UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Autocorrelation Analysis as a Technique to Study Physical Mechanisms of MOSFET Low-Frequency Noise

IEEE transactions on electron devices, 2017-07, Vol.64 (7), p.2919-2926

2017

Volltextzugriff (PDF)

RF Circuit Linearity Optimization Using a General Weak Nonlinearity Model

IEEE transactions on circuits and systems. I, Regular papers, 2012-10, Vol.59 (10), p.2340-2353

2012

Volltextzugriff (PDF)

An easy-to-use mismatch model for the MOS transistor

IEEE journal of solid-state circuits, 2002-08, Vol.37 (8), p.1056-1064

2002

Volltextzugriff (PDF)

The New CMC Standard Compact MOS Model PSP: Advantages for RF Applications

IEEE journal of solid-state circuits, 2009-05, Vol.44 (5), p.1415-1424

2009

Volltextzugriff (PDF)

Control of Buffer-Induced Current Collapse in AlGaN/GaN HEMTs Using SiN x Deposition

IEEE transactions on electron devices, 2017-10, Vol.64 (10), p.4044-4049

2017

Volltextzugriff (PDF)

Noise and Nonlinearity Modeling of Active Mixers for Fast and Accurate Estimation

IEEE transactions on circuits and systems. I, Regular papers, 2011-02, Vol.58 (2), p.276-289

2011

Volltextzugriff (PDF)

Ring-oscillator test-structures for sub-0.1% accuracy wafer-level characterization of active- and standby current consumption, variability, and fast aging of oscillation frequencies

2017 International Conference of Microelectronic Test Structures (ICMTS), 2017, p.1-6

2017

Volltextzugriff (PDF)

Investigation of surface charges and traps in gallium nitride/aluminium gallium nitride/gallium nitride high-voltage transistors via measurements and technology computer-aided design simulations of transfer characteristics of metal–insulator–semiconductor field-effect transistors and high-electron-mobility transistors

IET power electronics, 2015-12, Vol.8 (12), p.2322-2328

2015

Volltextzugriff (PDF)

A variability-based analysis technique revealing physical mechanisms of MOSFET low-frequency noise

2017 International Conference of Microelectronic Test Structures (ICMTS), 2017, p.1-5

2017

Volltextzugriff (PDF)

Automatic model type selection with heterogeneous evolution: An application to RF circuit block modeling

2008 IEEE Congress on Evolutionary Computation (IEEE World Congress on Computational Intelligence), 2008, p.989-996

2008

Volltextzugriff (PDF)

A general weak nonlinearity model for LNAs

2008 IEEE Custom Integrated Circuits Conference, 2008, p.221-224

2008

Volltextzugriff (PDF)

Matching properties of deep sub-micron MOS transistors

Croon, Jeroen Antoon

2004

Volltextzugriff (PDF)

A yield-aware modeling methodology for nano-scaled SRAM designs

2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005, 2005, p.33-36

2005

Volltextzugriff (PDF)

An Overview on Statistical Modeling of Random Telegraph Noise in the Frequency Domain

Noise in Nanoscale Semiconductor Devices, 2020, p.495-516

2020

Volltextzugriff (PDF)

Surrogate Modeling of RF Circuit Blocks

Progress in Industrial Mathematics at ECMI 2008, p.447-452

Volltextzugriff (PDF)

Surrogate Modeling of Low Noise Amplifiers Based on Transistor Level Simulations

Scientific Computing in Electrical Engineering SCEE 2008, p.225-232

Volltextzugriff (PDF)

Stepwise Latent Class Models for Explaining Group-Level Outcomes Using Discrete Individual-Level Predictors

Multivariate behavioral research, 2015-01, Vol.50 (6), p.662-675

2015

Volltextzugriff (PDF)

Micro–Macro Multilevel Analysis for Discrete Data: A Latent Variable Approach and an Application on Personal Network Data

Sociological methods & research, 2013-11, Vol.42 (4), p.431-457

2013

Volltextzugriff (PDF)

Developing Visual-Assisted Decision Support Systems across Diverse Agricultural Use Cases

Agriculture (Basel), 2022-07, Vol.12 (7), p.1027

2022

Volltextzugriff (PDF)

Measuring Student Ability, Classifying Schools, and Detecting Item Bias at School Level, Based on Student-Level Dichotomous Items

