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Dependence of electrical properties of epitaxial Pb(Zr,Ti)O3 thick films on crystal orientation and Zr∕(Zr+Ti) ratio

Journal of applied physics, 2005-11, Vol.98 (9)

2005

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Domain structure and polarization properties of lanthanum-substituted bismuth titanate single crystals

Applied physics letters, 2004-01, Vol.84 (1), p.100-102

2004

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Crystal structure, electrical properties, and mechanical response of (100)-/(001)-oriented epitaxial Pb(Mg1∕3Nb2∕3)O3–PbTiO3 films grown on (100)cSrRuO3‖(100)SrTiO3 substrates by metal-organic chemical vapor deposition

Journal of applied physics, 2006-09, Vol.100 (5)

2006

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CRYSTAL ORIENTATION ANISOTROPY OF EPITAXIAL Pb(Mg1/3Nb2/3)O3-PbTiO3 THICK FILMS GROWN BY MOCVD

Integrated ferroelectrics, 2006-11, Vol.80 (1), p.67-76

2006

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DOMAIN ORIENTATION IMAGING OF PbTiO3 SINGLE CRYSTALS BY VERTICAL AND LATERAL PIEZORESPONSE FORCE MICROSCOPY

Jpn.J.Appl.Phys ,Part 1. Vol. 40, no. 9B, pp. 5828-5832. 2001, 2001, Vol.40 (9B), p.5828-5832

2001

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Electric-Field-Induced Displacements in Pt/PZT/Pt/SiO2/Si System Investigated by Finite Element Method: Material-Constant Dependences

MRS proceedings, 2005, Vol.902

2005

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Sample Geometry Effects on Electric-Field-Induced Displacements in Piezoelectric Thin Films Measured by Atomic Force Microscopy

MRS proceedings, 2003, Vol.784, Article C11.29

2003

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Visualization of the Domain Orientation in Relaxor Ferroelectric Single Crystals by Piezoresponse Force Microscopy

Ferroelectrics, 2002-01, Vol.268 (1), p.119-124

2002

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Domain Orientation Imaging of PbTiO 3 Single Crystals by Vertical and Lateral Piezoresponse Force Microscopy

Japanese Journal of Applied Physics, 2001-09, Vol.40 (9S), p.5828

2001

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Electrical Properties of Highly Strained Epitaxial Pb(Zr,Ti)O 3 Thin Films on MgO(100)

Japanese Journal of Applied Physics, 1999-09, Vol.38 (9S), p.5388

1999

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Thermally Stimulated Current and Polarization Fatigue in Pb(Zr,Ti)O 3 Thin Films

Japanese Journal of Applied Physics, 1998-09, Vol.37 (9S), p.5137

1998

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Electrical properties of PZT thin films grown on Ir/IrO2 bottom electrodes by MOCVD

Integrated ferroelectrics, 1998-09, Vol.21 (1-4), p.107-114

1998

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Cooling-Rate-Dependence of Dielectric Constant and Domain Structures in (1-x)Pb(Mg 1/3 Nb 2/3 )O 3 –xPbTiO 3 Single Crystals

Japanese Journal of Applied Physics, 2005-09, Vol.44 (9S), p.7160

2005

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Crystal structure, electrical properties, and mechanical responseof (100)-/(001)-oriented epitaxial Pb ( Mg 1 ∕ 3 Nb 2 ∕ 3 ) O 3 - Pb Ti O 3 filmsgrown on ( 100 ) c Sr Ru O 3 || ( 100 ) Sr Ti O 3 substrates by metal-organicchemical vapor deposition

Journal of applied physics, 2006-09, Vol.100 (5), p.054110-054110-7

2006

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Cooling-Rate-Dependent Domain Structures of Pb(Mg 1/3 Nb 2/3 )O 3 -PbTiO 3 Single Crystals Observed by Contact Resonance Piezoresponse Force Microscopy

Japanese Journal of Applied Physics, 2004-09, Vol.43 (9S), p.6808

2004

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Pb Ti O 3 content dependence of crystal structure and electrical propertiesof (100)-/(001)-oriented epitaxial Pb ( Mg 1 ∕ 3 Nb 2 ∕ 3 ) O 3 - Pb Ti O 3 filmsgrown by metalorganic chemical vapor deposition

Journal of applied physics, 2005-10, Vol.98 (8), p.086112-086112-3

2005

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Pb Ti O 3 content dependence of crystal structure and electrical properties of (100)-/(001)-oriented epitaxial Pb(Mg1∕3Nb2∕3)O3-PbTiO3 films grown by metalorganic chemical vapor deposition

Journal of applied physics, 2005-10, Vol.98 (8)

2005

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Contact-Resonance Piezoresponse Force Microscope and Its Application to Domain Observation of Pb(Mg 1/3 Nb 2/3 )O 3 –PbTiO 3 Single Crystals

Japanese Journal of Applied Physics, 2003-09, Vol.42 (Part 1, No. 9B), p.6209-6213

2003

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Dependence of electrical properties of epitaxial Pb ( Zr , Ti ) O 3 thick filmson crystal orientation and Zr ∕ ( Zr + Ti ) ratio

Journal of applied physics, 2005-11, Vol.98 (9), p.094106-094106-8

2005

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Effect of Diameter on Longitudinal Displacement in Disk Shape 10-μm-thick Lead Zirconate Titanate Films

MRS proceedings, 2005, Vol.902, Article 0902-T03-09

2005

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CRYSTAL ORIENTATION ANISOTROPY OF EPITAXIAL Pb(Mg 1/3 Nb 2/3 )O 3 -PbTiO 3 THICK FILMS GROWN BY MOCVD

