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Characterizing damage on Si wafer surfaces cut by slurry and diamond wire sawing

2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 2013, p.0945-0950

2013

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Online monitoring for Si solar cell manufacturing

2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 2013, p.0939-0944

2013

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Performance Limitations of mc-Si Solar Cells Caused by Defect Clusters

ECS transactions, 2009-03, Vol.18 (1), p.1049-1058

2009

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A new method for rapid measurement of orientations and sizes of grains in multicrystalline silicon wafers

2011 37th IEEE Photovoltaic Specialists Conference, 2011, p.001680-001685

2011

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Efficiency Limitations of Multicrystalline Silicon Solar Cells Due to Defect Clusters

MRS proceedings, 2005, Vol.864, Article E6.2

2005

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Understanding light-induced degradation of c-Si solar cells

2012 38th IEEE Photovoltaic Specialists Conference, 2012, p.001115-001120

2012

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Challenges to High-Volume Production of Fuel Cell Materials: Quality Control

ECS transactions, 2013-03, Vol.50 (2), p.919-926

2013

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Surface Damage Introduced by Diamond Wire Sawing of Si Wafers: Measuring in-depth and the Lateral Distributions for Different Cutting Parameters

MRS proceedings, 2015, Vol.1770 (1), p.61-66

2015

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Defects in Epitaxial lift-off Thin Si Films/Wafers and Their Influence on the Solar Cell Performance

MRS proceedings, 2014, Vol.1666 (1), p.109-114, Article mrss14-1666-a05-02

2014

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Some challenges in making accurate and reproducible measurements of minority carrier lifetime in high-quality Si wafers

2014 IEEE 40th Photovoltaic Specialist Conference (PVSC), 2014, p.0649-0654

2014

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A Comparison of Surface Passivation Techniques for Measurement of Minority Carrier Lifetime in Thin Si Wafers: Toward a Stable and Uniform Passivation

MRS proceedings, 2014, Vol.1670 (1), p.45-50, Article mrss14-1670-h05-02

2014

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Bulk defect generation during B-diffusion and oxidation of CZ wafers: Mechanism for degrading solar cell performance

2014 IEEE 40th Photovoltaic Specialist Conference (PVSC), 2014, p.0719-0723

2014

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Strength of Multicrystalline Silicon Wafers for Various Surface Conditions

MRS proceedings, 2009, Vol.1210 (1), Article 1210-Q05-07

2009

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The effect of gettering on areal inhomogeneities in large-area multicrystalline-silicon solar cells

Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997, 1997, p.155-158

1997

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Extension of PV Optics to include front metallization

2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 2013, p.0927-0932

2013

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Low-Temperature Diffusivity of Hydrogen in Different Silicon Substrates

MRS proceedings, 1995, Vol.378, p.359-364, Article 359

1995

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Computer Simulation of Edge Effects in a Small-Area Mesa N-P Junction Diode

MRS proceedings, 2008, Vol.1123 (1), Article 1123-P02-05

2008

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Influence of Dislocations on the I-V Characteristics of Silicon Solar Cells

MRS proceedings, 1995, Vol.378, p.749-756, Article 749

1995

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Light-Induced Passivation of Si by Iodine Ethanol Solution

MRS proceedings, 2009, Vol.1123 (1), Article 1123-P07-10

2009

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Using silicon injection phenomenon during fire-through contact formation to improve process control and performance of screen-printed multicrystalline-silicon solar cells

2010 35th IEEE Photovoltaic Specialists Conference, 2010, p.003614-003617

2010

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A New, Ultrafast Technique for Mapping Dislocation Density in Large-area, Single-crystal and Multicrystalline Si Wafers

MRS proceedings, 2009, Vol.1210 (1), Article 1210-Q01-02

2009

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Screen-Printed Al Back Contacts on Si Solar Cells: Issues and Some Solutions

MRS proceedings, 2009, Vol.1210 (1), Article 1210-Q05-02

2009

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A high throughput, noncontact system for screening silicon wafers predisposed to breakage during solar cell production

2011 37th IEEE Photovoltaic Specialists Conference, 2011, p.001134-001139

2011

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Defect mapping and stress mapping of crystalline silicon using Spectroscopic Ellipsometry

2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 2013, p.0212-0217

2013

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A high-quality cross-sectioning method: Examples of applications in optimizing solar cell contact firing

2011 37th IEEE Photovoltaic Specialists Conference, 2011, p.001674-001679

2011

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Characterizing damage on Si wafer surfaces cut by slurry and diamond wire sawing

Online monitoring for Si solar cell manufacturing

Performance Limitations of mc-Si Solar Cells Caused by Defect Clusters

A new method for rapid measurement of orientations and sizes of grains in multicrystalline silicon wafers

Efficiency Limitations of Multicrystalline Silicon Solar Cells Due to Defect Clusters

Understanding light-induced degradation of c-Si solar cells

Challenges to High-Volume Production of Fuel Cell Materials: Quality Control

Surface Damage Introduced by Diamond Wire Sawing of Si Wafers: Measuring in-depth and the Lateral Distributions for Different Cutting Parameters

Defects in Epitaxial lift-off Thin Si Films/Wafers and Their Influence on the Solar Cell Performance

Some challenges in making accurate and reproducible measurements of minority carrier lifetime in high-quality Si wafers

A Comparison of Surface Passivation Techniques for Measurement of Minority Carrier Lifetime in Thin Si Wafers: Toward a Stable and Uniform Passivation

Bulk defect generation during B-diffusion and oxidation of CZ wafers: Mechanism for degrading solar cell performance

Strength of Multicrystalline Silicon Wafers for Various Surface Conditions

The effect of gettering on areal inhomogeneities in large-area multicrystalline-silicon solar cells

Extension of PV Optics to include front metallization

Low-Temperature Diffusivity of Hydrogen in Different Silicon Substrates

Computer Simulation of Edge Effects in a Small-Area Mesa N-P Junction Diode

Influence of Dislocations on the I-V Characteristics of Silicon Solar Cells

Light-Induced Passivation of Si by Iodine Ethanol Solution

Using silicon injection phenomenon during fire-through contact formation to improve process control and performance of screen-printed multicrystalline-silicon solar cells

A New, Ultrafast Technique for Mapping Dislocation Density in Large-area, Single-crystal and Multicrystalline Si Wafers

Screen-Printed Al Back Contacts on Si Solar Cells: Issues and Some Solutions

A high throughput, noncontact system for screening silicon wafers predisposed to breakage during solar cell production

Defect mapping and stress mapping of crystalline silicon using Spectroscopic Ellipsometry

A high-quality cross-sectioning method: Examples of applications in optimizing solar cell contact firing

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