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Summary of ISO/TC 201 Standard: VI ISO 14706:2000-Surface chemical analysis-Determination of surface elemental contamination on silicon wafers by total reflection x-ray fluorescence (TXRF) spectroscopy

Surface and interface analysis, 2002-04, Vol.33 (4), p.369-370

Gohshi, Yohichi

2002

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An experimental comparison of the total-electron-yield and conversion-electron-yield modes for near-surface characterization using X-ray excitation

Journal of electron spectroscopy and related phenomena, 1997-10, Vol.87 (1), p.81-89

1997

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Instrumentation chemistry — a versatile strategy

TrAC, Trends in analytical chemistry (Regular ed.), 1991-08, Vol.10 (7), p.202-206

Gohshi, Yohichi

1991

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High-frequency split zero-vector PWM with harmonic reduction for induction motor drive

IEEE transactions on industry applications, 1992-01, Vol.28 (1), p.105-112

1992

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Trace analysis, chemical state analysis and instrumentation chemistry – several experiences in research life

Spectrochimica acta. Part B: Atomic spectroscopy, 1999-01, Vol.54 (1), p.21-28

Gohshi, Yohichi

1999

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Standardization of Total Reflection X-ray Fluorescence Analysis

Materia Japan, 2003/01/20, Vol.42(1), pp.20-23

Gohshi, Yohichi

2003

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Unusually Strong Interactions Mediated by Both .pi.-.pi. Stacking and CH-.pi. Interactions Present in the Dimer of Nickel(II) Complex Coordinated with n-Butyl-Substituted Salen

Journal of the American Chemical Society, 1995-03, Vol.117 (8), p.2377-2378

1995

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The slip-reducing mechanism in polypropylene-laminated films studied by FTIR and XPS

Journal of applied polymer science, 1993-07, Vol.49 (4), p.711-717

1993

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High resolution soft X-ray absorption spectroscopy for the chemical state analysis of Mn

Spectrochimica acta. Part B: Atomic spectroscopy, 2000-09, Vol.55 (9), p.1385-1395

2000

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Chemical state analysis of Al by high resolution X-ray spectroscopy

Spectrochimica acta. Part B: Atomic spectroscopy, 1981, Vol.36 (7), p.763-765

Gohshi, Yohichi

1981

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Mixture of HIBA and glycolic acid as eluent for effective separation of yttrium and dysprosium by HPLC

Fresenius' journal of analytical chemistry, 1999-02, Vol.363 (4), p.424-426

1999

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Many-electron effects in the shape of the Cl K alpha 1,2 x-ray emission lines

Physical review letters, 1986-08, Vol.57 (8), p.988-991

1986

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Scattering dilution method in Fourier transform infrared spectrometry

Talanta (Oxford), 1998-04, Vol.45 (6), p.1049-1060

1998

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Chemical state analysis of sulfur and phosphorus in biological samples by X-ray fluorescence

Biological trace element research, 1987-08, Vol.13 (1), p.383-392

1987

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X-ray fluorescence analysis using synchrotron radiation at the photon factory

Biological trace element research, 1987-04, Vol.12 (1), p.161-166

1987

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State analysis of sulfur in coal and coal fly ash by double-crystal X-ray fluorescence spectrometry

Mikrochimica acta (1966), 1983-05, Vol.80 (3-4), p.263-270

1983

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Correlation between Oscillation Modes and Penetration Rate of Protons in the Three-Phase-Liquid-Membrane Oscillation System

Journal of colloid and interface science, 1997-03, Vol.187 (2), p.544-546

1997

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Some considerations of the SERS effect of L-phenylalanine in the near-infrared region using silver colloid solution

Journal of Raman spectroscopy, 1997-11, Vol.28 (11), p.849-854

1997

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Total reflection X-ray photoelectron spectroscopy

Journal of electron spectroscopy and related phenomena, 1995-12, Vol.76, p.313-318

1995

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Surface enhancement effect on the diffuse reflectance infrared Fourier transform spectra of compounds having a pyridine ring

Spectrochimica acta. Part B: Atomic spectroscopy, 1999-01, Vol.54 (1), p.205-214

1999

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Chemical State Observation of Ni Adsorbed on Zeolite by the Conversion-Electron-Yield Method

Analytical Sciences, 1997/12/10, Vol.13(6), pp.1003-1005

1997

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Depth-Selective Chemical State Analysis of Fine Particles Using X-ray Absorption

Analytical chemistry (Washington), 1995-05, Vol.67 (9), p.1526-1529

1995

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Chemical state analysis of vanadium by high resolution X-ray spectroscopy

X-ray spectrometry, 1975-07, Vol.4 (3), p.117-118

1975

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Copper Lβ/ Lα X-ray emission intensity ratio of copper compounds and alloys

Spectrochimica acta. Part B: Atomic spectroscopy, 1993-08, Vol.48 (10), p.1281-1290

1993

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Control of the aggregation structure of [Ni(dmit) 2] utilising the tendency of artificial lipid to form bilayer membrane

Journal of inorganic biochemistry, 1997-07, Vol.67 (1), p.450-450

1997

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Summary of ISO/TC 201 Standard: VI ISO 14706:2000-Surface chemical analysis-Determination of surface elemental contamination on silicon wafers by total reflection x-ray fluorescence (TXRF) spectroscopy

An experimental comparison of the total-electron-yield and conversion-electron-yield modes for near-surface characterization using X-ray excitation

Instrumentation chemistry — a versatile strategy

High-frequency split zero-vector PWM with harmonic reduction for induction motor drive

Trace analysis, chemical state analysis and instrumentation chemistry – several experiences in research life

Standardization of Total Reflection X-ray Fluorescence Analysis

Unusually Strong Interactions Mediated by Both .pi.-.pi. Stacking and CH-.pi. Interactions Present in the Dimer of Nickel(II) Complex Coordinated with n-Butyl-Substituted Salen

The slip-reducing mechanism in polypropylene-laminated films studied by FTIR and XPS

High resolution soft X-ray absorption spectroscopy for the chemical state analysis of Mn

Chemical state analysis of Al by high resolution X-ray spectroscopy

Mixture of HIBA and glycolic acid as eluent for effective separation of yttrium and dysprosium by HPLC

Many-electron effects in the shape of the Cl K alpha 1,2 x-ray emission lines

Scattering dilution method in Fourier transform infrared spectrometry

Chemical state analysis of sulfur and phosphorus in biological samples by X-ray fluorescence

X-ray fluorescence analysis using synchrotron radiation at the photon factory

State analysis of sulfur in coal and coal fly ash by double-crystal X-ray fluorescence spectrometry

Correlation between Oscillation Modes and Penetration Rate of Protons in the Three-Phase-Liquid-Membrane Oscillation System

Some considerations of the SERS effect of L-phenylalanine in the near-infrared region using silver colloid solution

Total reflection X-ray photoelectron spectroscopy

Surface enhancement effect on the diffuse reflectance infrared Fourier transform spectra of compounds having a pyridine ring

Chemical State Observation of Ni Adsorbed on Zeolite by the Conversion-Electron-Yield Method

Depth-Selective Chemical State Analysis of Fine Particles Using X-ray Absorption

Chemical state analysis of vanadium by high resolution X-ray spectroscopy

Copper Lβ/ Lα X-ray emission intensity ratio of copper compounds and alloys

Control of the aggregation structure of [Ni(dmit) 2] utilising the tendency of artificial lipid to form bilayer membrane

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