UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Second crossover energy of insulating materials using stationary electron beam under normal incidence

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2008-03, Vol.266 (5), p.719-729

2008

Volltextzugriff (PDF)

A novel method for measuring the charging kinetics of dielectrics under electron irradiation in SEM

Micron (Oxford, England : 1993), 2023-10, Vol.173, p.103516-103516, Article 103516

2023

Volltextzugriff (PDF)

Influence of ion implantation and electron pre-irradiation on charging of dielectrics under electron beam irradiation: Application to SiO2

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2019-12, Vol.460, p.141-146

2019

Volltextzugriff (PDF)

Charging of dielectrics under ion irradiation

Vacuum, 2020-07, Vol.177, p.109373, Article 109373

2020

Volltextzugriff (PDF)

3D surface topography imaging in SEM with improved backscattered electron detector: Arrangement and reconstruction algorithm

Ultramicroscopy, 2019-12, Vol.207, p.112830-112830, Article 112830

2019

Volltextzugriff (PDF)

Information depth and spatial resolution in BSE microtomography in SEM

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1998-08, Vol.142 (4), p.523-534

1998

Volltextzugriff (PDF)

The effect of contamination of dielectric target surfaces under electron irradiation

Applied surface science, 2008-01, Vol.254 (7), p.2110-2113

Rau, E.I.

2008

Volltextzugriff (PDF)

Secondary electron emission and charging characteristics of ion-irradiated sapphire

Vacuum, 2016-07, Vol.129, p.142-147

2016

Volltextzugriff (PDF)

Electron-beam charging of dielectrics preirradiated with moderate-energy ions and electrons

Physics of the solid state, 2017-08, Vol.59 (8), p.1526-1535

2017

Volltextzugriff (PDF)

Determination of thickness of ultrathin surface films in nanostructures from the energy spectra of reflected electrons

Technical physics, 2015-10, Vol.60 (10), p.1515-1518

2015

Volltextzugriff (PDF)

Updating of the toroidal electron spectrometer intended for a scanning electron microscope and its new applications in diagnostics of micro- and nanoelectronic structures

Technical physics, 2013-03, Vol.58 (3), p.447-454

2013

Volltextzugriff (PDF)

Response function and optimum configuration of semiconductor backscattered-electron detectors for scanning electron microscopes

Semiconductors (Woodbury, N.Y.), 2012-06, Vol.46 (6), p.810-813

2012

Volltextzugriff (PDF)

Analysis of two methods of measurement of surface potential of insulators in SEM: electron spectroscopy and X-ray spectroscopy methods

Applied surface science, 2001-06, Vol.177 (1), p.58-65

2001

Volltextzugriff (PDF)

SEM and SIMS study of the buried Si xN y layer formed in silicon

Vacuum, 2009, Vol.83, p.S107-S110

2009

Volltextzugriff (PDF)

A new experimental approach for characterizing the internal trapped charge and electric field build up in ground-coated insulators during their e − irradiation

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2002-09, Vol.194 (3), p.302-310

2002

Volltextzugriff (PDF)

Dynamic investigation of electron trapping and charge decay in electron-irradiated Al2O3 in a scanning electron microscope: Methodology and mechanisms

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2002-11, Vol.197 (1-2), p.114-127

2002

Volltextzugriff (PDF)

SEM and SIMS study of the buried SixNy layer formed in silicon

Vacuum, 2009-05, Vol.83, p.S107-S110

2009

Volltextzugriff (PDF)

Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samples

Ultramicroscopy, 2004-11, Vol.101 (2-4), p.183-195

2004

Volltextzugriff (PDF)

Formation of buried insulating island-like SiO 2 layer in silicon

Materials science & engineering. B, Solid-state materials for advanced technology, 2005, Vol.124, p.341-344

2005

Volltextzugriff (PDF)

Formation of buried insulating island-like SiO2 layer in silicon

Materials science & engineering. B, Solid-state materials for advanced technology, 2005-12, Vol.124-125, p.341-344

2005

Volltextzugriff (PDF)

Determination of diffusion length by the surface electron beam induced voltage method

