UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 91

Sortiert nach

Autonomous power supply for aeronautical health monitoring sensors

Journal of physics. Conference series, 2018-07, Vol.1052 (1), p.12031

2018

Link zum Volltext

Verfügbarkeit prüfen

Self-Powered energy harvester strain sensing device for structural health monitoring

Journal of physics. Conference series, 2016-11, Vol.773 (1), p.12070

2016

Link zum Volltext

Verfügbarkeit prüfen

Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation

Microelectronics and reliability, 2013-02, Vol.53 (2), p.221-228

2013

Link zum Volltext

Verfügbarkeit prüfen

Powering a Commercial Datalogger by Energy Harvesting from Generated Aeroacoustic Noise

Journal of physics. Conference series, 2014-01, Vol.557 (1), p.12025-5

2014

Link zum Volltext

Verfügbarkeit prüfen

Under Voltage Lock-Out Design Rules for Proper Start-Up of Energy Autonomous Systems Powered by Supercapacitors

Journal of physics. Conference series, 2013-12, Vol.476 (1), p.12121-5

2013

Link zum Volltext

Verfügbarkeit prüfen

SEB Characterization of Commercial Power MOSFETs With Backside Laser and Heavy Ions of Different Ranges

IEEE transactions on nuclear science, 2008-08, Vol.55 (4), p.2166-2173

2008

Link zum Volltext
IEEE_Xplore

Transient voltage overshoots of high voltage ESD protections based on bipolar transistors in smart power technology

2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2010, p.253-256

2010

Link zum Volltext
IEEE_Xplore

Prediction of LIN communication robustness against EFT events using dedicated failure models

Microelectronics and reliability, 2017-09, Vol.76-77, p.685-691

2017

Link zum Volltext

Verfügbarkeit prüfen

Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology

IEEE journal of solid-state circuits, 2001-09, Vol.36 (9), p.1373-1381

2001

Link zum Volltext
IEEE_Xplore

20GHz on-chip measurement of ESD waveform for system level analysis

Microelectronics and reliability, 2015-11, Vol.55 (11), p.2276-2283

2015

Link zum Volltext

Verfügbarkeit prüfen

Impact of non-linear capacitances on transient waveforms during system level ESD stress

Microelectronics and reliability, 2016-09, Vol.64, p.88-92

2016

Link zum Volltext

Verfügbarkeit prüfen

Optimization of a MOS–IGBT–SCR ESD protection component in smart power SOI technology

Microelectronics and reliability, 2015-08, Vol.55 (9-10), p.1476-1480

2015

Link zum Volltext

Verfügbarkeit prüfen

Sensitive Volume and Triggering Criteria of SEB in Classic Planar VDMOS

IEEE transactions on nuclear science, 2010-08, Vol.57 (4), p.1900-1907

2010

Link zum Volltext
IEEE_Xplore

Size Effect on Properties of Varistors Made From Zinc Oxide Nanoparticles Through Low Temperature Spark Plasma Sintering

Advanced functional materials, 2009-06, Vol.19 (11), p.1775-1783

2009

Link zum Volltext

Verfügbarkeit prüfen

A System-Level Electrostatic-Discharge-Protection Modeling Methodology for Time-Domain Analysis

IEEE transactions on electromagnetic compatibility, 2013-02, Vol.55 (1), p.45-57

2013

Link zum Volltext
IEEE_Xplore

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation

Microelectronics and reliability, 2001-09, Vol.41 (9), p.1539-1544

2001

Link zum Volltext

Verfügbarkeit prüfen

Comparative study of sensitive volume and triggering criteria of SEB in 600V planar and trench IGBTs

Microelectronics and reliability, 2011-09, Vol.51 (9-11), p.1990-1994

2011

Link zum Volltext

Verfügbarkeit prüfen

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization

Microelectronics and reliability, 2003-03, Vol.43 (3), p.439-444

2003

Link zum Volltext

Verfügbarkeit prüfen

TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology

Microelectronics and reliability, 2003, Vol.43 (1), p.71-79

2003

Link zum Volltext

Verfügbarkeit prüfen

Determination of the ESD Failure Cause Through its Signature

Microelectronics and reliability, 2003-09, Vol.43 (9), p.1551-1556

2003

Link zum Volltext

Verfügbarkeit prüfen

Efficient TCAD methodology for ESD failure current prediction of smart power ESD protection

Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005, 2005, p.115-118

2005

Link zum Volltext
IEEE_Xplore

Accurate prediction of the ESD robustness of semiconductor devices through physical simulation

2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual, 2005, p.106-111

2005

Link zum Volltext
IEEE_Xplore

Cosmic ray immunity of new IGBT structures for aerospace application

CAS 2011 Proceedings (2011 International Semiconductor Conference), 2011, Vol.2, p.305-308

2011

Link zum Volltext
IEEE_Xplore

The mirrored lateral SCR (MILSCR) as an ESD protection structure: design and optimization using 2-D device simulation

IEEE journal of solid-state circuits, 1999-09, Vol.34 (9), p.1283-1289

1999

Link zum Volltext
IEEE_Xplore

Reduction of the parasitic charge generation during silicon nitride deposition in a LOCOS isolation without field implant

Microelectronics and reliability, 2000-04, Vol.40 (4-5), p.593-596

2000

Link zum Volltext

Verfügbarkeit prüfen

1 – 25 von 91

Suche als RSS-Feed

Aktive Filter

ThemaApplied Sciences

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(36)
Mit Volltextzugriff
(77)

Publikationsform

Sprache

Englisch
(91)
Japanisch
(8)

Erscheinungsjahr

n.n

Thema

Science & Technology
(61)
Technology
(60)
Engineering
(53)
Engineering, Electrical & Electronic
(53)
Physics
(32)
Electrostatic Discharge
(30)
Physical Sciences
(30)
Physics, Applied
(24)
Stress
(18)
Voltage
(18)
Protection
(16)
Nanoscience & Nanotechnology
(15)
Science & Technology - Other Topics
(15)
Engineering Sciences
(13)
Cmos Technology
(12)
Robustness
(12)
Computer Science
(8)
Electrostatic Discharges
(8)
Micro And Nanotechnologies
(8)
Microelectronics
(8)

15 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Autonomous power supply for aeronautical health monitoring sensors

Self-Powered energy harvester strain sensing device for structural health monitoring

Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation

Powering a Commercial Datalogger by Energy Harvesting from Generated Aeroacoustic Noise

Under Voltage Lock-Out Design Rules for Proper Start-Up of Energy Autonomous Systems Powered by Supercapacitors

SEB Characterization of Commercial Power MOSFETs With Backside Laser and Heavy Ions of Different Ranges

Transient voltage overshoots of high voltage ESD protections based on bipolar transistors in smart power technology

Prediction of LIN communication robustness against EFT events using dedicated failure models

Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology

20GHz on-chip measurement of ESD waveform for system level analysis

Impact of non-linear capacitances on transient waveforms during system level ESD stress

Optimization of a MOS–IGBT–SCR ESD protection component in smart power SOI technology

Sensitive Volume and Triggering Criteria of SEB in Classic Planar VDMOS

Size Effect on Properties of Varistors Made From Zinc Oxide Nanoparticles Through Low Temperature Spark Plasma Sintering

A System-Level Electrostatic-Discharge-Protection Modeling Methodology for Time-Domain Analysis

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation

Comparative study of sensitive volume and triggering criteria of SEB in 600V planar and trench IGBTs

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization

TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology

Determination of the ESD Failure Cause Through its Signature

Efficient TCAD methodology for ESD failure current prediction of smart power ESD protection

Accurate prediction of the ESD robustness of semiconductor devices through physical simulation

Cosmic ray immunity of new IGBT structures for aerospace application

The mirrored lateral SCR (MILSCR) as an ESD protection structure: design and optimization using 2-D device simulation

Reduction of the parasitic charge generation during silicon nitride deposition in a LOCOS isolation without field implant

Aktive Filter

Suchergebnisse filtern