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The Effect of Annealing on Argon Implanted Edge Terminations for 4H-SiC Schottky Diodes

MRS proceedings, 1999, Vol.572, Article 129

1999

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The EU, Irish Defence Forces and Contemporary Security

1, 2023

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Measurement of the residual macro and microstrain in strained Si/SiGe using Raman spectroscopy

MRS proceedings, 2004, Vol.809, Article B3.4

2004

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Optimisation of channel thickness in strained Si/SiGe MOSFETs

ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003, 2003, p.501-504

2003

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A novel sensor for the direct measurement of process induced residual stress in interconnects

ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003, 2003, p.115-118

2003

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Oxidation Modelling for SiC

MRS proceedings, 1999, Vol.572, Article 135

1999

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Noise performance in strained Si heterojunction bipolar transistors

2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC), 2011, p.271-274

2011

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High Speed Deep Sub-Micron MOSFET using High Mobility Strained Silicon Channel

ESSDERC '95: Proceedings of the 25th European Solid State Device Research Conference, 1995, p.109-112

1995

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Simple Computer Modeling of the Grain Microstructure of Al-4wt%Cu Interconnection Lines

MRS proceedings, 1997, Vol.472, Article 191

1997

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Analysis of Electromigration Lifetime Measurements using Microscopic Polycrystalline Computer Simulation

ESSDERC '94: 24th European Solid State Device Research Conference, 1994, p.613-616

1994

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Demonstration of a Sub-micron Damascene Cu/Low-k Mechanical Sensor to Monitor Stress in BEOL Metallization

2009 IEEE International Conference on Microelectronic Test Structures, 2009, p.31-35

2009

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Improved analog performance of strained Si n-MOSFETs on thin SiGe strained relaxed buffers

ESSDERC 2008 - 38th European Solid-State Device Research Conference, 2008, p.99-102

2008

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Influence of barriers on the reliability of dual damascene copper contacts

2008 IEEE International Reliability Physics Symposium, 2008, p.677-678

2008

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Temperature non-uniformities in a silicon test square during rapid thermal processing

ESSDERC '90: 20th European Solid State Device Research Conference, 1990, p.69-72

1990

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Analysis of Gate Leakage in Strained Si MOSFETs

ECS transactions, 2006, Vol.3 (7), p.1001-1012

2006

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Constitutionalism in the Approach and Aftermath of the Civil War

1, 2013

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Test chip for the development and evaluation of test structures for measuring stress in metal interconnect

Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516), 2004, p.69-73

2004

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Performance limits of deep submicron buried channel delta doped MOSFETs

27th European Solid-State Device Research Conference, 1997, p.644-647

1997

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Health and Welfare of Brachycephalic (Flat-faced) Companion Animals: A Complete Guide for Veterinary and Animal Professionals

1st, 2021

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Peacekeeping in the Digital Age: Future Threats and Capability Requirements

The EU, Irish Defence Forces and Contemporary Security, 2023, p.229-249

2023

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The Irish Defence Forces in the Drone Age

The EU, Irish Defence Forces and Contemporary Security, 2023, p.295-314

2023

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Ireland, NATO and “the Return of Geopolitics” in Europe

The EU, Irish Defence Forces and Contemporary Security, 2023, p.373-392

2023

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Generating More Heat Than Light? The Debate Over Ireland’s Neutrality and the “European Army”

The EU, Irish Defence Forces and Contemporary Security, 2023, p.411-427

2023

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Irish Military Neutrality: A Historical Perspective for Modern Consideration

The EU, Irish Defence Forces and Contemporary Security, 2023, p.393-409

2023

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Small Navies: Lessons for the Irish Naval Service

The EU, Irish Defence Forces and Contemporary Security, 2023, p.87-105

2023

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The Effect of Annealing on Argon Implanted Edge Terminations for 4H-SiC Schottky Diodes

The EU, Irish Defence Forces and Contemporary Security

Measurement of the residual macro and microstrain in strained Si/SiGe using Raman spectroscopy

Optimisation of channel thickness in strained Si/SiGe MOSFETs

A novel sensor for the direct measurement of process induced residual stress in interconnects

Oxidation Modelling for SiC

Noise performance in strained Si heterojunction bipolar transistors

High Speed Deep Sub-Micron MOSFET using High Mobility Strained Silicon Channel

Simple Computer Modeling of the Grain Microstructure of Al-4wt%Cu Interconnection Lines

Analysis of Electromigration Lifetime Measurements using Microscopic Polycrystalline Computer Simulation

Demonstration of a Sub-micron Damascene Cu/Low-k Mechanical Sensor to Monitor Stress in BEOL Metallization

Improved analog performance of strained Si n-MOSFETs on thin SiGe strained relaxed buffers

Influence of barriers on the reliability of dual damascene copper contacts

Temperature non-uniformities in a silicon test square during rapid thermal processing

Analysis of Gate Leakage in Strained Si MOSFETs

Constitutionalism in the Approach and Aftermath of the Civil War

Test chip for the development and evaluation of test structures for measuring stress in metal interconnect

Performance limits of deep submicron buried channel delta doped MOSFETs

Health and Welfare of Brachycephalic (Flat-faced) Companion Animals: A Complete Guide for Veterinary and Animal Professionals

Peacekeeping in the Digital Age: Future Threats and Capability Requirements

The Irish Defence Forces in the Drone Age

Ireland, NATO and “the Return of Geopolitics” in Europe

Generating More Heat Than Light? The Debate Over Ireland’s Neutrality and the “European Army”

Irish Military Neutrality: A Historical Perspective for Modern Consideration

Small Navies: Lessons for the Irish Naval Service

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