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Analysis of the feasibility of CF 3I/CO2 used in C-GIS by partial discharge inception voltages in positive half cycle and breakdown voltages

IEEE transactions on dielectrics and electrical insulation, 2015-12, Vol.22 (6), p.3234

2015

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Mechanical and dielectric properties of epoxyaclay nanocomposites

Journal of materials science, 2014-02, Vol.49 (4), p.1574-1584

2014

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Facts and Myths of Dielectric Breakdown Processes-Part II: Post-Breakdown and Variability

IEEE transactions on electron devices, 2019-11, Vol.66 (11), p.4535-4545

Wu, Ernest Y.

2019

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High-breakdown voltage and low on-resistance AlGaN/GaN on Si MOS-HEMTs employing an extended TaN gate on HfO sub( 2) gate insulator

Electronics letters, 2013-03, Vol.49 (6), p.1-1

2013

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New Breakdown Diagnosis Method based on Electrical Measurement and Deep Learning Recognition for Multiple Electrodes in Vacuum

IEEE transactions on dielectrics and electrical insulation, 2024, p.1-1

2024

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Pre-breakdown Evolution of Field Emission Induced Breakdown under Impulse Voltage

IEEE transactions on dielectrics and electrical insulation, 2023-09, p.1-1

2023

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Dielectric behavior and energy storage properties in BaO-SrO-Nb sub(2)O sub(5)-B sub(2)O sub(3) system glass-ceramics with Gd sub(2)O sub(3) addition

Journal of materials science. Materials in electronics, 2014-01, Vol.25 (1), p.349-354

2014

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Real-time production scheduling in the Industry-4.0 context: Addressing uncertainties in job arrivals and machine breakdowns

Computers & operations research, 2020-11, Vol.123, p.105031, Article 105031

2020

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Evolutionary Multiobjective Blocking Lot-Streaming Flow Shop Scheduling With Machine Breakdowns

IEEE transactions on cybernetics, 2019-01, Vol.49 (1), p.184-197

2019

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RDELAaa Delaunay-triangulation-based, location and covariance estimator with high breakdown point

Statistics and computing, 2013-11, Vol.23 (6), p.677-688

2013

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Size-dependence of the dielectric breakdown strength from nano- to millimeter scale

Journal of the mechanics and physics of solids, 2014-02, Vol.63, p.201-213

2014

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Robust and stable flexible job shop scheduling with random machine breakdowns using a hybrid genetic algorithm

International journal of production economics, 2011-08, Vol.132 (2), p.279-291

2011

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Erratum: “Dielectric breakdown at sub-critical fields” [Appl. Phys. Lett. 113, 112901 (2018)]

Applied physics letters, 2019-10, Vol.115 (17)

2019

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AC and Lightning Impulse Breakdown Voltages of Natural Ester Based Fullerene Nanofluids

IEEE transactions on dielectrics and electrical insulation, 2021-12, Vol.28 (6), p.1996-2003

2021

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Distribution Capacitor Health Monitoring Based on the Disturbances of Element Breakdown Faults

IEEE transactions on power delivery, 2022-10, Vol.37 (5), p.4064-4072

2022

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Robust Breakdown Reliability and Improved Endurance in Hf0.5Zr0.5O2 Ferroelectric Using Grain Boundary Interruption

IEEE transactions on electron devices, 2022-01, Vol.69 (1), p.430-433

2022

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A Study on Practically Unlimited Endurance of STT-MRAM

IEEE transactions on electron devices, 2017-09, Vol.64 (9), p.3639-3646

2017

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Facts and Myths of Dielectric Breakdown Processes-Part I: Statistics, Experimental, and Physical Acceleration Models

IEEE transactions on electron devices, 2019-11, Vol.66 (11), p.4523-4534

Wu, Ernest Y.

