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High voltage and high current density vertical GaN power diodes

Electronics letters, 2016-06, Vol.52 (13), p.1170-1171

2016

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Analysis of TID Process, Geometry, and Bias Condition Dependence in 14-nm FinFETs and Implications for RF and SRAM Performance

IEEE transactions on nuclear science, 2017-01, Vol.64 (1), p.285-292

2017

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The MODIS cloud products: algorithms and examples from Terra

IEEE transactions on geoscience and remote sensing, 2003-02, Vol.41 (2), p.459-473

2003

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Electron-Induced Single-Event Upsets in Static Random Access Memory

IEEE transactions on nuclear science, 2013-12, Vol.60 (6), p.4122-4129

2013

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In Situ Observation of Circuit Behavior Using Pump-Probe Laser Voltage Probe Technique

IEEE transactions on nuclear science, 2024-04, Vol.71 (4), p.654-662

2024

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Evidence of Interface Trap Build-Up in Irradiated 14-nm Bulk FinFET Technologies

IEEE transactions on nuclear science, 2021-05, Vol.68 (5), p.671-676

2021

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Technology Scaling Comparison of Flip-Flop Heavy-Ion Single-Event Upset Cross Sections

IEEE transactions on nuclear science, 2013-12, Vol.60 (6), p.4368-4373

2013

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Radiation Response of AlGaN-Channel HEMTs

IEEE transactions on nuclear science, 2019-01, Vol.66 (1), p.344-351

2019

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Compact Modeling of Total Ionizing Dose and Aging Effects in MOS Technologies

IEEE transactions on nuclear science, 2015-08, Vol.62 (4), p.1501-1515

2015

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Performance and Breakdown Characteristics of Irradiated Vertical Power GaN P-i-N Diodes

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2912-2918

2015

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Heavy-Ion-Induced Current Transients in Bulk and SOI FinFETs

IEEE transactions on nuclear science, 2012-12, Vol.59 (6), p.2674-2681

2012

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Aerosol properties over bright-reflecting source regions

IEEE transactions on geoscience and remote sensing, 2004-03, Vol.42 (3), p.557-569

2004

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A Systems Engineering Hackathon - A Methodology Involving Multiple Stakeholders to Progress Conceptual Design of a Complex Engineered Product

IEEE access, 2018-01, Vol.6, p.38399-38410

2018

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N-Polar GaN HEMTs in a High-Uniformity 100-mm Wafer Process With 43.6% Power-Added Efficiency and 2 W/mm at 94 GHz

IEEE microwave and wireless technology letters (Print), 2023-07, Vol.33 (7), p.1-0

2023

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UW-Scat: A Ground-Based Dual-Frequency Scatterometer for Observation of Snow Properties

IEEE geoscience and remote sensing letters, 2013-05, Vol.10 (3), p.528-532

2013

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Electron-Induced Single Event Upsets in 28 nm and 45 nm Bulk SRAMs

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2709-2716

2015

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Charge Generation by Secondary Particles From Nuclear Reactions in BEOL Materials

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3172-3179

2009

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Spatially complete global spectral surface albedos: value-added datasets derived from Terra MODIS land products

IEEE transactions on geoscience and remote sensing, 2005-01, Vol.43 (1), p.144-158

2005

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Cloud and aerosol properties, precipitable water, and profiles of temperature and water vapor from MODIS

IEEE transactions on geoscience and remote sensing, 2003-02, Vol.41 (2), p.442-458

2003

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Selection of Well Contact Densities for Latchup-Immune Minimal-Area ICs

IEEE transactions on nuclear science, 2010-12, Vol.57 (6), p.3575-3581

2010

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Evaluation of Multiclass Model Observers in PET LROC Studies

IEEE transactions on nuclear science, 2007-02, Vol.54 (1), p.116-123

2007

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In-Operando Spatial Imaging of Edge Termination Electric Fields in GaN Vertical p-n Junction Diodes

IEEE electron device letters, 2016-06, Vol.37 (6), p.766-769

2016

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Single-Event Transient Sensitivity of InAlSb/InAs/AlGaSb High Electron Mobility Transistors

IEEE transactions on nuclear science, 2012-12, Vol.59 (6), p.2691-2696

2012

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Theoretical and Numerical Study of MLEM and OSEM Reconstruction Algorithms for Motion Correction in Emission Tomography

IEEE transactions on nuclear science, 2009-10, Vol.56 (5), p.2739-2749

2009

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Anomaly Detection of Calcifications in Mammography Based on 11,000 Negative Cases

IEEE transactions on biomedical engineering, 2022-05, Vol.69 (5), p.1639-1650

2022

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High voltage and high current density vertical GaN power diodes

Analysis of TID Process, Geometry, and Bias Condition Dependence in 14-nm FinFETs and Implications for RF and SRAM Performance

The MODIS cloud products: algorithms and examples from Terra

Electron-Induced Single-Event Upsets in Static Random Access Memory

In Situ Observation of Circuit Behavior Using Pump-Probe Laser Voltage Probe Technique

Evidence of Interface Trap Build-Up in Irradiated 14-nm Bulk FinFET Technologies

Technology Scaling Comparison of Flip-Flop Heavy-Ion Single-Event Upset Cross Sections

Radiation Response of AlGaN-Channel HEMTs

Compact Modeling of Total Ionizing Dose and Aging Effects in MOS Technologies

Performance and Breakdown Characteristics of Irradiated Vertical Power GaN P-i-N Diodes

Heavy-Ion-Induced Current Transients in Bulk and SOI FinFETs

Aerosol properties over bright-reflecting source regions

A Systems Engineering Hackathon - A Methodology Involving Multiple Stakeholders to Progress Conceptual Design of a Complex Engineered Product

N-Polar GaN HEMTs in a High-Uniformity 100-mm Wafer Process With 43.6% Power-Added Efficiency and 2 W/mm at 94 GHz

UW-Scat: A Ground-Based Dual-Frequency Scatterometer for Observation of Snow Properties

Electron-Induced Single Event Upsets in 28 nm and 45 nm Bulk SRAMs

Charge Generation by Secondary Particles From Nuclear Reactions in BEOL Materials

Spatially complete global spectral surface albedos: value-added datasets derived from Terra MODIS land products

Cloud and aerosol properties, precipitable water, and profiles of temperature and water vapor from MODIS

Selection of Well Contact Densities for Latchup-Immune Minimal-Area ICs

Evaluation of Multiclass Model Observers in PET LROC Studies

In-Operando Spatial Imaging of Edge Termination Electric Fields in GaN Vertical p-n Junction Diodes

Single-Event Transient Sensitivity of InAlSb/InAs/AlGaSb High Electron Mobility Transistors

Theoretical and Numerical Study of MLEM and OSEM Reconstruction Algorithms for Motion Correction in Emission Tomography

Anomaly Detection of Calcifications in Mammography Based on 11,000 Negative Cases

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