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IEEE transactions on pattern analysis and machine intelligence, 2021-12, Vol.43 (12), p.4272-4290
- VidalMata, Rosaura G.
- Banerjee, Sreya
- RichardWebster, Brandon
- Albright, Michael
- Davalos, Pedro
- McCloskey, Scott
- Miller, Ben
- Tambo, Asong
- Ghosh, Sushobhan
- Nagesh, Sudarshan
- Yuan, Ye
- Hu, Yueyu
- Wu, Junru
- Yang, Wenhan
- Zhang, Xiaoshuai
- Liu, Jiaying
- Wang, Zhangyang
- Chen, Hwann-Tzong
- Huang, Tzu-Wei
- Chin, Wen-Chi
- Li, Yi-Chun
- Lababidi, Mahmoud
- Otto, Charles
- Scheirer, Walter J.
2021
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2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010, p.358-366
2010
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2023 IEEE International Conference on Digital Health (ICDH), 2023, p.65-74
2023
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2017 International Conference on Behavioral, Economic, Socio-cultural Computing (BESC), 2017, p.1-7
2017
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2008 International Conference on Intelligent Sensors, Sensor Networks and Information Processing, 2008, p.599-604
2008
- Link zum Volltext
2006 6th International Conference on ITS Telecommunications, 2006, p.882-885
2006
- Link zum Volltext
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