2019

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A multi objective optimization approach for flexible job shop scheduling problem under random machine breakdown by evolutionary algorithms

Computers & operations research, 2016-09, Vol.73, p.56-66

2016

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Improvement of Endurance in HZO-Based Ferroelectric Capacitor Using Ru Electrode

IEEE electron device letters, 2019-11, Vol.40 (11), p.1744-1747

2019

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Heavy-Ion Radiation Effects in AlGaN/GaN High-Electron-Mobility Transistors

IEEE transactions on nuclear science, 2024-04, Vol.71 (4), p.902-911

2024

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Unveiling the Vulnerability of Oxide-Breakdown-Based PUF

IEEE electron device letters, 2024-05, Vol.45 (5), p.750-753

2024

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A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both Traditional CMOS and FinFET Technology

IEEE transactions on very large scale integration (VLSI) systems, 2018-11, Vol.26 (11), p.2470-2482

2018

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Determination of the Gate Breakdown Mechanisms in p-GaN Gate HEMTs by Multiple-Gate-Sweep Measurements

IEEE transactions on electron devices, 2021-04, Vol.68 (4), p.1518-1523

2021

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Fluoronitriles/CO2 gas mixture as promising substitute to SF6 for insulation in high voltage applications

IEEE transactions on dielectrics and electrical insulation, 2016-10, Vol.23 (5), p.2587-2593

2016

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Analysis of the feasibility of CF 3I/CO2 used in C-GIS by partial discharge inception voltages in positive half cycle and breakdown voltages

Mechanical and dielectric properties of epoxyaclay nanocomposites

Facts and Myths of Dielectric Breakdown Processes-Part II: Post-Breakdown and Variability

High-breakdown voltage and low on-resistance AlGaN/GaN on Si MOS-HEMTs employing an extended TaN gate on HfO sub( 2) gate insulator

New Breakdown Diagnosis Method based on Electrical Measurement and Deep Learning Recognition for Multiple Electrodes in Vacuum

Pre-breakdown Evolution of Field Emission Induced Breakdown under Impulse Voltage

Dielectric behavior and energy storage properties in BaO-SrO-Nb sub(2)O sub(5)-B sub(2)O sub(3) system glass-ceramics with Gd sub(2)O sub(3) addition

Real-time production scheduling in the Industry-4.0 context: Addressing uncertainties in job arrivals and machine breakdowns

Evolutionary Multiobjective Blocking Lot-Streaming Flow Shop Scheduling With Machine Breakdowns

RDELAaa Delaunay-triangulation-based, location and covariance estimator with high breakdown point

Size-dependence of the dielectric breakdown strength from nano- to millimeter scale

Robust and stable flexible job shop scheduling with random machine breakdowns using a hybrid genetic algorithm

Erratum: “Dielectric breakdown at sub-critical fields” [Appl. Phys. Lett. 113, 112901 (2018)]

AC and Lightning Impulse Breakdown Voltages of Natural Ester Based Fullerene Nanofluids

Distribution Capacitor Health Monitoring Based on the Disturbances of Element Breakdown Faults

Robust Breakdown Reliability and Improved Endurance in Hf0.5Zr0.5O2 Ferroelectric Using Grain Boundary Interruption

A Study on Practically Unlimited Endurance of STT-MRAM

Facts and Myths of Dielectric Breakdown Processes-Part I: Statistics, Experimental, and Physical Acceleration Models

A multi objective optimization approach for flexible job shop scheduling problem under random machine breakdown by evolutionary algorithms

Improvement of Endurance in HZO-Based Ferroelectric Capacitor Using Ru Electrode

Heavy-Ion Radiation Effects in AlGaN/GaN High-Electron-Mobility Transistors

Unveiling the Vulnerability of Oxide-Breakdown-Based PUF

A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both Traditional CMOS and FinFET Technology

Determination of the Gate Breakdown Mechanisms in p-GaN Gate HEMTs by Multiple-Gate-Sweep Measurements

Fluoronitriles/CO2 gas mixture as promising substitute to SF6 for insulation in high voltage applications

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