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Reliability-Enhanced Hybrid CMOS/MTJ Logic Circuit Architecture

IEEE transactions on magnetics, 2017-11, Vol.53 (11), p.1-5

2017

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IEEE_Xplore

STDP Based Online Learning for a Current-Controlled Memristive Synapse

2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS), 2022, p.1-4

2022

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IEEE_Xplore

Reliability-Enhanced Separated Pre-Charge Sensing Amplifier for Hybrid CMOS/MTJ Logic Circuits

IEEE transactions on magnetics, 2017-09, Vol.53 (9), p.1-5

2017

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IEEE_Xplore

ReliaVision: In-circuit transistor reliability investigation using XML-based technology reliability information in PDKs

2021 IEEE International Integrated Reliability Workshop (IIRW), 2021, p.1-4

2021

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IEEE_Xplore

Machine Learning in Nanometer AMS Design-for-Reliability : (Invited Paper)

2021 IEEE 14th International Conference on ASIC (ASICON), 2021, p.1-4

2021

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A 20-Gb/s/pin 0.0024-mm2 Single-Ended DECS TRX with CDR-less Self-Slicing/Auto-Deserialization to Improve Tolerance on Duty Cycle Error and RX Supply Noise for DCC/CDR-less Short-Reach Memory Interfaces

2022 IEEE International Solid- State Circuits Conference (ISSCC), 2022, Vol.65, p.1-3

2022

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IEEE_Xplore

Detection of Stuck-at and Bridging Fault in Reversible Circuits using an Augmented Circuit

2021 IEEE 30th Asian Test Symposium (ATS), 2021, p.55-60

2021

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IEEE_Xplore

Integrating Distributed Devices onto Rural Circuits

2022 IEEE Rural Electric Power Conference (REPC), 2022, p.18-24

2022

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IEEE_Xplore

Q&R On-Chip (QROC): A Unified, Oven-less and Scalable Circuit Reliability Platform

2022 IEEE International Reliability Physics Symposium (IRPS), 2022, p.1-6

2022

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IEEE_Xplore

Aadam: a fast, accurate, and versatile aging-aware cell library delay model using feed-forward neural network

2020 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 2020, p.1-9

2020

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IEEE_Xplore

A Read Circuit Design for Multi-Level RRAM Cells Exhibiting Small Resistance Windows

2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS), 2022, p.1-2

2022

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IEEE_Xplore

The Impact of Logic Gates Susceptibility in Overall Circuit Reliability Analysis

2022 IEEE International Symposium on Circuits and Systems (ISCAS), 2022, p.1610-1614

2022

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IEEE_Xplore

Status and trends in Nanoelectronic devices for the ultimate integration of ICs

2021 IEEE 14th International Conference on ASIC (ASICON), 2021, p.1-4

Balestra, Francis

2021

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Pitch Device Design in 10nm-Class DRAM Process through DTCO

2021 IEEE 14th International Conference on ASIC (ASICON), 2021, p.1-4

2021

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A Design of Reliable Linear FSMs with Equivalent States in Stochastic Computing

2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021, p.1-6

2021

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IEEE_Xplore

ESD: Failure Mechanisms and Models

Voldman, Steven H

1. Aufl., 2009

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Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection

2021 IEEE International Reliability Physics Symposium (IRPS), 2021, p.1-4

2021

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IEEE_Xplore

Investigation of 0.18μm CMOS Sensitivity to BTI and HCI Mechanisms under Extreme Thermal Stress Conditions

2021 IEEE 30th Asian Test Symposium (ATS), 2021, p.97-102

2021

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IEEE_Xplore

A Deeper Understanding of Well Charging Reliability with Circuit Relevant Test Structures

2022 IEEE International Reliability Physics Symposium (IRPS), 2022, p.P45-1-P45-4

2022

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IEEE_Xplore

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities

2022 IEEE International Reliability Physics Symposium (IRPS), 2022, p.6B.3-1-6B.3-6

2022

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IEEE_Xplore

Characterization and Classification of Heavy Ion Induced Failures in FPGA-based Logical Circuits

2021 IEEE 14th International Conference on ASIC (ASICON), 2021, p.1-4

2021

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Novel Electrical Detection Method for Random Defects on Peripheral Circuits in NAND Flash Memory

2022 IEEE International Reliability Physics Symposium (IRPS), 2022, p.P40-1-P40-4

2022

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IEEE_Xplore

Reliability challenges of real-time systems in forthcoming technology nodes

2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013, p.129-134

2013

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IEEE_Xplore

Estimation of Time to Failure Distribution in SRAM Due to Trapped Oxide Charges

2021 IEEE International Symposium on Circuits and Systems (ISCAS), 2021, p.1-5

2021

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IEEE_Xplore

Circuit Reliability Analysis of In-Memory Inference in Binarized Neural Networks

2020 IEEE International Integrated Reliability Workshop (IIRW), 2020, p.1-5

2020

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IEEE_Xplore

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Reliability-Enhanced Hybrid CMOS/MTJ Logic Circuit Architecture

STDP Based Online Learning for a Current-Controlled Memristive Synapse

Reliability-Enhanced Separated Pre-Charge Sensing Amplifier for Hybrid CMOS/MTJ Logic Circuits

ReliaVision: In-circuit transistor reliability investigation using XML-based technology reliability information in PDKs

Machine Learning in Nanometer AMS Design-for-Reliability : (Invited Paper)

A 20-Gb/s/pin 0.0024-mm2 Single-Ended DECS TRX with CDR-less Self-Slicing/Auto-Deserialization to Improve Tolerance on Duty Cycle Error and RX Supply Noise for DCC/CDR-less Short-Reach Memory Interfaces

Detection of Stuck-at and Bridging Fault in Reversible Circuits using an Augmented Circuit

Integrating Distributed Devices onto Rural Circuits

Q&R On-Chip (QROC): A Unified, Oven-less and Scalable Circuit Reliability Platform

Aadam: a fast, accurate, and versatile aging-aware cell library delay model using feed-forward neural network

A Read Circuit Design for Multi-Level RRAM Cells Exhibiting Small Resistance Windows

The Impact of Logic Gates Susceptibility in Overall Circuit Reliability Analysis

Status and trends in Nanoelectronic devices for the ultimate integration of ICs

Pitch Device Design in 10nm-Class DRAM Process through DTCO

A Design of Reliable Linear FSMs with Equivalent States in Stochastic Computing

ESD: Failure Mechanisms and Models

Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection

Investigation of 0.18μm CMOS Sensitivity to BTI and HCI Mechanisms under Extreme Thermal Stress Conditions

A Deeper Understanding of Well Charging Reliability with Circuit Relevant Test Structures

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities

Characterization and Classification of Heavy Ion Induced Failures in FPGA-based Logical Circuits

Novel Electrical Detection Method for Random Defects on Peripheral Circuits in NAND Flash Memory

Reliability challenges of real-time systems in forthcoming technology nodes

Estimation of Time to Failure Distribution in SRAM Due to Trapped Oxide Charges

Circuit Reliability Analysis of In-Memory Inference in Binarized Neural Networks

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