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Identification of Channel Hot Carrier Stress-Induced Oxide Traps Leading to Random Telegraph Signals in pMOSFETs

IEEE transactions on electron devices, 2021-02, Vol.68 (2), p.713-719

2021

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A Stand-Alone, Physics-Based, Measurement-Driven Model and Simulation Tool for Random Telegraph Signals Originating From Experimentally Identified MOS Gate-Oxide Defects

IEEE transactions on electron devices, 2016-04, Vol.63 (4), p.1428-1436

2016

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Using the Methods of Statistical Data Analysis to Improve the Trustworthiness of Software Reliability Modeling

IEEE access, 2022, Vol.10, p.25358-25375

2022

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Two Types of ^ Centers as Gate Oxide Defects Responsible for Hole Trapping and Random Telegraph Signals in pMOSFETs

IEEE transactions on electron devices, 2018-10, Vol.65 (10), p.4527-4534

2018

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A Physical Understanding of RF Noise in Bulk nMOSFETs With Channel Lengths in the Nanometer Regime

IEEE transactions on electron devices, 2012-01, Vol.59 (1), p.197-205

2012

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Simulation of oxide trapping noise in submicron n-channel MOSFETs

IEEE transactions on electron devices, 2003-03, Vol.50 (3), p.846-852

2003

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A Physics-Based Analytical \hbox/f Noise Model for RESURF LDMOS Transistors

IEEE transactions on electron devices, 2013-02, Vol.60 (2), p.677-683

2013

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Temperature dependence of threshold voltage fluctuations in CMOS transistors incorporating halo implant

2014 44th European Solid State Device Research Conference (ESSDERC), 2014, p.413-416

2014

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Maximum allowable bulk defect density for generation-recombination noise-free device operation

IEEE transactions on electron devices, 2002-11, Vol.49 (11), p.2080-2082

2002

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An IR-Drop Aware Test Pattern Generator for Scan-Based At-Speed Testing

2016 IEEE 25th Asian Test Symposium (ATS), 2016, p.167-172

2016

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Modelling of mixed hub-and-spoke express freight network considering customer satisfaction

2016 2nd IEEE International Conference on Computer and Communications (ICCC), 2016, p.2481-2485

2016

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A Physics-Based Analytical 1/f Noise Model for RESURF LDMOS Transistors : ADVANCED MODELING OF POWER DEVICES AND THEIR APPLICATIONS

IEEE transactions on electron devices, 2013, Vol.60 (2), p.677-683

2013

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Variability of random telegraph noise in analog MOS transistors

2013 22nd International Conference on Noise and Fluctuations (ICNF), 2013, p.1-4

2013

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Review of LDMOS time dependent degradation based on low-frequency noise modeling

2013 22nd International Conference on Noise and Fluctuations (ICNF), 2013, p.1-4

2013

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Based on the optimal frequency band of maximum correlation kurtosis de-convolution for bearing weak fault diagnosis

2017 Prognostics and System Health Management Conference (PHM-Harbin), 2017, p.1-5

2017

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A wideband monopole antenna with tunable and switchable notch response

2017 IEEE International Symposium on Antennas and Propagation & USNC/URSI National Radio Science Meeting, 2017, p.1377-1378

2017

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A novel spin wave based antenna using magnetic materials

2017 IEEE International Symposium on Antennas and Propagation & USNC/URSI National Radio Science Meeting, 2017, p.1121-1122

2017

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Quantitative assessment of interstitial lung disease based on RDNet convolutional network

2022 IEEE International Conference on Bioinformatics and Biomedicine (BIBM), 2022, p.1550-1553

2022

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A 3D TSV-MEMS Based Heterogeneous Integration Technology for RF Application

2021 22nd International Conference on Electronic Packaging Technology (ICEPT), 2021, p.1-4

2021

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Simulation of oxide trapping noise in submicron n-channel MOSFETs

IEEE transactions on electron devices, 2003-03, Vol.50 (3), p.846-852

2003

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Modelling and Control of Timed Event Graphs with Shared Resource in Dioids

2023 China Automation Congress (CAC), 2023, p.5126-5131

2023

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Device physics origin and solutions to threshold voltage fluctuations in sub 130 nm CMOS incorporating halo implant

2010 IEEE Dallas Circuits and Systems Workshop, 2010, p.1-4

2010

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High-frequency noise measurements on MOSFETs with channel-lengths in sub-100 nm regime

2009 2nd International Workshop on Electron Devices and Semiconductor Technology, 2009, p.1-4

2009

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Modeling and Analysis of Energy Scheduling for Grid-connected Multi-microgrid System Based on Colored Petri Net

2023 4th International Conference on Power Engineering (ICPE), 2023, p.397-401

2023

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Numerical investigation of excess RF channel noise in sub-100 nm MOSFETs

2009 2nd International Workshop on Electron Devices and Semiconductor Technology, 2009, p.1-4

2009

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Identification of Channel Hot Carrier Stress-Induced Oxide Traps Leading to Random Telegraph Signals in pMOSFETs

A Stand-Alone, Physics-Based, Measurement-Driven Model and Simulation Tool for Random Telegraph Signals Originating From Experimentally Identified MOS Gate-Oxide Defects

Using the Methods of Statistical Data Analysis to Improve the Trustworthiness of Software Reliability Modeling

Two Types of ^ Centers as Gate Oxide Defects Responsible for Hole Trapping and Random Telegraph Signals in pMOSFETs

A Physical Understanding of RF Noise in Bulk nMOSFETs With Channel Lengths in the Nanometer Regime

Simulation of oxide trapping noise in submicron n-channel MOSFETs

A Physics-Based Analytical \hbox/f Noise Model for RESURF LDMOS Transistors

Temperature dependence of threshold voltage fluctuations in CMOS transistors incorporating halo implant

Maximum allowable bulk defect density for generation-recombination noise-free device operation

An IR-Drop Aware Test Pattern Generator for Scan-Based At-Speed Testing

Modelling of mixed hub-and-spoke express freight network considering customer satisfaction

A Physics-Based Analytical 1/f Noise Model for RESURF LDMOS Transistors : ADVANCED MODELING OF POWER DEVICES AND THEIR APPLICATIONS

Variability of random telegraph noise in analog MOS transistors

Review of LDMOS time dependent degradation based on low-frequency noise modeling

Based on the optimal frequency band of maximum correlation kurtosis de-convolution for bearing weak fault diagnosis

A wideband monopole antenna with tunable and switchable notch response

A novel spin wave based antenna using magnetic materials

Quantitative assessment of interstitial lung disease based on RDNet convolutional network

A 3D TSV-MEMS Based Heterogeneous Integration Technology for RF Application

Simulation of oxide trapping noise in submicron n-channel MOSFETs

Modelling and Control of Timed Event Graphs with Shared Resource in Dioids

Device physics origin and solutions to threshold voltage fluctuations in sub 130 nm CMOS incorporating halo implant

High-frequency noise measurements on MOSFETs with channel-lengths in sub-100 nm regime

Modeling and Analysis of Energy Scheduling for Grid-connected Multi-microgrid System Based on Colored Petri Net

Numerical investigation of excess RF channel noise in sub-100 nm MOSFETs

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