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Low-temperature electrical characterization of junctionless transistors

Solid-state electronics, 2013-02, Vol.80, p.135-141

2013

Volltextzugriff (PDF)

Energy Management Method of Hybrid AC/DC Microgrid Using Artificial Neural Network

Electronics (Basel), 2021-08, Vol.10 (16), p.1939

2021

Volltextzugriff (PDF)

Extraction of Intrinsic Electrical Parameters in Partially Depleted MoS2 Field-Effect Transistors

IEEE transactions on electron devices, 2018-07, Vol.65 (7), p.3050-3053

2018

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Low-frequency noise behavior of junctionless transistors compared to inversion-mode transistors

Solid-state electronics, 2013-03, Vol.81, p.101-104

2013

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Experimental and Theoretical Investigation of Magnetoresistance From Linear Regime to Saturation in 14-nm FD-SOI MOS Devices

IEEE transactions on electron devices, 2015-01, Vol.62 (1), p.3-8

2015

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Impact of fin shapes and channel doping concentrations on the operation of junctionless transistors

Microelectronic engineering, 2019-02, Vol.207, p.50-54

2019

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Impact of series resistance on the operation of junctionless transistors

Solid-state electronics, 2017-03, Vol.129, p.103-107

2017

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Low temperature characterization of mobility in 14 nm FD-SOI CMOS devices under interface coupling conditions

Solid-state electronics, 2015-06, Vol.108, p.30-35

2015

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Effects of series resistance and interface properties on the operation of AlGaN/GaN high electron mobility transistors

Microelectronic engineering, 2018-11, Vol.199, p.40-44

2018

Volltextzugriff (PDF)

Series resistance in different operation regime of junctionless transistors

Solid-state electronics, 2018-03, Vol.141, p.92-95

2018

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Behavior of subthreshold conduction in junctionless transistors

Solid-state electronics, 2016-10, Vol.124, p.58-63

2016

Volltextzugriff (PDF)

Full split C–V method for parameter extraction in ultra thin BOX FDSOI MOS devices

Solid-state electronics, 2014-09, Vol.99, p.104-107

2014

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Magnetoresistance mobility characterization in advanced FD-SOI n-MOSFETs

Solid-state electronics, 2015-01, Vol.103, p.229-235

2015

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Impact of channel width on back biasing effect in tri-gate MOSFET

Microelectronic engineering, 2014-02, Vol.114, p.91-97

2014

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Back biasing effects in tri-gate junctionless transistors

Solid-state electronics, 2013-09, Vol.87, p.74-79

2013

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Impedance characterization of nanogap interdigitated electrode arrays fabricated by tilted angle evaporation for electrochemical biosensor applications

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2014-03, Vol.32 (2)

2014

Volltextzugriff (PDF)

Interfacial reaction between 42Sn-58Bi solder and electroless Ni-P/immersion Au under bump metallurgy during aging

Journal of electronic materials, 2006-01, Vol.35 (1), p.35-40

2006

Volltextzugriff (PDF)

New method for the extraction of bulk channel mobility and flat-band voltage in junctionless transistors

Solid-state electronics, 2013-11, Vol.89, p.139-141

2013

Volltextzugriff (PDF)

Fabrication of oxidation-free contacts to nanopatterned Permalloy structures

Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2009-11, Vol.27 (6), p.2487-2489

2009

Volltextzugriff (PDF)

A BOCDA system using time-domain data processing for an enlarged measurement range to 10 km

2017 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2017, p.1-2

2017

Volltextzugriff (PDF)

Visualization of local gate control in a ZnO inter-nanowire junction device

Solid-state electronics, 2009-03, Vol.53 (3), p.320-323

2009

Volltextzugriff (PDF)

Simple Method for Determining Channel Doping Concentration of Highly Doped FD-SOI Devices

2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2019, p.1-4

2019

Volltextzugriff (PDF)

Series Resistance Effects on the Back-gate Biased Operation of Junctionless Transistors

2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2019, p.1-4

2019

Volltextzugriff (PDF)

High-performance transparent heater with Ag paste-based nanomesh electrodes

Journal of micromechanics and microengineering, 2022-06, Vol.32 (6), p.65005

2022

Volltextzugriff (PDF)

Changes in Microstructure and Magnetic Properties of Fe-B-Cu-C Ribbons According to Annealing Conditions

IEEE transactions on magnetics, 2019-02, Vol.55 (2), p.1-4

2019

Volltextzugriff (PDF)

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Low-temperature electrical characterization of junctionless transistors

Energy Management Method of Hybrid AC/DC Microgrid Using Artificial Neural Network

Extraction of Intrinsic Electrical Parameters in Partially Depleted MoS2 Field-Effect Transistors

Low-frequency noise behavior of junctionless transistors compared to inversion-mode transistors

Experimental and Theoretical Investigation of Magnetoresistance From Linear Regime to Saturation in 14-nm FD-SOI MOS Devices

Impact of fin shapes and channel doping concentrations on the operation of junctionless transistors

Impact of series resistance on the operation of junctionless transistors

Low temperature characterization of mobility in 14 nm FD-SOI CMOS devices under interface coupling conditions

Effects of series resistance and interface properties on the operation of AlGaN/GaN high electron mobility transistors

Series resistance in different operation regime of junctionless transistors

Behavior of subthreshold conduction in junctionless transistors

Full split C–V method for parameter extraction in ultra thin BOX FDSOI MOS devices

Magnetoresistance mobility characterization in advanced FD-SOI n-MOSFETs

Impact of channel width on back biasing effect in tri-gate MOSFET

Back biasing effects in tri-gate junctionless transistors

Impedance characterization of nanogap interdigitated electrode arrays fabricated by tilted angle evaporation for electrochemical biosensor applications

Interfacial reaction between 42Sn-58Bi solder and electroless Ni-P/immersion Au under bump metallurgy during aging

New method for the extraction of bulk channel mobility and flat-band voltage in junctionless transistors

Fabrication of oxidation-free contacts to nanopatterned Permalloy structures

A BOCDA system using time-domain data processing for an enlarged measurement range to 10 km

Visualization of local gate control in a ZnO inter-nanowire junction device

Simple Method for Determining Channel Doping Concentration of Highly Doped FD-SOI Devices

Series Resistance Effects on the Back-gate Biased Operation of Junctionless Transistors

High-performance transparent heater with Ag paste-based nanomesh electrodes

Changes in Microstructure and Magnetic Properties of Fe-B-Cu-C Ribbons According to Annealing Conditions

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