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Short‐term results from seventy‐six patients receiving a bone‐anchored hearing implant installed with a novel minimally invasive surgery technique

Clinical Otolaryngology, 2017-10, Vol.42 (5), p.1043-1048

2017

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The Evolution of Oxygen-Based Inclusions in an Additively Manufactured Super-Duplex Stainless Steel

Metallurgical and materials transactions. A, Physical metallurgy and materials science, 2021-08, Vol.52 (8), p.3401-3412

2021

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Non-monotonic material contrast in scanning ion and scanning electron images

Ultramicroscopy, 2011-11, Vol.111 (11), p.1564-1573

2011

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Stable nitride precipitation in additively manufactured nickel superalloys

Journal of alloys and compounds, 2022-07, Vol.910 (C), p.164918, Article 164918

2022

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Comparison of Channeling Contrast between Ion and Electron Images

Microscopy and microanalysis, 2013-04, Vol.19 (2), p.344-349

2013

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Reducing FIB Damage Using Low Energy Ions

Microscopy and microanalysis, 2006-08, Vol.12 (S02), p.1260-1261

Giannuzzi, LA

2006

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EXpressLO™ for Fast and Versatile FIB Specimen Preparation

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.632-633

Giannuzzi, L.A.

2012

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The Correlation between Ion Beam/Material Interactions and Practical FIB Specimen Preparation

Microscopy and microanalysis, 2003-06, Vol.9 (3), p.216-236

2003

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A review of focused ion beam milling techniques for TEM specimen preparation

Micron (Oxford, England : 1993), 1999-06, Vol.30 (3), p.197-204

1999

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Phase transformations of thermally grown oxide on (Ni,Pt)Al bondcoat during electron beam physical vapor deposition and subsequent oxidation

Surface & coatings technology, 2004-01, Vol.177, p.121-130

2004

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FIB Applications: A Historical Perspective

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.294-295

2014

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Ion Channeling vs. Electron Channeling Image Contrast

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.694-695

2012

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FIB Damage in Silicon: Amorphization or Redeposition?

Microscopy and microanalysis, 2002-08, Vol.8 (S02), p.50-51

2002

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Focused Ion Beam Milling and Micromanipulation Lift-Out for Site Specific Cross-Section Tem Specimen Preparation

MRS proceedings, 1997, Vol.480, Article 19

1997

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Focused ion beam milling: A method of site-specific sample extraction for microanalysis of Earth and planetary materials

The American mineralogist, 2001-09, Vol.86 (9), p.1094-1099

2001

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Applications of the FIB lift-out technique for TEM specimen preparation

Microscopy research and technique, 1998-05, Vol.41 (4), p.285-290

1998

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Do Tryptase, ECP and Specific IgE Measurement by Nasal Incubation Increase the Specific Nasal Provocation Test Sensitivity?

International journal of immunopathology and pharmacology, 2004-05, Vol.17 (2), p.201-208

2004

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Relative Contrast in Ion and Electron Induced Secondary Electron Images

Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.1188-1189

2008

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Occurrence of Toxic Cyanobacterial Blooms in Rio de la Plata Estuary, Argentina: Field Study and Data Analysis

Journal of Toxicology, 2012-01, Vol.2012 (2012), p.253-267

2012

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Application of backscatter electrons for large area imaging of cavities produced by neutron irradiation

Journal of nuclear materials, 2016-11, Vol.480, p.289-300

2016

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Two-Dimensional and 3-Dimensional Analysis of Bone/Dental Implant Interfaces With the Use of Focused Ion Beam and Electron Microscopy

Journal of oral and maxillofacial surgery, 2007-04, Vol.65 (4), p.737-747

2007

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Wet thermal oxidation of GaN

Journal of electronic materials, 1999-03, Vol.28 (3), p.257-260

1999

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Issues Affecting Quantitative Evaluation of Dopant Profiles Using Electron Holography

Microscopy and microanalysis, 2003-08, Vol.9 (S02), p.776-777

2003

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Theoretical 3D Imaging with He+ Ions

Microscopy and microanalysis, 2013-08, Vol.19 (S2), p.358-359

Giannuzzi, L.A.

2013

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Enhancing Ex-Situ Lift-Out with EXpressLO

Microscopy and microanalysis, 2013-08, Vol.19 (S2), p.906-907

Giannuzzi, L.A.

2013

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Short‐term results from seventy‐six patients receiving a bone‐anchored hearing implant installed with a novel minimally invasive surgery technique

The Evolution of Oxygen-Based Inclusions in an Additively Manufactured Super-Duplex Stainless Steel

Non-monotonic material contrast in scanning ion and scanning electron images

Stable nitride precipitation in additively manufactured nickel superalloys

Comparison of Channeling Contrast between Ion and Electron Images

Reducing FIB Damage Using Low Energy Ions

EXpressLO™ for Fast and Versatile FIB Specimen Preparation

The Correlation between Ion Beam/Material Interactions and Practical FIB Specimen Preparation

A review of focused ion beam milling techniques for TEM specimen preparation

Phase transformations of thermally grown oxide on (Ni,Pt)Al bondcoat during electron beam physical vapor deposition and subsequent oxidation

FIB Applications: A Historical Perspective

Ion Channeling vs. Electron Channeling Image Contrast

FIB Damage in Silicon: Amorphization or Redeposition?

Focused Ion Beam Milling and Micromanipulation Lift-Out for Site Specific Cross-Section Tem Specimen Preparation

Focused ion beam milling: A method of site-specific sample extraction for microanalysis of Earth and planetary materials

Applications of the FIB lift-out technique for TEM specimen preparation

Do Tryptase, ECP and Specific IgE Measurement by Nasal Incubation Increase the Specific Nasal Provocation Test Sensitivity?

Relative Contrast in Ion and Electron Induced Secondary Electron Images

Occurrence of Toxic Cyanobacterial Blooms in Rio de la Plata Estuary, Argentina: Field Study and Data Analysis

Application of backscatter electrons for large area imaging of cavities produced by neutron irradiation

Two-Dimensional and 3-Dimensional Analysis of Bone/Dental Implant Interfaces With the Use of Focused Ion Beam and Electron Microscopy

Wet thermal oxidation of GaN

Issues Affecting Quantitative Evaluation of Dopant Profiles Using Electron Holography

Theoretical 3D Imaging with He+ Ions

Enhancing Ex-Situ Lift-Out with EXpressLO

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