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Low-Frequency Noise and Deep Level Transient Spectroscopy in n-p-n Si Bipolar Junction Transistors Irradiated With Si Ions
IEEE transactions on nuclear science, 2024-04, Vol.71 (4), p.591-598
2024
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Equivalent Noise Charge Contribution of the √f Parallel Noise in Nuclear Spectroscopic Measurements Using Different Shaping Amplifiers
IEEE transactions on nuclear science, 2023-04, Vol.70 (4), p.1-1
2023
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Neutron-Gamma Noise Measurements in a Zero-Power Reactor Using Organic Scintillators
IEEE transactions on nuclear science, 2024-05, Vol.71 (5), p.1033-1040
2024
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Total-Ionizing-Dose Effects on Read Noise of MLC 3-D NAND Memories T
IEEE transactions on nuclear science, 2022-01, Vol.69 (3)
2022
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32k Channel Readout IC for Single Photon Counting Pixel Detectors with \ \mu\hbox Pitch, Dead Time of 85 ns, \ ^ - }\ \hbox Offset Spread and 2% rms Gain Spread
IEEE transactions on nuclear science, 2016-04, Vol.63 (2), p.1155-1161
2016
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1/f noise in proton-irradiated SiGe HBTs
IEEE transactions on nuclear science, 2001-12, Vol.48 (6), p.2244-2249
2001
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Noise Performance of 0.13 mum CMOS Technologies for Detector Front-End Applications
IEEE transactions on nuclear science, 2006-08, Vol.53 (4), p.2456-2462
2006
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Noise analysis of NPN SOI bipolar transistors for the design of charge measuring systems
IEEE transactions on nuclear science, 2004-06, Vol.51 (3), p.980-986
2004
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Performance of irradiated and nonirradiated 500-/spl mu/m-thick silicon microstrip detectors
IEEE transactions on nuclear science, 2001-08, Vol.48 (4), p.1016-1019
2001
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Flicker noise behavior of MOSFETs fabricated in 0.5 /spl mu/m fully depleted (FD) silicon-on-sapphire (SOS) CMOS in weak, moderate, and strong inversion
IEEE transactions on nuclear science, 2003-08, Vol.50 (4), p.963-968
2003
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Spectroscopic technique for optimal P-Z setting in /spl gamma/-ray detection
IEEE transactions on nuclear science, 2001-08, Vol.48 (4), p.1234-1238
2001
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Radiation studies of silicon-microstrip detectors for use in ATLAS and SCT
IEEE transactions on nuclear science, 2002-12, Vol.49 (6), p.2919-2922
2002
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The effects of proton irradiation on the RF performance of SiGe HBTs
IEEE transactions on nuclear science, 1999-12, Vol.46 (6), p.1716-1721
1999
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Low energy /spl gamma/-rays scintillation detection with large area avalanche photodiodes
IEEE transactions on nuclear science, 1999-08, Vol.46 (4), p.880-885
1999
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A data acquisition and processing system for 3D position sensitive CZT gamma-ray spectrometers
IEEE transactions on nuclear science, 1999-12, Vol.46 (6), p.1989-1994
1999
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Noise characterization of transistors in a 1.2 /spl mu/m CMOS-SOI technology up to a total-dose of 12 Mrad (Si)
IEEE transactions on nuclear science, 1994-12, Vol.41 (6), p.2310-2316
1994
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Precision of Shutdown Margin Measurements Using the Two-Frequency Reactor Noise Technique in an LMFBR
IEEE transactions on nuclear science, 1971, Vol.18 (1), p.430-434
1971
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Performance of flash ADCs in the 100 MHz range. II. Results from 8 bit devices
IEEE transactions on nuclear science, 1992-08, Vol.39 (4), p.780-783
1992
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A real time multi-server multi-client coherent database for a new high voltage system
IEEE transactions on nuclear science, 1995-08, Vol.42 (4), p.887-890
1995
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Silicon microstrip electronics operating with 20 ns FWHM signals
IEEE transactions on nuclear science, 1990-06, Vol.37 (3), p.1102-1115
1990
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Measuring PET scanner sensitivity: relating countrates to image signal-to-noise ratios using noise equivalents counts
IEEE transactions on nuclear science, 1990-04, Vol.37 (2), p.783-788
1990
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Antiproton Losses at Large Transverse Amplitudes in the CERN Antiproton Accumulator and Corrective Measures Using Skew Quadrupoles and Sextupoles
IEEE transactions on nuclear science, 1985-10, Vol.32 (5), p.2231-2233
1985
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A monolithic, 2 mu m CMOS constant-fraction discriminator for moderate time resolution systems
IEEE transactions on nuclear science, 1991-12, Vol.38 (6), p.1754-1759
1991
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1/|f| Noise in Physical Measurements
IEEE transactions on nuclear science, 1969-10, Vol.16 (5), p.17-35
1969
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Absolute Subcriticality Measurement without Calibration and Detection Efficiency Dependence by the 252Cf Source-Driven Noise Method
IEEE transactions on nuclear science, 1985, Vol.32 (1), p.1012-1015
1985
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