UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 34

Sortiert nach

20GHz on-chip measurement of ESD waveform for system level analysis

Microelectronics and reliability, 2015-11, Vol.55 (11), p.2276-2283

2015

Link zum Volltext

Verfügbarkeit prüfen

Comparative study of sensitive volume and triggering criteria of SEB in 600V planar and trench IGBTs

Microelectronics and reliability, 2011-09, Vol.51 (9-11), p.1990-1994

2011

Link zum Volltext

Verfügbarkeit prüfen

Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation : ADVANCES IN ELECTROSTATIC DISCHARGE (ESD) PROTECTION FOR ICs

Microelectronics and reliability, 2013, Vol.53 (2), p.221-228

2013

Link zum Volltext

Verfügbarkeit prüfen

Evaluation of the ESD performance of local protections based on SCR or bi-SCR with dynamic or static trigger circuit in 32nm

Microelectronics and reliability, 2010-09, Vol.50 (9-11), p.1379-1382

2010

Link zum Volltext

Verfügbarkeit prüfen

Energy-harvesting powered variable storage topology for battery-free wireless sensors

2018 7th International Conference on Modern Circuits and Systems Technologies (MOCAST), 2018, p.1-4

2018

Link zum Volltext

Verfügbarkeit prüfen

A power management system using reconfigurable storage scheme for batteryless wireless sensor nodes

2018 7th International Conference on Modern Circuits and Systems Technologies (MOCAST), 2018, p.1-4

2018

Link zum Volltext

Verfügbarkeit prüfen

Floating well based design methodology aimed to improve latch-up immunity in a smart power technology

Microelectronic engineering, 1992, Vol.19 (1), p.161-164

1992

Link zum Volltext

Verfügbarkeit prüfen

Deep Trench NPN Transistor for Low-RON ESD Protection of High-Voltage I/Os in Advanced Smart Power Technology

2006 Bipolar/BiCMOS Circuits and Technology Meeting, 2006, p.1-4

2006

Link zum Volltext
IEEE_Xplore

Photoluminescence of molecular beam epitaxially grown Ge-doped GaAs

Journal of applied physics, 1983-05, Vol.54 (5), p.2630-2634

1983

Link zum Volltext

Verfügbarkeit prüfen

High-temperature operation MOS-IGBT power clamp for improved ESD protection in smart power SOI technology

EOS/ESD Symposium Proceedings, 2011, p.1-8

2011

Link zum Volltext
IEEE_Xplore

Reliability assessment of integrated circuits through reverse engineering techniques

Microelectronics, 1986-07, Vol.17 (4), p.11-26

1986

Link zum Volltext

Verfügbarkeit prüfen

Thermal shutdown CMOS circuits for smart power applications

Microelectronics, 1993-11, Vol.24 (7), p.801-810

1993

Link zum Volltext

Verfügbarkeit prüfen

Investigation of statistical tools to analyze repetitive HMM stress endurance of system-level ESD protection

EOS/ESD Symposium Proceedings, 2011, p.1-9

2011

Link zum Volltext
IEEE_Xplore

Investigating the probability of susceptibility failure within ESD system level consideration

EOS/ESD Symposium Proceedings, 2011, p.1-6

2011

Link zum Volltext
IEEE_Xplore

Comprehensive Analysis of an Isolation Area Obtained by Local Oxidation of Silicon Without Field Implant

Japanese Journal of Applied Physics, 1999-09, Vol.38 (9R), p.5012

1999

Link zum Volltext

Verfügbarkeit prüfen

Smart power and high voltage integrated circuits and related MOS technologies

Microelectronics, 1989, Vol.20 (1-2), p.77-103

1989

Link zum Volltext

Verfügbarkeit prüfen

Physical macromodelling of the dynamic behaviour of CMOS VLSI circuits: Part I

Microelectronics, 1992-12, Vol.23 (8), p.599-612

1992

Link zum Volltext

Verfügbarkeit prüfen

Physical macromodelling of the dynamic behaviour of CMOS VLSI circuits: Part II

Microelectronics, 1992-12, Vol.23 (8), p.613-623

1992

Link zum Volltext

Verfügbarkeit prüfen

Local ESD protection structure based on silicon controlled rectifier achieving very low overshoot voltage

2009 31st EOS/ESD Symposium, 2009, p.1-8

2009

Link zum Volltext

Verfügbarkeit prüfen

Area-efficient, reduced and no-snapback PNP-based ESD protection in advanced Smart Power technology

2006 Electrical Overstress/Electrostatic Discharge Symposium, 2006, p.69-76

2006

Link zum Volltext

Verfügbarkeit prüfen

Characterization and modeling methodology for IC's ESD susceptibility at system level using VF-TLP tester

