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In-line monitoring of Li-ion battery electrode porosity and areal loading using active thermal scanning - modeling and initial experiment

Journal of power sources, 2017-08, Vol.375

2017

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A new method for rapid measurement of orientations and sizes of grains in multicrystalline silicon wafers

2011 37th IEEE Photovoltaic Specialists Conference, 2011, p.001680-001685

2011

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Single heterojunction solar cells on exfoliated flexible ∼25 μ m thick mono-crystalline silicon substrates

Applied physics letters, 2013-04, Vol.102 (16)

2013

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Techno-economic analysis of three different substrate removal and reuse strategies for III-V solar cells: Techno-economic analysis for III-V solar cells

Progress in photovoltaics, 2016-05, Vol.24 (9)

2016

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Understanding light-induced degradation of c-Si solar cells

2012 38th IEEE Photovoltaic Specialists Conference, 2012, p.001115-001120

2012

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2nd International Conference on Solar Energy Photovoltaic

Materials today : proceedings, 2017, Vol.4 (14), p.12471-12472

2017

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Surface Damage Introduced by Diamond Wire Sawing of Si Wafers: Measuring in-depth and the Lateral Distributions for Different Cutting Parameters

MRS proceedings, 2015, Vol.1770 (1), p.61-66

2015

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Defects in Epitaxial lift-off Thin Si Films/Wafers and Their Influence on the Solar Cell Performance

MRS proceedings, 2014, Vol.1666 (1), p.109-114, Article mrss14-1666-a05-02

2014

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Some challenges in making accurate and reproducible measurements of minority carrier lifetime in high-quality Si wafers

2014 IEEE 40th Photovoltaic Specialist Conference (PVSC), 2014, p.0649-0654

2014

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A Comparison of Surface Passivation Techniques for Measurement of Minority Carrier Lifetime in Thin Si Wafers: Toward a Stable and Uniform Passivation

MRS proceedings, 2014, Vol.1670 (1), p.45-50, Article mrss14-1670-h05-02

2014

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Bulk defect generation during B-diffusion and oxidation of CZ wafers: Mechanism for degrading solar cell performance

2014 IEEE 40th Photovoltaic Specialist Conference (PVSC), 2014, p.0719-0723

2014

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Strength of Multicrystalline Silicon Wafers for Various Surface Conditions

MRS proceedings, 2009, Vol.1210 (1), Article 1210-Q05-07

2009

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Computer Simulation of Edge Effects in a Small-Area Mesa N-P Junction Diode

MRS proceedings, 2008, Vol.1123 (1), Article 1123-P02-05

2008

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A New, Ultrafast Technique for Mapping Dislocation Density in Large-area, Single-crystal and Multicrystalline Si Wafers

MRS proceedings, 2009, Vol.1210 (1), Article 1210-Q01-02

2009

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Screen-Printed Al Back Contacts on Si Solar Cells: Issues and Some Solutions

MRS proceedings, 2009, Vol.1210 (1), Article 1210-Q05-02

2009

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A high throughput, noncontact system for screening silicon wafers predisposed to breakage during solar cell production

2011 37th IEEE Photovoltaic Specialists Conference, 2011, p.001134-001139

2011

Volltextzugriff (PDF)

A high-quality cross-sectioning method: Examples of applications in optimizing solar cell contact firing

2011 37th IEEE Photovoltaic Specialists Conference, 2011, p.001674-001679

2011

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Strength of Si wafers with microcracks: A theoretical model

2008 33rd IEEE Photovoltaic Specialists Conference, 2008, p.1-4

2008

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Wafer preparation and iodine-ethanol passivation procedure for reproducible minority-carrier lifetime measurement

2008 33rd IEEE Photovoltaic Specialists Conference, 2008, p.1-4

2008

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Silicon device processin in H-ambients: H-diffusion mechanisms and influence on electronic properties

Journal of electronic materials, 2001-12, Vol.30 (12), p.1616

2001

Volltextzugriff (PDF)

Using minority carrier lifetime measurement to determine saw damage characteristics on Si wafer surfaces

2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC), 2015, p.1-6

2015

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Formation of a back contact by fire-through process of screen-printed silicon solar cells

2009 34th IEEE Photovoltaic Specialists Conference (PVSC), 2009, p.001963-001968

2009

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Notice of Removal: Dissolution of oxygen precipitate nuclei in N-type CZ Si wafers to improve their material quality: Experimental results

2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), 2017, p.1-3

2017

Volltextzugriff (PDF)

International Conference on Solar Energy Photovoltaics

Conference Papers in Energy, 2013-09, Vol.2013, p.1-1

2013

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Antireflective Nanocomposite Based Coating on Crystalline Silicon Solar Cells for Building-Integrated Photovoltaic Systems

Conference Papers in Energy, 2013, Vol.2013, p.1-6

2013

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In-line monitoring of Li-ion battery electrode porosity and areal loading using active thermal scanning - modeling and initial experiment

A new method for rapid measurement of orientations and sizes of grains in multicrystalline silicon wafers

Single heterojunction solar cells on exfoliated flexible ∼25 μ m thick mono-crystalline silicon substrates

Techno-economic analysis of three different substrate removal and reuse strategies for III-V solar cells: Techno-economic analysis for III-V solar cells

Understanding light-induced degradation of c-Si solar cells

2nd International Conference on Solar Energy Photovoltaic

Surface Damage Introduced by Diamond Wire Sawing of Si Wafers: Measuring in-depth and the Lateral Distributions for Different Cutting Parameters

Defects in Epitaxial lift-off Thin Si Films/Wafers and Their Influence on the Solar Cell Performance

Some challenges in making accurate and reproducible measurements of minority carrier lifetime in high-quality Si wafers

A Comparison of Surface Passivation Techniques for Measurement of Minority Carrier Lifetime in Thin Si Wafers: Toward a Stable and Uniform Passivation

Bulk defect generation during B-diffusion and oxidation of CZ wafers: Mechanism for degrading solar cell performance

Strength of Multicrystalline Silicon Wafers for Various Surface Conditions

Computer Simulation of Edge Effects in a Small-Area Mesa N-P Junction Diode

A New, Ultrafast Technique for Mapping Dislocation Density in Large-area, Single-crystal and Multicrystalline Si Wafers

Screen-Printed Al Back Contacts on Si Solar Cells: Issues and Some Solutions

A high throughput, noncontact system for screening silicon wafers predisposed to breakage during solar cell production

A high-quality cross-sectioning method: Examples of applications in optimizing solar cell contact firing

Strength of Si wafers with microcracks: A theoretical model

Wafer preparation and iodine-ethanol passivation procedure for reproducible minority-carrier lifetime measurement

Silicon device processin in H-ambients: H-diffusion mechanisms and influence on electronic properties

Using minority carrier lifetime measurement to determine saw damage characteristics on Si wafer surfaces

Formation of a back contact by fire-through process of screen-printed silicon solar cells

Notice of Removal: Dissolution of oxygen precipitate nuclei in N-type CZ Si wafers to improve their material quality: Experimental results

International Conference on Solar Energy Photovoltaics

Antireflective Nanocomposite Based Coating on Crystalline Silicon Solar Cells for Building-Integrated Photovoltaic Systems

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