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Molecular-Scale Structures of Langmuir-Blodgett Films of Fatty Acids Observed by Atomic Force Microscopy

Japanese Journal of Applied Physics, 1995, Vol.34 (7S), p.3898

1995

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Formation of Self-Assembled Organic Ultrathin film by Chemisorption on Silicon Crystal Surface

Japanese Journal of Applied Physics, 1996-06, Vol.35 (6R), p.3542

1996

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Fluorine Termination of Silicon Surface by F 2 and Succeeding Reaction with Water

Japanese Journal of Applied Physics, 1993-06, Vol.32 (6S), p.3125

1993

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The study of the thermal oxide films on silicon wafers by Fourier transform infrared attenuated total reflection spectroscopy

Journal of applied physics, 1990-08, Vol.68 (4), p.1429-1434

1990

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Photochemical formation of silver metal films from silver salt of natural high molecular carboxylic acid

Journal of applied physics, 1990-08, Vol.68 (3), p.1297-1302

1990

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Rhombohedral Phase in Y2O3-Partially-Stabilized ZrO2

Journal of the American Ceramic Society, 1988-01, Vol.71 (1), p.C-34-C-36

1988

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Structural Changes by Compressive Stresses of 2.0-mol%-Yttria-Stabilized Tetragonal Zirconia Polycrystals

Journal of the American Ceramic Society, 1989-05, Vol.72 (5), p.854-855

1989

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Atomic force microscopy of solution grown polyethylene single crystals

Japanese Journal of Applied Physics, 1994, Vol.33 (6B), p.3771-3774

1994

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Surface modification of poly(methyl methacrylate) film by siloxane graft copolymers

Macromolecules, 1985-05, Vol.18 (3), p.580-582

1985

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Spectroscopic evidence for resin-reinforced dentine by a Raman microprobe technique

Journal of Raman spectroscopy, 1987-08, Vol.18 (5), p.315-316

1987

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FT-IR-ATR observation of SiOH and SiH in the oxide layer on an Si wafer

Mikrochimica acta (1966), 1988-01, Vol.94 (1-6), p.431-434

1988

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New Analytical Techniques on Polymer Materials Surface

Hyomen Kagaku, 1995/01/10, Vol.16(1), pp.45-50

ISHITANI, Akira

1995

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Analytical Techniques on Composite Interfaces

Sen'i Gakkaishi, 1988/02/10, Vol.44(2), pp.P51-P55

ISHITANI, AKIRA

1988

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XPS analysis of NH3 plasma-treated polystyrene films utilizing gas phase chemical modification

Journal of polymer science. Part A, Polymer chemistry, 1988-02, Vol.26 (2), p.559-572

1988

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A study of XPS O1s spectrum of poly(ethylene terephthalate)

Journal of polymer science. Part A, Polymer chemistry, 1990-06, Vol.28 (7), p.1813-1821

1990

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Model compounds for high modulus aromatic polyether-esters. X-ray structures and energy calculations of dimethyl 1,2-bis(phenoxy)ethane-4,4′-dicarboxylate and its chlorinated derivatives

Polymer (Guilford), 1994-01, Vol.35 (24), p.5179-5184

1994

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Characterization of long-periodic layered structures by X-ray diffraction IV: Small angle X-ray diffraction from a superlattice with non-ideal interfaces

Thin solid films, 1991-08, Vol.203 (1), p.113-120

1991

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Characterization of Paint Surface by New Analytical Techniques

Journal of the Japan Society of Colour Material, 1980/08/20, Vol.53(8), pp.468-475

ISHITANI, Akira

1980

Volltextzugriff (PDF)

Fluorine termination of silicon surface by F2 and succeeding reaction with water

Japanese journal of applied physics, 1993-06, Vol.32 (6B), p.3125-3130

1993

Volltextzugriff (PDF)

Structural Changes by Mechanical and Thermal Stresses of 2.5-mol%-Y2O3-Stabilized Tetragonal ZrO2 Polycrystals

Journal of the American Ceramic Society, 1988-08, Vol.71 (8), p.C-382-C-383

1988

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Characterization of long-periodic layered structures by X-ray diffraction I: A system for small angle and intermediate angle X-ray diffraction using a reflection kratky camera

Thin solid films, 1990-09, Vol.190 (2), p.317-323

1990

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Small-angle x-ray scattering of distorted lamellar structures

Journal of polymer science. Part B, Polymer physics, 1993-08, Vol.31 (9), p.1179-1186

1993

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Characterization of long-periodic layered structures by X-ray diffraction II: Lattice distortion of Langmuir-Blodgett films of lead stearate

Thin solid films, 1990-09, Vol.190 (2), p.325-334

1990

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XPS study of oriented organic molecules

Journal of colloid and interface science, 1989-08, Vol.131 (1), p.153-160

1989

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Mesoscopic layered structure in conducting polymer thin film fabricated by potential-programmed electropolymerization

Synthetic metals, 1992, Vol.53 (1), p.1-10

1992

Volltextzugriff (PDF)

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Molecular-Scale Structures of Langmuir-Blodgett Films of Fatty Acids Observed by Atomic Force Microscopy

Formation of Self-Assembled Organic Ultrathin film by Chemisorption on Silicon Crystal Surface

Fluorine Termination of Silicon Surface by F 2 and Succeeding Reaction with Water

The study of the thermal oxide films on silicon wafers by Fourier transform infrared attenuated total reflection spectroscopy

Photochemical formation of silver metal films from silver salt of natural high molecular carboxylic acid

Rhombohedral Phase in Y2O3-Partially-Stabilized ZrO2

Structural Changes by Compressive Stresses of 2.0-mol%-Yttria-Stabilized Tetragonal Zirconia Polycrystals

Atomic force microscopy of solution grown polyethylene single crystals

Surface modification of poly(methyl methacrylate) film by siloxane graft copolymers

Spectroscopic evidence for resin-reinforced dentine by a Raman microprobe technique

FT-IR-ATR observation of SiOH and SiH in the oxide layer on an Si wafer

New Analytical Techniques on Polymer Materials Surface

Analytical Techniques on Composite Interfaces

XPS analysis of NH3 plasma-treated polystyrene films utilizing gas phase chemical modification

A study of XPS O1s spectrum of poly(ethylene terephthalate)

Model compounds for high modulus aromatic polyether-esters. X-ray structures and energy calculations of dimethyl 1,2-bis(phenoxy)ethane-4,4′-dicarboxylate and its chlorinated derivatives

Characterization of long-periodic layered structures by X-ray diffraction IV: Small angle X-ray diffraction from a superlattice with non-ideal interfaces

Characterization of Paint Surface by New Analytical Techniques

Fluorine termination of silicon surface by F2 and succeeding reaction with water

Structural Changes by Mechanical and Thermal Stresses of 2.5-mol%-Y2O3-Stabilized Tetragonal ZrO2 Polycrystals

Characterization of long-periodic layered structures by X-ray diffraction I: A system for small angle and intermediate angle X-ray diffraction using a reflection kratky camera

Small-angle x-ray scattering of distorted lamellar structures

Characterization of long-periodic layered structures by X-ray diffraction II: Lattice distortion of Langmuir-Blodgett films of lead stearate

XPS study of oriented organic molecules

Mesoscopic layered structure in conducting polymer thin film fabricated by potential-programmed electropolymerization

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