Integrated ferroelectrics, 2006-11, Vol.80 (1), p.67-76

2006

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Electric-Field-Induced Displacements in Pt/PZT/Pt/SiO 2 /Si System Investigated by Finite Element Method: Material-Constant Dependences

MRS proceedings, 2005, Vol.902, Article 0902-T03-49

2005

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Piezoelectric Properties of Polar-Axis-Oriented Ferroelectric Bi 4-x Pr x Ti 3 O 12 Thick Films

Japanese Journal of Applied Physics, 2004-09, Vol.43 (9S), p.6689

2004

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Double-Layer Type Microwave Absorber Made of Magnetic-Dielectric Composite Material

Ferroelectrics, 2002-01, Vol.271 (1), p.297-302

2002

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Characteristic Comparison Of Epitaxial PZT And PMN-PT Films Grown On (100) c SrRuO 3 //(100)SrTiO 3 Substrates By Metalorganic Chemical Vapor Deposition

MRS proceedings, 2005, Vol.902, Article 0902-T03-29

2005

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Dependence of electrical properties of epitaxial Pb(Zr,Ti)O3 thick films on crystal orientation and Zr∕(Zr+Ti) ratio

Domain structure and polarization properties of lanthanum-substituted bismuth titanate single crystals

Crystal structure, electrical properties, and mechanical response of (100)-/(001)-oriented epitaxial Pb(Mg1∕3Nb2∕3)O3–PbTiO3 films grown on (100)cSrRuO3‖(100)SrTiO3 substrates by metal-organic chemical vapor deposition

CRYSTAL ORIENTATION ANISOTROPY OF EPITAXIAL Pb(Mg1/3Nb2/3)O3-PbTiO3 THICK FILMS GROWN BY MOCVD

DOMAIN ORIENTATION IMAGING OF PbTiO3 SINGLE CRYSTALS BY VERTICAL AND LATERAL PIEZORESPONSE FORCE MICROSCOPY

Electric-Field-Induced Displacements in Pt/PZT/Pt/SiO2/Si System Investigated by Finite Element Method: Material-Constant Dependences

Sample Geometry Effects on Electric-Field-Induced Displacements in Piezoelectric Thin Films Measured by Atomic Force Microscopy

Visualization of the Domain Orientation in Relaxor Ferroelectric Single Crystals by Piezoresponse Force Microscopy

Domain Orientation Imaging of PbTiO 3 Single Crystals by Vertical and Lateral Piezoresponse Force Microscopy

Electrical Properties of Highly Strained Epitaxial Pb(Zr,Ti)O 3 Thin Films on MgO(100)

Thermally Stimulated Current and Polarization Fatigue in Pb(Zr,Ti)O 3 Thin Films

Electrical properties of PZT thin films grown on Ir/IrO2 bottom electrodes by MOCVD

Cooling-Rate-Dependence of Dielectric Constant and Domain Structures in (1-x)Pb(Mg 1/3 Nb 2/3 )O 3 –xPbTiO 3 Single Crystals

Crystal structure, electrical properties, and mechanical responseof (100)-/(001)-oriented epitaxial Pb ( Mg 1 ∕ 3 Nb 2 ∕ 3 ) O 3 - Pb Ti O 3 filmsgrown on ( 100 ) c Sr Ru O 3 || ( 100 ) Sr Ti O 3 substrates by metal-organicchemical vapor deposition

Cooling-Rate-Dependent Domain Structures of Pb(Mg 1/3 Nb 2/3 )O 3 -PbTiO 3 Single Crystals Observed by Contact Resonance Piezoresponse Force Microscopy

Pb Ti O 3 content dependence of crystal structure and electrical propertiesof (100)-/(001)-oriented epitaxial Pb ( Mg 1 ∕ 3 Nb 2 ∕ 3 ) O 3 - Pb Ti O 3 filmsgrown by metalorganic chemical vapor deposition

Pb Ti O 3 content dependence of crystal structure and electrical properties of (100)-/(001)-oriented epitaxial Pb(Mg1∕3Nb2∕3)O3-PbTiO3 films grown by metalorganic chemical vapor deposition

Contact-Resonance Piezoresponse Force Microscope and Its Application to Domain Observation of Pb(Mg 1/3 Nb 2/3 )O 3 –PbTiO 3 Single Crystals

Dependence of electrical properties of epitaxial Pb ( Zr , Ti ) O 3 thick filmson crystal orientation and Zr ∕ ( Zr + Ti ) ratio

Effect of Diameter on Longitudinal Displacement in Disk Shape 10-μm-thick Lead Zirconate Titanate Films

CRYSTAL ORIENTATION ANISOTROPY OF EPITAXIAL Pb(Mg 1/3 Nb 2/3 )O 3 -PbTiO 3 THICK FILMS GROWN BY MOCVD

Electric-Field-Induced Displacements in Pt/PZT/Pt/SiO 2 /Si System Investigated by Finite Element Method: Material-Constant Dependences

Piezoelectric Properties of Polar-Axis-Oriented Ferroelectric Bi 4-x Pr x Ti 3 O 12 Thick Films

Double-Layer Type Microwave Absorber Made of Magnetic-Dielectric Composite Material

Characteristic Comparison Of Epitaxial PZT And PMN-PT Films Grown On (100) c SrRuO 3 //(100)SrTiO 3 Substrates By Metalorganic Chemical Vapor Deposition

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