Sortiert nach
Journal of microelectromechanical systems, 2008, Vol.17 (2), p.328-333
2008
- Link zum Volltext
Aktive Filter
Suchergebnisse filtern
Filter anzeigenNur zeigen
Publikationsform
Sprache
Erscheinungsjahr
n.n
n.n
Thema
- Afm
- Atomic Force Microscopy
- Atomic Measurements
- Design Engineering
- Engineering
- Engineering, Electrical & Electronic
- Exact Sciences And Technology
- Force Measurement
- Force Measurements
- Force Sensors
- Fysik
- High Sensitivity
- In Situ Transmission Electron Microscope
- Instruments & Instrumentation
- Mechanical Engineering. Machine Design
- Mechanical Instruments, Equipment And Techniques
- Mechanical Sensors
- Mems
- Mems Atomic Force Microscope Sensor
Kollektion
Zeitschrift / Serie