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Fundamentals of Optical Fiber Sensors

1. Aufl., 2012

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X-ray Photoelectron Spectroscopy Study of Indium Tin Oxide Films Deposited at Various Oxygen Partial Pressures

Journal of electronic materials, 2017-02, Vol.46 (2), p.1405-1412

2017

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Transition Gibbs free energy level cross section and formulation of carrier SRH recombination rate

Journal of semiconductors, 2013-12, Vol.34 (12), p.9-12

Chin, Ken K.

2013

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An ultra-sensitive optical MEMS sensor for partial discharge detection

Journal of micromechanics and microengineering, 2005-03, Vol.15 (3), p.521-527

2005

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p-Doping limit and donor compensation in CdTe polycrystalline thin film solar cells

Solar energy materials and solar cells, 2010-10, Vol.94 (10), p.1627-1629

Chin, Ken K.

2010

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A Theoretical Model for Voltage-Dependent Photocurrent Collection in CdTe Solar Cells

Energies (Basel), 2021-03, Vol.14 (6), p.1615

2021

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The Influence of Conduction Band Offset on CdTe Solar Cells

Journal of electronic materials, 2018-02, Vol.47 (2), p.1201-1207

2018

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Nonstoichiometric composition shift in physical vapor deposition of CdTe thin films

Journal of crystal growth, 2015-05, Vol.418, p.32-37

2015

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Steady state minority carrier lifetime and defect level occupation in thin film CdTe solar cells

Thin solid films, 2014-05, Vol.558, p.391-399

2014

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Fabry-Perot diaphragm fiber-optic sensor

Applied Optics, 2007-11, Vol.46 (31), p.7614

2007

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Local charge neutrality condition, Fermi level and majority carrier density of a semiconductor with multiple localized multi-level intrinsic/impurity defects

Journal of semiconductors, 2011-11, Vol.32 (11), p.112001-1-8

Chin, Ken K

2011

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Approximate graphical method of solving Fermi level and majority carrier density of semiconductors with multiple donors and multiple acceptors

Journal of semiconductors, 2011-06, Vol.32 (6), p.062001-1-6

Chin, Ken K

2011

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A Study of Light-Sensitive Ideality Factor and Voltage-Dependent Carrier Collection of CdTe Solar Cells in Forward Bias

IEEE journal of photovoltaics, 2013-04, Vol.3 (2), p.843-851

2013

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Temperature Dependence of Electrical Characterization in n+ - CdS/ p - CdTe Thin Film Solar Cells – Study of Shallow/Deep Defects

MRS proceedings, 2013, Vol.1493 (1), p.161-167

2013

Volltextzugriff (PDF)

How to control the stoichiometry of cadmium telluride thin film for photovoltaic applications

Journal of renewable and sustainable energy, 2017-11, Vol.9 (6)

2017

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Analysis of partial discharge signal using the Hilbert-Huang transform

IEEE transactions on power delivery, 2006-07, Vol.21 (3), p.1063-1067

2006

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Dual roles of doping and trapping of semiconductor defect levels and their ramification to thin film photovoltaics

Journal of applied physics, 2012-05, Vol.111 (10), p.104509-104509-9

Chin, Ken K.

2012

Volltextzugriff (PDF)

Local charge neutgrality condition, Fermi level, and carrier compensation of CdTe polycrystalline thin film in CdS/CdTe solar cells

2010 35th IEEE Photovoltaic Specialists Conference, 2010, p.000878-000884

2010

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The roles of CU impurity states in CdTe thin film solar cells

2010 35th IEEE Photovoltaic Specialists Conference, 2010, p.001915-001918

2010

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A new method of determining the stress state in microelectronic materials

Measurement science & technology, 1996-01, Vol.7 (1), p.102-105

1996

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MEMS fiber optic microphone

The Journal of the Acoustical Society of America, 2010, Vol.127 (3), p.1703

Chin, Ken K.

2010

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Lock-in imaging of multicycle integration focal plane array

Review of scientific instruments, 2002-01, Vol.73 (1), p.11-17

2002

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Dual-material gate (DMG) field effect transistor

IEEE transactions on electron devices, 1999-05, Vol.46 (5), p.865-870

1999

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Working quantum efficiency of cdte solar cell

2010 35th IEEE Photovoltaic Specialists Conference, 2010, p.001912-001914

2010

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Semiconductor steady state defect effective Fermi level and deep level transient spectroscopy depth profiling

Journal of semiconductors, 2016-09, Vol.37 (9), p.26-32

2016

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Fundamentals of Optical Fiber Sensors

X-ray Photoelectron Spectroscopy Study of Indium Tin Oxide Films Deposited at Various Oxygen Partial Pressures

Transition Gibbs free energy level cross section and formulation of carrier SRH recombination rate

An ultra-sensitive optical MEMS sensor for partial discharge detection

p-Doping limit and donor compensation in CdTe polycrystalline thin film solar cells

A Theoretical Model for Voltage-Dependent Photocurrent Collection in CdTe Solar Cells

The Influence of Conduction Band Offset on CdTe Solar Cells

Nonstoichiometric composition shift in physical vapor deposition of CdTe thin films

Steady state minority carrier lifetime and defect level occupation in thin film CdTe solar cells

Fabry-Perot diaphragm fiber-optic sensor

Local charge neutrality condition, Fermi level and majority carrier density of a semiconductor with multiple localized multi-level intrinsic/impurity defects

Approximate graphical method of solving Fermi level and majority carrier density of semiconductors with multiple donors and multiple acceptors

A Study of Light-Sensitive Ideality Factor and Voltage-Dependent Carrier Collection of CdTe Solar Cells in Forward Bias

Temperature Dependence of Electrical Characterization in n+ - CdS/ p - CdTe Thin Film Solar Cells – Study of Shallow/Deep Defects

How to control the stoichiometry of cadmium telluride thin film for photovoltaic applications

Analysis of partial discharge signal using the Hilbert-Huang transform

Dual roles of doping and trapping of semiconductor defect levels and their ramification to thin film photovoltaics

Local charge neutgrality condition, Fermi level, and carrier compensation of CdTe polycrystalline thin film in CdS/CdTe solar cells

The roles of CU impurity states in CdTe thin film solar cells

A new method of determining the stress state in microelectronic materials

MEMS fiber optic microphone

Lock-in imaging of multicycle integration focal plane array

Dual-material gate (DMG) field effect transistor

Working quantum efficiency of cdte solar cell

Semiconductor steady state defect effective Fermi level and deep level transient spectroscopy depth profiling

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