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Ellipsometric study of the change in the porosity of silica xerogels after chemical modification of the surface with hexamethyldisilazane

Analytical and bioanalytical chemistry, 2002-10, Vol.374 (4), p.654-657

2002

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Scaling down thickness of ULK materials for 65nm node and below and its effect on electrical performance

Microelectronic engineering, 2005-12, Vol.82 (3-4), p.405-410

2005

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Raman scattering in orthorhombic CuInS sub(2) nanocrystals

Physica status solidi. A, Applications and materials science, 2014-01, Vol.211 (1), p.195-199

2014

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R aman scattering in orthorhombic Cu I n S 2 nanocrystals

Physica status solidi. A, Applications and materials science, 2014-01, Vol.211 (1), p.195-199

2014

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Resonant Raman scattering of ZnS, ZnO, and ZnS/ZnO core/shell quantum dots

Applied physics. A, Materials science & processing, 2012, Vol.107 (2), p.275-278

2012

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Substrate influence on the optical and structural properties of pulsed laser deposited BiFeO 3 epitaxial films

Journal of applied physics, 2010-06, Vol.107 (12), p.123524-123524-5

2010

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Influence of near-surface and volume real structure on the electronic properties of SrTiO 3 MIM structures

MRS proceedings, 2011, Vol.1368, Article mrss11-1368-ww08-19

2011

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Influence of near-surface and volume real structure on the electronic properties of SrTiO3 MIM structures

MRS proceedings, 2011, Vol.1368 (1)

2011

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Growth peculiarities during vapor-liquid-solid growth of silicon nanowhiskers by electron-beam evaporation : Semiconductor nanowires

Applied physics. A, Materials science & processing, 2006, Vol.85 (3), p.311-315

2006

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OVPD und Anwendung optischer Spektroskopiemethoden zur Wachstumskontrolle. OVPD and Applications of Optical Spectroscopic Methods to Growth Control

Vakuum in Forschung und Praxis : Zeitschrift für Vakuumtechnologie, Oberflèachen und Dünne Schichten, 2003-12, Vol.15 (6), p.312-314

2003

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Strained Silicon-On-Insulator - Fabrication and Characterization

ECS transactions, 2007, Vol.6 (4), p.339-344

2007

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MAGNETIC PROPERTIES OF Ca x La 1 - x MnO 3 (x > 0.5) PEROVSKITES

Modern physics letters. B, Condensed matter physics, statistical physics, applied physics, 2003-03, Vol.17 (7), p.263-266

2003

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OVPD und Anwendung optischer Spektroskopiemethoden zur Wachstumskontrolle. OVPD and Applications of Optical Spectroscopic Methods to Growth Control

Vakuum in Forschung und Praxis : Zeitschrift für Vakuumtechnologie, Oberflèachen und Dünne Schichten, 2003-12, Vol.15 (6), p.312-314

2003

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Applic Spectroscopic ellipsometry study of thin diffusion barriers of TaN and Ta for Cu interconnects in integrated circuits

Physica status solidi. A, Applications and materials science (Print), 2008, Vol.205 (4), p.922-926

2008

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Optical properties and molecular orientation in organic thin films : Organic-inorganic semiconductor interfaces

Journal of physics. Condensed matter, 2003, Vol.15 (38), p.S2699-S2718

2003

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Comparison of techniques to characterise the density, porosity and elastic modulus of porous low-k SiO sub(2) xerogel films

Microelectronic engineering, 2002-01, Vol.60 (1-2), p.133-141

2002

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Contributions to the static dielectric constant of low-k xerogel films derived from ellipsometry and IR spectroscopy

Thin solid films, 2004, Vol.455-56, p.433-437

2004

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50.4: First Hybrid OLED by Organic Vapor Phase Deposition and Its Advantages in Deposition Rate Control for OLED Manufacturing

SID International Symposium Digest of technical papers, 2004-05, Vol.35 (1), p.1388-1391