2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2007, p.5B.1-1-5B.1-7

2007

Link zum Volltext
IEEE_Xplore

Accurate transient behavior measurement of high-voltage ESD protections based on a very fast transmission-line pulse system

2009 31st EOS/ESD Symposium, 2009, p.1-8

2009

Link zum Volltext

Verfügbarkeit prüfen

ESD system level characterization and modeling methods applied to a LIN transceiver

EOS/ESD Symposium Proceedings, 2011, p.1-9

2011

Link zum Volltext
IEEE_Xplore

Sensitive volume and triggering criteria of SEB in classic planar VDMOS

2009 European Conference on Radiation and Its Effects on Components and Systems, 2009, p.552-558

2009

Link zum Volltext
IEEE_Xplore

Failure Mechanisms of AIN based RF-MEMS Switches Under DC and ESD Stresses

2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2007, p.120-123

2007

Link zum Volltext
IEEE_Xplore

1 – 25 von 34

Suche als RSS-Feed

Aktive Filter

ThemaTechnology

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(7)
Mit Volltextzugriff
(26)

Publikationsform

Tagungsberichte
(22)
Artikel
(12)

Sprache

Englisch
(34)
Japanisch
(3)

Erscheinungsjahr

n.n

Thema

Electrostatic Discharge
(11)
Stress
(6)
Cmos Technology
(5)
Electronics
(5)
Protection
(5)
Voltage
(5)
Capacitance
(4)
Current Measurement
(4)
Exact Sciences And Technology
(4)
Low Voltage
(4)
Applied Sciences
(3)
Capacitors
(3)
Circuit Testing
(3)
Guidelines
(3)
Integrated Circuit Modeling
(3)
Integrated Circuits
(3)
Isolation Technology
(3)
Robustness
(3)
Semiconductor Electronics. Microelectronics. Optoelectronics. Solid State Devices
(3)
Switches
(3)

15 weitere anzeigen...

Weniger anzeigen...

Kollektion

IEEE Xplore
(22)
Ingenta
(10)
Elsevier ScienceDirect Journals Complete
(10)
Elsevier Journal Backfiles on ScienceDirect (DFG Nationallizenzen)
(1)
IngentaConnect Journals
(1)
American Institute of Physics (AIP) Journals
(1)
Publisher website
(1)

2 weitere anzeigen...

Weniger anzeigen...

Zeitschrift / Serie

3 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

20GHz on-chip measurement of ESD waveform for system level analysis

Comparative study of sensitive volume and triggering criteria of SEB in 600V planar and trench IGBTs

Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation : ADVANCES IN ELECTROSTATIC DISCHARGE (ESD) PROTECTION FOR ICs

Evaluation of the ESD performance of local protections based on SCR or bi-SCR with dynamic or static trigger circuit in 32nm

Energy-harvesting powered variable storage topology for battery-free wireless sensors

A power management system using reconfigurable storage scheme for batteryless wireless sensor nodes

Floating well based design methodology aimed to improve latch-up immunity in a smart power technology

Deep Trench NPN Transistor for Low-RON ESD Protection of High-Voltage I/Os in Advanced Smart Power Technology

Photoluminescence of molecular beam epitaxially grown Ge-doped GaAs

High-temperature operation MOS-IGBT power clamp for improved ESD protection in smart power SOI technology

Reliability assessment of integrated circuits through reverse engineering techniques

Thermal shutdown CMOS circuits for smart power applications

Investigation of statistical tools to analyze repetitive HMM stress endurance of system-level ESD protection

Investigating the probability of susceptibility failure within ESD system level consideration

Comprehensive Analysis of an Isolation Area Obtained by Local Oxidation of Silicon Without Field Implant

Smart power and high voltage integrated circuits and related MOS technologies

Physical macromodelling of the dynamic behaviour of CMOS VLSI circuits: Part I

Physical macromodelling of the dynamic behaviour of CMOS VLSI circuits: Part II

Local ESD protection structure based on silicon controlled rectifier achieving very low overshoot voltage

Area-efficient, reduced and no-snapback PNP-based ESD protection in advanced Smart Power technology

Characterization and modeling methodology for IC's ESD susceptibility at system level using VF-TLP tester

Accurate transient behavior measurement of high-voltage ESD protections based on a very fast transmission-line pulse system

ESD system level characterization and modeling methods applied to a LIN transceiver

Sensitive volume and triggering criteria of SEB in classic planar VDMOS

Failure Mechanisms of AIN based RF-MEMS Switches Under DC and ESD Stresses

Aktive Filter

Suchergebnisse filtern