UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 445

Sortiert nach

The Fun in Fuzzing: The debugging technique comes into its own

ACM queue, 2022-12, Vol.20 (6), p.80-87

2022

Volltextzugriff (PDF)

Taking Flight with Copilot: Early insights and opportunities of AI-powered pair-programming tools

ACM queue, 2022-12, Vol.20 (6), p.35-57

2022

Volltextzugriff (PDF)

Getting Off the Mad Path: Debuggers and assertions

ACM queue, 2021-12, Vol.19 (6), p.18-21

Neville-Neil, George V.

2021

Volltextzugriff (PDF)

Improving Testing of Deep-learning Systems: A combination of differential and mutation testing results in better test data

ACM queue, 2023-10, Vol.21 (5), p.54-65

2023

Volltextzugriff (PDF)

When Should a Black Box Be Transparent?: When is a replacement not a replacement?

ACM queue, 2022-04, Vol.20 (2), p.11-15

Neville-Neil, George V.

2022

Volltextzugriff (PDF)

Divide and Conquer: The use and limits of bisection

ACM queue, 2021-06, Vol.19 (3), p.37-39

Neville-Neil, George V.

2021

Volltextzugriff (PDF)

Debugging Incidents in Google’s Distributed Systems: How experts debug production issues in complex distributed systems

ACM queue, 2020-04, Vol.18 (2), p.47-66

2020

Volltextzugriff (PDF)

To Catch a Failure: The Record-and-Replay Approach to Debugging: A discussion with Robert O’Callahan, Kyle Huey, Devon O’Dell, and Terry Coatta

ACM queue, 2020-02, Vol.18 (1), p.61-79

2020

Volltextzugriff (PDF)

EngageCSEduAssignments: to re-use or not re-use? That is the question

ACM Inroads, 2021-09, Vol.12 (3), p.18-20

2021

Volltextzugriff (PDF)

Ultra-Low Noise Defect Probing Instrument for Defect Spectroscopy of MOS Transistors

IEEE transactions on device and materials reliability, 2020-06, Vol.20 (2), p.242-250

Waltl, Michael

2020

Volltextzugriff (PDF)

Aging and Sintered Layer Defect Detection of Discrete MOSFETs Using Frequency Domain Reflectometry Associated With Parasitic Resistance

IEEE transactions on device and materials reliability, 2024-03, Vol.24 (1), p.1-1

2024

Volltextzugriff (PDF)

An automated cucumber inspection system based on neural network

Journal of food process engineering, 2022-09, Vol.45 (9), p.n/a

2022

Volltextzugriff (PDF)

Machine Learning Approach for Prediction of Point Defect Effect in FinFET

IEEE transactions on device and materials reliability, 2021-06, Vol.21 (2), p.252-257

2021

Volltextzugriff (PDF)

Extraction of Charge Trapping Kinetics of Defects From Single-Defect Measurements

IEEE transactions on device and materials reliability, 2024-06, Vol.24 (2), p.168-173

2024

Volltextzugriff (PDF)

Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO2Transistors

IEEE transactions on device and materials reliability, 2023-09, Vol.23 (3), p.355

2023

Volltextzugriff (PDF)

LCHC-DFT: A Low-Cost High-Coverage Design-for-Testability Technique to Detect Hard-to-Detect Faults in STT-MRAMs in the Presence of Process Variations

IEEE transactions on device and materials reliability, 2022-12, Vol.22 (4), p.477-487

2022

Volltextzugriff (PDF)

Assessing AMS-RF Test Quality by Defect Simulation

IEEE transactions on device and materials reliability, 2019-03, Vol.19 (1), p.55-63

2019

Volltextzugriff (PDF)

A deep reinforcement learning‐based maintenance optimization for vacuum packaging machines considering product quality degradation

Journal of food process engineering, 2023-11, Vol.46 (11)

2023

Volltextzugriff (PDF)

CD-DFT: A Current-Difference Design-for-Testability to Detect Short Defects of STT-MRAM Under Process Variations

IEEE transactions on device and materials reliability, 2021-09, Vol.21 (3), p.436-443

2021

Volltextzugriff (PDF)

Extraction of Statistical Gate Oxide Parameters From Large MOSFET Arrays

IEEE transactions on device and materials reliability, 2020-06, Vol.20 (2), p.251-257