2004

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VASE and IR spectroscopy: excellent tools to study biaxial organic molecular thin films: DiMe-PTCDI on S-passivated GaAs(100)

Thin solid films, 2004, Vol.455-56, p.586-590

2004

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EPR AND MAGNETIC SUSCEPTIBILITY STUDIES OF B 2 O 3 – SrO – Fe 2 O 3 GLASSES

Modern physics letters. B, Condensed matter physics, statistical physics, applied physics, 1999-10, Vol.13 (22n23), p.801-808

1999

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Orientation of perylene derivatives on semiconductor surfaces

Applied surface science, 2003, Vol.212-13, p.501-507

2003

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Silicon oxide in Si-Si bonded wafers

Applied surface science, 2001, Vol.175-76, p.715-720

2001

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Crystallinity of PTCDA films on silicon derived via optical spectroscopic measurements

Applied surface science, 2001, Vol.175-76, p.363-368

2001

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Investigations during annealing of the interface in Si-Si bonded wafers by multiple internal transmission infrared spectroscopy

Proceedings. International Semiconductor Conference, 2002, Vol.2, p.271-274 vol.2

2002

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Strained Silicon-On-Insulator - Fabrication and Characterization

Meeting abstracts (Electrochemical Society), 2007-03, Vol.MA2007-01 (15), p.750-750

2007

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Ellipsometric study of the change in the porosity of silica xerogels after chemical modification of the surface with hexamethyldisilazane

Scaling down thickness of ULK materials for 65nm node and below and its effect on electrical performance

Raman scattering in orthorhombic CuInS sub(2) nanocrystals

R aman scattering in orthorhombic Cu I n S 2 nanocrystals

Resonant Raman scattering of ZnS, ZnO, and ZnS/ZnO core/shell quantum dots

Substrate influence on the optical and structural properties of pulsed laser deposited BiFeO 3 epitaxial films

Influence of near-surface and volume real structure on the electronic properties of SrTiO 3 MIM structures

Influence of near-surface and volume real structure on the electronic properties of SrTiO3 MIM structures

Growth peculiarities during vapor-liquid-solid growth of silicon nanowhiskers by electron-beam evaporation : Semiconductor nanowires

OVPD und Anwendung optischer Spektroskopiemethoden zur Wachstumskontrolle. OVPD and Applications of Optical Spectroscopic Methods to Growth Control

Strained Silicon-On-Insulator - Fabrication and Characterization

MAGNETIC PROPERTIES OF Ca x La 1 - x MnO 3 (x > 0.5) PEROVSKITES

OVPD und Anwendung optischer Spektroskopiemethoden zur Wachstumskontrolle. OVPD and Applications of Optical Spectroscopic Methods to Growth Control

Applic Spectroscopic ellipsometry study of thin diffusion barriers of TaN and Ta for Cu interconnects in integrated circuits

Optical properties and molecular orientation in organic thin films : Organic-inorganic semiconductor interfaces

Comparison of techniques to characterise the density, porosity and elastic modulus of porous low-k SiO sub(2) xerogel films

Contributions to the static dielectric constant of low-k xerogel films derived from ellipsometry and IR spectroscopy

50.4: First Hybrid OLED by Organic Vapor Phase Deposition and Its Advantages in Deposition Rate Control for OLED Manufacturing

VASE and IR spectroscopy: excellent tools to study biaxial organic molecular thin films: DiMe-PTCDI on S-passivated GaAs(100)

EPR AND MAGNETIC SUSCEPTIBILITY STUDIES OF B 2 O 3 – SrO – Fe 2 O 3 GLASSES

Orientation of perylene derivatives on semiconductor surfaces

Silicon oxide in Si-Si bonded wafers

Crystallinity of PTCDA films on silicon derived via optical spectroscopic measurements

Investigations during annealing of the interface in Si-Si bonded wafers by multiple internal transmission infrared spectroscopy

Strained Silicon-On-Insulator - Fabrication and Characterization

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