III) salts and reaction temperature in the synthesis of Fe(III)-Mn(II)-Tartrate heteronuclear complex

Substrate effect on the melting temperature of thin polyethylene films

The PolLux Microspectroscopy Beam line at the Swiss Light Source

Chemical Contrast in X-ray Microscopy and Spatially Resolved XANES Spectroscopy of Organic Specimens

X-ray Linear Dichroism Microscopy

Attractive migration and coalescence: a significant process in the coarsening of TiSi2 islands on the Si(111) surface

Confinement-induced miscibility in polymer blends

Stability and dynamics of Pt-Si liquid microdroplets on Si(001)

Electronic structure of noncrystalline transition metal silicate and aluminate alloys

Secondary ion mass spectrometry depth profiling of amorphous polymer multilayers using O 2 + and Cs + ion bombardment with a magnetic sector instrument

Electronic structure of high-k transition metal oxides and their silicate and aluminate alloys

X-ray absorption spectra for transition metal high-κ dielectrics: Final state differences for intra- and inter-atomic transitions

Lowest energy Frenkel and charge transfer exciton intermixing in one-dimensional copper phthalocyanine molecular lattice

Phase segregation in polymer thin films: Elucidations by X-ray and scanning force microscopy

Bulk and surface characterization of a dewetting thin film polymer bilayer

Application of Scanning Transmission X-Ray Microscopy to the Rubber Industry

X-ray spectromicroscopy with a zone plate generated microprobe

Secondary ion mass spectrometry depth profiling of amorphous polymer multilayers using O2+ and Cs+ ion bombardment with a magnetic sector instrument

Quantitative orientational analysis of a polymeric material (Kevlar® fibers) with x-ray microspectroscopy

Astigmatism correction in x-ray scanning photoemission microscope with use of elliptical zone plate

Resonant Soft X-ray Reflectivity of Organic Thin Films: Capabilities and Limitations

Substrate effect on the melting temperature of thin polyethylenefilms

Attractive Migration and Coalescence: A Significant Process in the Coarsening of T i S i 2 Islands on the Si(111) Surface

Images of a microelectronic device with the X1‐SPEM, a first generation scanning photoemission microscope at the National Synchrotron Light Source

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