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STDP Based Online Learning for a Current-Controlled Memristive Synapse
2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS), 2022, p.1-4
2022
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ReliaVision: In-circuit transistor reliability investigation using XML-based technology reliability information in PDKs
2021 IEEE International Integrated Reliability Workshop (IIRW), 2021, p.1-4
2021
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Machine Learning in Nanometer AMS Design-for-Reliability : (Invited Paper)
2021 IEEE 14th International Conference on ASIC (ASICON), 2021, p.1-4
2021
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A 20-Gb/s/pin 0.0024-mm2 Single-Ended DECS TRX with CDR-less Self-Slicing/Auto-Deserialization to Improve Tolerance on Duty Cycle Error and RX Supply Noise for DCC/CDR-less Short-Reach Memory Interfaces
2022 IEEE International Solid- State Circuits Conference (ISSCC), 2022, Vol.65, p.1-3
2022
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Aadam: a fast, accurate, and versatile aging-aware cell library delay model using feed-forward neural network
2020 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 2020, p.1-9
2020
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Detection of Stuck-at and Bridging Fault in Reversible Circuits using an Augmented Circuit
2021 IEEE 30th Asian Test Symposium (ATS), 2021, p.55-60
2021
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Integrating Distributed Devices onto Rural Circuits
2022 IEEE Rural Electric Power Conference (REPC), 2022, p.18-24
2022
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A Read Circuit Design for Multi-Level RRAM Cells Exhibiting Small Resistance Windows
2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS), 2022, p.1-2
2022
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Q&R On-Chip (QROC): A Unified, Oven-less and Scalable Circuit Reliability Platform
2022 IEEE International Reliability Physics Symposium (IRPS), 2022, p.1-6
2022
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The Impact of Logic Gates Susceptibility in Overall Circuit Reliability Analysis
2022 IEEE International Symposium on Circuits and Systems (ISCAS), 2022, p.1610-1614
2022
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Status and trends in Nanoelectronic devices for the ultimate integration of ICs
2021 IEEE 14th International Conference on ASIC (ASICON), 2021, p.1-4
2021
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Pitch Device Design in 10nm-Class DRAM Process through DTCO
2021 IEEE 14th International Conference on ASIC (ASICON), 2021, p.1-4
2021
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A Design of Reliable Linear FSMs with Equivalent States in Stochastic Computing
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021, p.1-6
2021
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Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection
2021 IEEE International Reliability Physics Symposium (IRPS), 2021, p.1-4
2021
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Investigation of 0.18μm CMOS Sensitivity to BTI and HCI Mechanisms under Extreme Thermal Stress Conditions
2021 IEEE 30th Asian Test Symposium (ATS), 2021, p.97-102
2021
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A Deeper Understanding of Well Charging Reliability with Circuit Relevant Test Structures
2022 IEEE International Reliability Physics Symposium (IRPS), 2022, p.P45-1-P45-4
2022
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Characterization and Classification of Heavy Ion Induced Failures in FPGA-based Logical Circuits
2021 IEEE 14th International Conference on ASIC (ASICON), 2021, p.1-4
2021
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Novel Electrical Detection Method for Random Defects on Peripheral Circuits in NAND Flash Memory
2022 IEEE International Reliability Physics Symposium (IRPS), 2022, p.P40-1-P40-4
2022
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Reliability challenges of real-time systems in forthcoming technology nodes
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013, p.129-134
2013
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Estimation of Time to Failure Distribution in SRAM Due to Trapped Oxide Charges
2021 IEEE International Symposium on Circuits and Systems (ISCAS), 2021, p.1-5
2021
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Circuit Reliability Analysis of In-Memory Inference in Binarized Neural Networks
2020 IEEE International Integrated Reliability Workshop (IIRW), 2020, p.1-5
2020
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High Voltage Tolerant Design with Advanced Process for TV Application
2019 IEEE International Reliability Physics Symposium (IRPS), 2019, p.1-4
2019
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Allocating Gate Reliability for Circuit Reliability Optimization
2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS), 2019, p.327-330
2019
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A Triple-Point Model for Circuit-Level Reliability Analysis
2018 IEEE International Symposium on Circuits and Systems (ISCAS), 2018, p.1-4
2018
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Invited: Optimizing device reliability effects at the intersection of physics, circuits, and architecture
2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC), 2016, p.1-6
2016
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