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Optical Modulator P/N Junction Mapping by Electron Holography and Scanning Capacitance Microscopy

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.1464-1465

2018

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2D Junction Profiling on Semiconductor Device Reliability Fail

Microscopy and microanalysis, 2017-07, Vol.23 (S1), p.1510-1511

2017

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Dysphagia lusoria--report of 2 cases and a review of the literature

South African journal of surgery, 2006-11, Vol.44 (4), p.140-142

2006

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Applications of a Novel FIB-SIMS Instrument in SIMS Image Depth Profiling

Microscopy and microanalysis, 2002-08, Vol.8 (S02), p.1212-1213

2002

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Quantitative two-dimensional carrier profiling of a 400 nm complementary metal–oxide–semiconductor device by Schottky scanning capacitance microscopy

Journal of applied physics, 2000-12, Vol.88 (11), p.6752-6757

2000

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High-resolution cross-sectional imaging of MOSFETs by scanning resistance microscopy

IEEE electron device letters, 1997-02, Vol.18 (2), p.71-73

1997

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Use of the focused ion beam to locate failure sites within electrically erasable read only memory microcircuits

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2004-05, Vol.22 (3), p.902-907

2004

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Evaluation of emitter profiles and lateral uniformity on crystalline silicon photovoltaic cells using scanning capacitance microscopy

2010 35th IEEE Photovoltaic Specialists Conference, 2010, p.001737-001741

2010

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Dysphagia lusoria - report of 2 cases and a review of the literature : case report

South African journal of surgery, 2006-11, Vol.44 (4), p.140-142

2006

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2D carrier profiles by SSRM and TCAD for root cause analysis of low Vt PFET

2017 17th International Workshop on Junction Technology (IWJT), 2017, p.31-33

2017

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Reported Reasons for Meat Avoidance

Outlook on agriculture, 1998-03, Vol.27 (1), p.41-45

1998

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2-D shallow junction mapping by dual lens electron holography

2017 17th International Workshop on Junction Technology (IWJT), 2017, p.34-37

2017

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Characterizing junction profiles in Ge photodetectors using scanning capacitance microscopy (SCM) and electron holography

2018 18th International Workshop on Junction Technology (IWJT), 2018, p.1-4

2018

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Junction profiling on hot carrier stressed device by dual lens electron holography and scanning capacitance microscopy

2018 18th International Workshop on Junction Technology (IWJT), 2018, p.1-4

2018

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Cross-sectional imaging of semiconductor device structures by scanning resistance microscopy

Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 1996-01, Vol.14 (1), p.386-389

1996

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Two-dimensional imaging of charge carrier profiles using local metal–semiconductor capacitance–voltage measurement

Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 1998-01, Vol.16 (1), p.457-462

1998

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Comment on "Masses of stable xenon isotopes: Check for internal consistency via ion cyclotron resonance mass spectrometry"

Physical review. C, Nuclear physics, 1994-08, Vol.50 (2), p.1249-1250

1994

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Dual Lens Electron Holography, Scanning Capacitance Microscopy (SCM), Scanning Spreading Resistance Microscopy (SSRM) Comparison for Semiconductor 2-D Junction Characterization

Microscopy today, 2021-05, Vol.29 (3), p.36-44

2021

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Sensitivity of indocyanine green (ICG) half-life changes relative to circulatory shock state

The Journal of surgical research, 1977-12, Vol.23 (6), p.400-404

1977

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Leakage issues in failure analysis of p+ SiGe active area short monitor

18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2011, p.1-4

2011

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2D carrier mapping in Si/sub 1-x/Ge/sub x/ source/drain regions of PMOSFETs used in a production device by scanning capacitance microscopy

Extended Abstracts of the Fifth International Workshop on Junction Technology, 2005, p.55-56

2005

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Hepatic blood flow measurement

Archives of surgery (Chicago. 1960), 1978-02, Vol.113 (2), p.169

1978

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Precise determination of the mass difference − 76 76 Se and a derived upper limit on the mass for the electron neutrino

Physical review letters, 1991-09, Vol.67 (13), p.1708-1711

1991

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Hepatic blood flow measurement III. Total hepatic blood flow measured by ICG clearance and electromagnetic flowmeters in a canine septic shock model

Annals of surgery, 1978-03, Vol.187 (3), p.299-302

1978

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Identifying biologically meaningful hot-weather events using threshold temperatures that affect life-history

PloS one, 2013-12, Vol.8 (12), p.e82492

2013

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Optical Modulator P/N Junction Mapping by Electron Holography and Scanning Capacitance Microscopy

2D Junction Profiling on Semiconductor Device Reliability Fail

Dysphagia lusoria--report of 2 cases and a review of the literature

Applications of a Novel FIB-SIMS Instrument in SIMS Image Depth Profiling

Quantitative two-dimensional carrier profiling of a 400 nm complementary metal–oxide–semiconductor device by Schottky scanning capacitance microscopy

High-resolution cross-sectional imaging of MOSFETs by scanning resistance microscopy

Use of the focused ion beam to locate failure sites within electrically erasable read only memory microcircuits

Evaluation of emitter profiles and lateral uniformity on crystalline silicon photovoltaic cells using scanning capacitance microscopy

Dysphagia lusoria - report of 2 cases and a review of the literature : case report

2D carrier profiles by SSRM and TCAD for root cause analysis of low Vt PFET

Reported Reasons for Meat Avoidance

2-D shallow junction mapping by dual lens electron holography

Characterizing junction profiles in Ge photodetectors using scanning capacitance microscopy (SCM) and electron holography

Junction profiling on hot carrier stressed device by dual lens electron holography and scanning capacitance microscopy

Cross-sectional imaging of semiconductor device structures by scanning resistance microscopy

Two-dimensional imaging of charge carrier profiles using local metal–semiconductor capacitance–voltage measurement

Comment on "Masses of stable xenon isotopes: Check for internal consistency via ion cyclotron resonance mass spectrometry"

Dual Lens Electron Holography, Scanning Capacitance Microscopy (SCM), Scanning Spreading Resistance Microscopy (SSRM) Comparison for Semiconductor 2-D Junction Characterization

Sensitivity of indocyanine green (ICG) half-life changes relative to circulatory shock state

Leakage issues in failure analysis of p+ SiGe active area short monitor

2D carrier mapping in Si/sub 1-x/Ge/sub x/ source/drain regions of PMOSFETs used in a production device by scanning capacitance microscopy

Hepatic blood flow measurement

Precise determination of the mass difference − 76 76 Se and a derived upper limit on the mass for the electron neutrino

Hepatic blood flow measurement III. Total hepatic blood flow measured by ICG clearance and electromagnetic flowmeters in a canine septic shock model

Identifying biologically meaningful hot-weather events using threshold temperatures that affect life-history

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