Materials science & engineering. B, Solid-state materials for advanced technology, 2002-04, Vol.91, p.256-259

2002

Volltextzugriff (PDF)

Dynamic investigation of electron trapping and charge decay in electron-irradiated Al 2O 3 in a scanning electron microscope: Methodology and mechanisms

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2002, Vol.197 (1), p.114-127

2002

Volltextzugriff (PDF)

Experimental determination of energy resolution and transmission characteristics of an electrostatic toroidal spectrometer adapted to a standard scanning electron microscope

Journal of electron spectroscopy and related phenomena, 1999-12, Vol.105 (2), p.119-127

1999

Volltextzugriff (PDF)

E-beam tomography of planar semiconductor structures

Materials science & engineering. B, Solid-state materials for advanced technology, 1996-12, Vol.42 (1), p.52-56

1996

Volltextzugriff (PDF)

Microtomography of semiconductor crystals in the EBIC mode

Journal of crystal growth, 1990-06, Vol.103 (1), p.197-199

1990

Volltextzugriff (PDF)

1 – 25 von 27

Suche als RSS-Feed

Aktive Filter

KollektionIngenta

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(27)
Mit Volltextzugriff
(27)

Publikationsform

Artikel
(27)

Sprache

Erscheinungsjahr

n.n

Thema

Science & Technology
(23)
Physical Sciences
(19)
Physics
(19)
Technology
(19)
Materials Science
(11)
Physics, Applied
(9)
Materials Science, Multidisciplinary
(8)
Physics, Condensed Matter
(7)
Instruments & Instrumentation
(5)
Nuclear Science & Technology
(5)
Physics, Atomic, Molecular & Chemical
(5)
Physics, Nuclear
(5)
Charging
(4)
Physics And Astronomy
(4)
Secondary Electron Emission
(4)
Semiconductors
(4)
Surface Potential
(4)
Microscopy
(3)
Scanning Electron Microscopy
(3)
Silicon
(3)

15 weitere anzeigen...

Weniger anzeigen...

Kollektion

1 weiteren anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Second crossover energy of insulating materials using stationary electron beam under normal incidence

A novel method for measuring the charging kinetics of dielectrics under electron irradiation in SEM

Influence of ion implantation and electron pre-irradiation on charging of dielectrics under electron beam irradiation: Application to SiO2

Charging of dielectrics under ion irradiation

3D surface topography imaging in SEM with improved backscattered electron detector: Arrangement and reconstruction algorithm

Information depth and spatial resolution in BSE microtomography in SEM

The effect of contamination of dielectric target surfaces under electron irradiation

Secondary electron emission and charging characteristics of ion-irradiated sapphire

Electron-beam charging of dielectrics preirradiated with moderate-energy ions and electrons

Determination of thickness of ultrathin surface films in nanostructures from the energy spectra of reflected electrons

Updating of the toroidal electron spectrometer intended for a scanning electron microscope and its new applications in diagnostics of micro- and nanoelectronic structures

Response function and optimum configuration of semiconductor backscattered-electron detectors for scanning electron microscopes

Analysis of two methods of measurement of surface potential of insulators in SEM: electron spectroscopy and X-ray spectroscopy methods

SEM and SIMS study of the buried Si xN y layer formed in silicon

A new experimental approach for characterizing the internal trapped charge and electric field build up in ground-coated insulators during their e − irradiation

Dynamic investigation of electron trapping and charge decay in electron-irradiated Al2O3 in a scanning electron microscope: Methodology and mechanisms

SEM and SIMS study of the buried SixNy layer formed in silicon

Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samples

Formation of buried insulating island-like SiO 2 layer in silicon

Formation of buried insulating island-like SiO2 layer in silicon

Determination of diffusion length by the surface electron beam induced voltage method

Dynamic investigation of electron trapping and charge decay in electron-irradiated Al 2O 3 in a scanning electron microscope: Methodology and mechanisms

Experimental determination of energy resolution and transmission characteristics of an electrostatic toroidal spectrometer adapted to a standard scanning electron microscope

E-beam tomography of planar semiconductor structures

Microtomography of semiconductor crystals in the EBIC mode

Aktive Filter

Suchergebnisse filtern