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The high-resolution diffraction beamline P08 at PETRA III

Journal of synchrotron radiation, 2012-01, Vol.19 (1), p.30-38

2012

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Study of a diamond channel cut monochromator for high repetition rate operation at the EuXFEL: FEA thermal load simulations and first experimental results

Journal of physics. Conference series, 2022-12, Vol.2380 (1), p.12053

2022

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Analysis of the Rate of Re-planning in Spot-Scanning Proton Therapy

International journal of particle therapy, 2022-09, Vol.9 (2), p.49-58

2022

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The Importance of Verification CT-QA Scans in Patients Treated with IMPT for Head and Neck Cancers

International journal of particle therapy, 2020-06, Vol.7 (1), p.41-53

2020

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X-ray diffraction study on size effects in epitaxial magnetite thin films on MgO(0 0 1)

Journal of physics. D, Applied physics, 2012-10, Vol.45 (39), p.395302-1-6

2012

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Strain distribution in Si capping layers on SiGe islands: influence of cap thickness and footprint in reciprocal space

Nanotechnology, 2012-11, Vol.23 (46), p.465705-465705

2012

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A compact high vacuum heating chamber for in-situ x-ray scattering studies

Review of scientific instruments, 2012-08, Vol.83 (8), p.083904-083904

2012

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Strain relief and shape oscillations in site-controlled coherent SiGe islands

Nanotechnology, 2013-08, Vol.24 (33), p.335707-1-9

2013

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Structural phase transition of ultra thin PrO2 films on Si(111)

Journal of physics. Condensed matter, 2009-04, Vol.21 (17), p.175408

2009

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Closely spaced SiGe barns as stressor structures for strain-enhancement in silicon

Applied physics letters, 2013-01, Vol.102 (3)

2013

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Solid phase epitaxy of Ge films on CaF2/Si(1 1 1)

Applied surface science, 2007-10, Vol.254 (1), p.143-147

2007

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Structure and stability of cub-Pr2O3 films on Si(111) under post deposition annealing conditions

Physica status solidi. C, 2010-02, Vol.7 (2), p.292-295

2010

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Ultrafast X-ray diffraction and scattering on the femtosecond X-ray experiment (FXE) instrument at the European XFEL: present status and future perspectives

Acta crystallographica. Section A, Foundations and advances, 2022-08, Vol.78 (a2), p.e786-e786

2022

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Reordering between tetrahedral and octahedral sites in ultrathin magnetite films grown on MgO(001)

Journal of applied physics, 2013-05, Vol.113 (18)

2013

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Au deposits on graphite: On the nature of high temperature desorption peaks in CO thermal desorption spectra

Surface science, 2006-09, Vol.600 (18), p.3595-3599

2006

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Homogeneous Si films on CaF2/Si(111) due to boron enhanced solid phase epitaxy

Surface science, 2006-09, Vol.600 (18), p.3637-3641

2006

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In-situ x-ray diffraction studies on post-deposition vacuum-annealing of ultra-thin iron oxide films

Journal of applied physics, 2011-11, Vol.110 (10), p.102208-102208-5

2011

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Surfactant enhanced solid phase epitaxy of Ge/CaF 2 /Si(111): Synchrotron x-ray characterization of structure and morphology

Journal of applied physics, 2011-11, Vol.110 (10), p.102205-102205-10

2011

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Surfactant enhanced solid phase epitaxy of Ge/CaF{sub 2}/Si(111): Synchrotron x-ray characterization of structure and morphology

Journal of applied physics, 2011-11, Vol.110 (10)

2011

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Epitaxial Growth of Bi(111) on Si(001)

e-Journal of Surface Science and Nanotechnology, 2009/04/04, Vol.7, pp.441-447

2009

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Erratum: Epitaxial Growth of Bi(111) on Si(001) [e-J. Surf. Sci. Nanotech. Vol. 7, pp. 441-447 (2009)]

e-Journal of Surface Science and Nanotechnology, 2009/07/25, Vol.7, pp.795-795

2009

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Initial stages of CaF2/Si(111) epitaxy investigated by friction force microscopy

Surface science, 2003-06, Vol.532-535, p.633-638

2003

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Epitaxy of single crystalline PrO2 films on Si(111)

Applied physics letters, 2008-07, Vol.93 (3)

2008

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The influence of lattice oxygen on the initial growth behavior of heteroepitaxial Ge layers on single crystalline PrO2(111)∕Si(111) support systems

Journal of applied physics, 2008-04, Vol.103 (8)

2008

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Analysis of periodic dislocation networks using x-ray diffraction and extended finite element modeling

Applied physics letters, 2010-03, Vol.96 (13), p.131905-131905-3

2010

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The high-resolution diffraction beamline P08 at PETRA III

Study of a diamond channel cut monochromator for high repetition rate operation at the EuXFEL: FEA thermal load simulations and first experimental results

Analysis of the Rate of Re-planning in Spot-Scanning Proton Therapy

The Importance of Verification CT-QA Scans in Patients Treated with IMPT for Head and Neck Cancers

X-ray diffraction study on size effects in epitaxial magnetite thin films on MgO(0 0 1)

Strain distribution in Si capping layers on SiGe islands: influence of cap thickness and footprint in reciprocal space

A compact high vacuum heating chamber for in-situ x-ray scattering studies

Strain relief and shape oscillations in site-controlled coherent SiGe islands

Structural phase transition of ultra thin PrO2 films on Si(111)

Closely spaced SiGe barns as stressor structures for strain-enhancement in silicon

Solid phase epitaxy of Ge films on CaF2/Si(1 1 1)

Structure and stability of cub-Pr2O3 films on Si(111) under post deposition annealing conditions

Ultrafast X-ray diffraction and scattering on the femtosecond X-ray experiment (FXE) instrument at the European XFEL: present status and future perspectives

Reordering between tetrahedral and octahedral sites in ultrathin magnetite films grown on MgO(001)

Au deposits on graphite: On the nature of high temperature desorption peaks in CO thermal desorption spectra

Homogeneous Si films on CaF2/Si(111) due to boron enhanced solid phase epitaxy

In-situ x-ray diffraction studies on post-deposition vacuum-annealing of ultra-thin iron oxide films

Surfactant enhanced solid phase epitaxy of Ge/CaF 2 /Si(111): Synchrotron x-ray characterization of structure and morphology

Surfactant enhanced solid phase epitaxy of Ge/CaF{sub 2}/Si(111): Synchrotron x-ray characterization of structure and morphology

Epitaxial Growth of Bi(111) on Si(001)

Erratum: Epitaxial Growth of Bi(111) on Si(001) [e-J. Surf. Sci. Nanotech. Vol. 7, pp. 441-447 (2009)]

Initial stages of CaF2/Si(111) epitaxy investigated by friction force microscopy

Epitaxy of single crystalline PrO2 films on Si(111)

The influence of lattice oxygen on the initial growth behavior of heteroepitaxial Ge layers on single crystalline PrO2(111)∕Si(111) support systems

Analysis of periodic dislocation networks using x-ray diffraction and extended finite element modeling

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