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High-end image classification on the dogs vs. cats dataset using convolutional neural network

AIP Conference Proceedings, 2022, Vol.2481 (1)

2022

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Modeling the polysilicon depletion effect and its impact on submicrometer CMOS circuit performance

IEEE transactions on electron devices, 1995-05, Vol.42 (5), p.935-943

1995

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Transcribed Digits and Apparel Classification using Convolutional Neural Network

2021 International Conference on Communication information and Computing Technology (ICCICT), 2021, p.1-6

2021

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PCIM: a physically based continuous short-channel IGFET model for circuit simulation

IEEE transactions on electron devices, 1994-06, Vol.41 (6), p.988-997

1994

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A unified RLC model for high-speed on-chip interconnects

IEEE transactions on electron devices, 2003-06, Vol.50 (6), p.1501-1510

2003

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Atto-farad measurement and modeling of on-chip coupling capacitance

IEEE electron device letters, 2004-02, Vol.25 (2), p.92-94

2004

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MOSFET substrate current model for circuit simulation

IEEE transactions on electron devices, 1991-06, Vol.38 (6), p.1392-1398

1991

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An analytic polysilicon depletion effect model for MOSFETs

IEEE electron device letters, 1994-04, Vol.15 (4), p.129-131

1994

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Interconnect characterization of X architecture diagonal lines for VLSI design

IEEE transactions on semiconductor manufacturing, 2005-05, Vol.18 (2), p.262-271

2005

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Modeling and extraction of interconnect capacitances for multilayer VLSI circuits

IEEE transactions on computer-aided design of integrated circuits and systems, 1996-01, Vol.15 (1), p.58-67

1996

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FTIR and optical assessment of zinc doped calcium phospho-borosilicate sol-gel glasses/glass-ceramics

AIP Conference Proceedings, 2015, Vol.1675 (1)

2015

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A new technique for measuring MOSFET inversion layer mobility

IEEE transactions on electron devices, 1993-06, Vol.40 (6), p.1134-1139

1993

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A semi-empirical model of the MOSFET inversion layer mobility for low-temperature operation

IEEE transactions on electron devices, 1987-01, Vol.34 (1), p.89-93

1987

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Electron and hole mobilities in silicon as a function of concentration and temperature

IEEE transactions on electron devices, 1982-02, Vol.29 (2), p.292-295

1982

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MOSFET modeling gets physical

IEEE circuits and devices magazine, 2001-11, Vol.17 (6), p.29-36

2001

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Plasma production in large volume plasma system by compact electron cyclotron resonance sources

2013 Abstracts IEEE International Conference on Plasma Science (ICOPS), 2013, p.1-1

2013

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Circuit design guidelines for n-channel MOSFET hot carrier robustness

IEEE transactions on electron devices, 1993-07, Vol.40 (7), p.1284-1295

1993

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Modeling the anomalous threshold voltage behavior of submicrometer MOSFET's

IEEE electron device letters, 1992-02, Vol.13 (2), p.92-94

1992

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Effects of source/drain implants on short-channel MOSFET I-V and C-V characteristics

IEEE transactions on electron devices, 1995-07, Vol.42 (7), p.1255-1261

1995

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Direct N-body Kernels for Multicore Platforms

2009 International Conference on Parallel Processing, 2009, p.379-387

2009

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A new method of determination of minority carrier diffusion length in the base region of silicon solar cells

IEEE transactions on electron devices, 1994-03, Vol.41 (3), p.367-372

1994

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Instruction Selection in ASIP Synthesis Using Functional Matching

2010 23rd International Conference on VLSI Design, 2010, p.146-151

2010

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BEST: A symbolic testing tool for predicting multi-threaded program failures

2011 26th IEEE/ACM International Conference on Automated Software Engineering (ASE 2011), 2011, p.596-599

2011

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Development of compact electron cyclotron resonance plasma source

2013 Abstracts IEEE International Conference on Plasma Science (ICOPS), 2013, p.1-1

2013

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SPICE model and parameters for fully-depleted SOI MOSFET's including self-heating

IEEE electron device letters, 1994-10, Vol.15 (10), p.374-376

1994

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High-end image classification on the dogs vs. cats dataset using convolutional neural network

Modeling the polysilicon depletion effect and its impact on submicrometer CMOS circuit performance

Transcribed Digits and Apparel Classification using Convolutional Neural Network

PCIM: a physically based continuous short-channel IGFET model for circuit simulation

A unified RLC model for high-speed on-chip interconnects

Atto-farad measurement and modeling of on-chip coupling capacitance

MOSFET substrate current model for circuit simulation

An analytic polysilicon depletion effect model for MOSFETs

Interconnect characterization of X architecture diagonal lines for VLSI design

Modeling and extraction of interconnect capacitances for multilayer VLSI circuits

FTIR and optical assessment of zinc doped calcium phospho-borosilicate sol-gel glasses/glass-ceramics

A new technique for measuring MOSFET inversion layer mobility

A semi-empirical model of the MOSFET inversion layer mobility for low-temperature operation

Electron and hole mobilities in silicon as a function of concentration and temperature

MOSFET modeling gets physical

Plasma production in large volume plasma system by compact electron cyclotron resonance sources

Circuit design guidelines for n-channel MOSFET hot carrier robustness

Modeling the anomalous threshold voltage behavior of submicrometer MOSFET's

Effects of source/drain implants on short-channel MOSFET I-V and C-V characteristics

Direct N-body Kernels for Multicore Platforms

A new method of determination of minority carrier diffusion length in the base region of silicon solar cells

Instruction Selection in ASIP Synthesis Using Functional Matching

BEST: A symbolic testing tool for predicting multi-threaded program failures

Development of compact electron cyclotron resonance plasma source

SPICE model and parameters for fully-depleted SOI MOSFET's including self-heating

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