Journal of educational and behavioral statistics, 2014-06, Vol.39 (3), p.180-202

2014

Volltextzugriff (PDF)

Micro–macro multilevel latent class models with multiple discrete individual-level variables

Advances in data analysis and classification, 2016-06, Vol.10 (2), p.139-154

2016

Volltextzugriff (PDF)

The Role of Trust in Secure and Insecure Employment Situations: A Multiple-Group Analysis

Economic and industrial democracy, 2009-11, Vol.30 (4), p.510-538

2009

Volltextzugriff (PDF)

Feedback, Control, or Explanations? Supporting Teachers With Steerable Distractor-Generating AI

Proceedings of the 14th Learning Analytics and Knowledge Conference, 2024, p.690-700

2024

Volltextzugriff (PDF)

Tailoring Gamification for Adolescents: a Validation Study of Big Five and Hexad in Dutch

Proceedings of the Annual Symposium on Computer-Human Interaction in Play, 2020, p.206-218

2020

Volltextzugriff (PDF)

Estimating True Changes when Categorical Panel Data are Affected by Uncorrelated and Correlated Classification Errors: An Application to Unemployment Data

Sociological methods & research, 2000-11, Vol.29 (2), p.230-268

2000

Volltextzugriff (PDF)

1 – 25 von 26

Suche als RSS-Feed

Aktive Filter

ThemaHemts

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(16)
Mit Volltextzugriff
(25)

Publikationsform

Sprache

Englisch
(26)

Erscheinungsjahr

n.n

Thema

Science & Technology
(16)
Technology
(12)
Engineering
(10)
Engineering, Electrical & Electronic
(9)
Physical Sciences
(6)
Social Sciences
(6)
Transistors
(5)
Computer Science
(4)
Mathematical Methods In Social Sciences
(4)
Mathematics
(4)
Multilevel Analysis
(4)
Noise
(4)
Social Sciences, Mathematical Methods
(4)
Circuits
(3)
Cmos Technology
(3)
Correlation Analysis
(3)
Integrated Circuit Modeling
(3)
Latent Class Analysis
(3)
Micro-Macro Analysis
(3)
Mosfet
(3)

15 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Autocorrelation Analysis as a Technique to Study Physical Mechanisms of MOSFET Low-Frequency Noise

RF Circuit Linearity Optimization Using a General Weak Nonlinearity Model

An easy-to-use mismatch model for the MOS transistor

The New CMC Standard Compact MOS Model PSP: Advantages for RF Applications

Control of Buffer-Induced Current Collapse in AlGaN/GaN HEMTs Using SiN x Deposition

Noise and Nonlinearity Modeling of Active Mixers for Fast and Accurate Estimation

Ring-oscillator test-structures for sub-0.1% accuracy wafer-level characterization of active- and standby current consumption, variability, and fast aging of oscillation frequencies

A variability-based analysis technique revealing physical mechanisms of MOSFET low-frequency noise

Automatic model type selection with heterogeneous evolution: An application to RF circuit block modeling

A general weak nonlinearity model for LNAs

Matching properties of deep sub-micron MOS transistors

A yield-aware modeling methodology for nano-scaled SRAM designs

An Overview on Statistical Modeling of Random Telegraph Noise in the Frequency Domain

Surrogate Modeling of RF Circuit Blocks

Surrogate Modeling of Low Noise Amplifiers Based on Transistor Level Simulations

Stepwise Latent Class Models for Explaining Group-Level Outcomes Using Discrete Individual-Level Predictors

Micro–Macro Multilevel Analysis for Discrete Data: A Latent Variable Approach and an Application on Personal Network Data

Developing Visual-Assisted Decision Support Systems across Diverse Agricultural Use Cases

Measuring Student Ability, Classifying Schools, and Detecting Item Bias at School Level, Based on Student-Level Dichotomous Items

Micro–macro multilevel latent class models with multiple discrete individual-level variables

The Role of Trust in Secure and Insecure Employment Situations: A Multiple-Group Analysis

Feedback, Control, or Explanations? Supporting Teachers With Steerable Distractor-Generating AI

Tailoring Gamification for Adolescents: a Validation Study of Big Five and Hexad in Dutch

Estimating True Changes when Categorical Panel Data are Affected by Uncorrelated and Correlated Classification Errors: An Application to Unemployment Data

Aktive Filter

Suchergebnisse filtern