2020

Volltextzugriff (PDF)

Universal Dielectric Breakdown Modeling Under Off-State TDDB for Ultra-Scaled Device From 130nm to 28nm Nodes and Beyond

IEEE transactions on device and materials reliability, 2024-06, Vol.24 (2), p.174-183

2024

Volltextzugriff (PDF)

On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors

IEEE transactions on device and materials reliability, 2021-06, Vol.21 (2), p.199-206

2021

Volltextzugriff (PDF)

Did You Really Test That Interlock?: The Importance of Early Identification of Defects

IEEE industry applications magazine, 2024-07, Vol.30 (4), p.69-74

Sullivan, Paul B.

2024

Volltextzugriff (PDF)

Cell-Aware Defect Diagnosis of Customer Returns Based on Supervised Learning

IEEE transactions on device and materials reliability, 2020-06, Vol.20 (2), p.329-340

2020

Volltextzugriff (PDF)

ESI launches simulation software for composites

Reinforced plastics (London), 2017-01, Vol.61 (1), p.23-23

2017

Volltextzugriff (PDF)

1 – 25 von 445

Suche als RSS-Feed

Aktive Filter

ThemaComputer Science

Publikationsformmagazinearticle

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(86)
Mit Volltextzugriff
(312)

Sprache

Erscheinungsjahr

n.n

Thema

Engineering
(296)
Defects
(283)
Science & Technology
(274)
Technology
(271)
Engineering, Electrical & Electronic
(180)
Physics
(140)
Physical Sciences
(131)
Physics, Applied
(130)
Physics, Condensed Matter
(48)
Manufacturing
(45)
Software
(43)
Engineering, Mechanical
(37)
Inspections
(37)
Quality Control
(37)
Product Defects And Recalls
(35)
Semiconductors
(34)
Exact Sciences And Technology
(29)
Degradation
(28)
Management
(28)
Devices
(27)

15 weitere anzeigen...

Weniger anzeigen...

Neu hinzugefügt

... seit 90 Tagen
(1)

Menü

Weitere Dienste

Einstellungen

The Fun in Fuzzing: The debugging technique comes into its own

Taking Flight with Copilot: Early insights and opportunities of AI-powered pair-programming tools

Getting Off the Mad Path: Debuggers and assertions

Improving Testing of Deep-learning Systems: A combination of differential and mutation testing results in better test data

When Should a Black Box Be Transparent?: When is a replacement not a replacement?

Divide and Conquer: The use and limits of bisection

Debugging Incidents in Google’s Distributed Systems: How experts debug production issues in complex distributed systems

To Catch a Failure: The Record-and-Replay Approach to Debugging: A discussion with Robert O’Callahan, Kyle Huey, Devon O’Dell, and Terry Coatta

EngageCSEduAssignments: to re-use or not re-use? That is the question

Ultra-Low Noise Defect Probing Instrument for Defect Spectroscopy of MOS Transistors

Aging and Sintered Layer Defect Detection of Discrete MOSFETs Using Frequency Domain Reflectometry Associated With Parasitic Resistance

An automated cucumber inspection system based on neural network

Machine Learning Approach for Prediction of Point Defect Effect in FinFET

Extraction of Charge Trapping Kinetics of Defects From Single-Defect Measurements

Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO2Transistors

LCHC-DFT: A Low-Cost High-Coverage Design-for-Testability Technique to Detect Hard-to-Detect Faults in STT-MRAMs in the Presence of Process Variations

Assessing AMS-RF Test Quality by Defect Simulation

A deep reinforcement learning‐based maintenance optimization for vacuum packaging machines considering product quality degradation

CD-DFT: A Current-Difference Design-for-Testability to Detect Short Defects of STT-MRAM Under Process Variations

Extraction of Statistical Gate Oxide Parameters From Large MOSFET Arrays

Universal Dielectric Breakdown Modeling Under Off-State TDDB for Ultra-Scaled Device From 130nm to 28nm Nodes and Beyond

On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors

Did You Really Test That Interlock?: The Importance of Early Identification of Defects

Cell-Aware Defect Diagnosis of Customer Returns Based on Supervised Learning

ESI launches simulation software for composites

Aktive Filter

Suchergebnisse filtern