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Aluminum scandium nitride-based metal–ferroelectric–metal diode memory devices with high on/off ratios

Applied physics letters, 2021-05, Vol.118 (20)

2021

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Analysis of twin defects in GaAs(111)B molecular beam epitaxy growth

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2000-05, Vol.18 (3), p.1566-1571

2000

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Atomic level cleaning of poly-methyl-methacrylate residues from the graphene surface using radiolized water at high temperatures

Applied physics letters, 2017-09, Vol.111 (10)

2017

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Comparative study of the alloying effect on the initial oxidation of Cu-Au(100) and Cu-Pt(100)

Applied physics letters, 2014-03, Vol.104 (12)

2014

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Critical review: Effects of complex interactions on structure and dynamics of supported metal catalysts

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2014-03, Vol.32 (2)

2014

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Crystallization and Electrochemical Performance of LSCF-CGO Thin Film Cathodes Processed by Single Solution Spray Pyrolysis

AIP conference proceedings, 2012-03

2012

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Determination of the mechanism and extent of surface degradation in Ni-based cathode materials after repeated electrochemical cycling

APL materials, 2016-09, Vol.4 (9), p.096105-096105-7

2016

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Dislocation pinning effects induced by nano-precipitates during warm laser shock peening: Dislocation dynamic simulation and experiments

Journal of applied physics, 2011-07, Vol.110 (2), p.023518-023518-8

2011

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Efficacy of boron nitride encapsulation against plasma-processing of 2D semiconductor layers

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2021-05, Vol.39 (3)

2021

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Electrical breakdown strength enhancement in aluminum scandium nitride through a compositionally modulated periodic multilayer structure

Journal of applied physics, 2021-10, Vol.130 (14)

2021

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Epitaxial growth and magnetic properties of kagome metal FeSn/elemental ferromagnet heterostructures

Journal of applied physics, 2024-02, Vol.135 (8)

2024

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Erratum: “A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images” [J. Appl. Phys. 116 , 104905 (2014)]

Journal of applied physics, 2014-10, Vol.116 (16)

2014

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Fabrication and characterization of solid-state nanopores using a field emission scanning electron microscope

Applied physics letters, 2006-03, Vol.88 (10), p.103109-103109-3

2006

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Fabrication of conductive interconnects by Ag migration in Cu–Ag core-shell nanoparticles

Applied physics letters, 2010-04, Vol.96 (14)

2010

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Ferroelectric behavior of sputter deposited Al0.72Sc0.28N approaching 5 nm thickness

Applied physics letters, 2023-05, Vol.122 (22)

2023

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GaN nanostructure design for optimal dislocation filtering

Journal of applied physics, 2010-10, Vol.108 (7), p.074313-074313-8

2010

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Gas mixing system for imaging of nanomaterials under dynamic environments by environmental transmission electron microscopy

Review of scientific instruments, 2014-03, Vol.85 (3)

2014

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III-nitride nanopyramid light emitting diodes grown by organometallic vapor phase epitaxy

Journal of applied physics, 2010-08, Vol.108 (4), p.044303-044303-8

2010

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In-Situ TEM Controlled Growth of Silicide in Si Nanowires

AIP conference proceedings, 2012-03

2012

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Investigation of femtosecond laser assisted nano and microscale modifications in lithium niobate

Journal of applied physics, 2005-04, Vol.97 (7), p.074316-074316-9

2005

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Large-scale graphitic thin films synthesized on Ni and transferred to insulators: Structural and electronic properties

Journal of applied physics, 2010-02, Vol.107 (4), p.044310-044310-7

2010

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Metal delocalization and surface decoration in direct-write nanolithography by electron beam induced deposition

Applied physics letters, 2004-07, Vol.85 (1), p.49-51

2004

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Metal-ferroelectric AlScN-semiconductor memory devices on SiC wafers

Applied physics letters, 2023-09, Vol.123 (12)

2023

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A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images

Journal of applied physics, 2014-09, Vol.116 (10)

2014

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A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images

Journal of applied physics, 2014-09, Vol.116 (10)

2014

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Aluminum scandium nitride-based metal–ferroelectric–metal diode memory devices with high on/off ratios

Analysis of twin defects in GaAs(111)B molecular beam epitaxy growth

Atomic level cleaning of poly-methyl-methacrylate residues from the graphene surface using radiolized water at high temperatures

Comparative study of the alloying effect on the initial oxidation of Cu-Au(100) and Cu-Pt(100)

Critical review: Effects of complex interactions on structure and dynamics of supported metal catalysts

Crystallization and Electrochemical Performance of LSCF-CGO Thin Film Cathodes Processed by Single Solution Spray Pyrolysis

Determination of the mechanism and extent of surface degradation in Ni-based cathode materials after repeated electrochemical cycling

Dislocation pinning effects induced by nano-precipitates during warm laser shock peening: Dislocation dynamic simulation and experiments

Efficacy of boron nitride encapsulation against plasma-processing of 2D semiconductor layers

Electrical breakdown strength enhancement in aluminum scandium nitride through a compositionally modulated periodic multilayer structure

Epitaxial growth and magnetic properties of kagome metal FeSn/elemental ferromagnet heterostructures

Erratum: “A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images” [J. Appl. Phys. 116 , 104905 (2014)]

Fabrication and characterization of solid-state nanopores using a field emission scanning electron microscope

Fabrication of conductive interconnects by Ag migration in Cu–Ag core-shell nanoparticles

Ferroelectric behavior of sputter deposited Al0.72Sc0.28N approaching 5 nm thickness

GaN nanostructure design for optimal dislocation filtering

Gas mixing system for imaging of nanomaterials under dynamic environments by environmental transmission electron microscopy

III-nitride nanopyramid light emitting diodes grown by organometallic vapor phase epitaxy

In-Situ TEM Controlled Growth of Silicide in Si Nanowires

Investigation of femtosecond laser assisted nano and microscale modifications in lithium niobate

Large-scale graphitic thin films synthesized on Ni and transferred to insulators: Structural and electronic properties

Metal delocalization and surface decoration in direct-write nanolithography by electron beam induced deposition

Metal-ferroelectric AlScN-semiconductor memory devices on SiC wafers

A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images

A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images

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