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1st edition., 2018
Link zum Volltext
Journal of physics. Conference series, 2011, Vol.302 (1), p.12051-6
2011
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2020 IEEE International Reliability Physics Symposium (IRPS), 2020, p.1-4
2020
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2023 IEEE SENSORS, 2023, p.1-4
2023
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IEEE transactions on applied superconductivity, 2013, Vol.23 (3)
2013
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OCEANS 2014 - TAIPEI, 2014, p.1-6
2014
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IOP conference series. Earth and environmental science, 2012, Vol.15 (3), p.32044
2012
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023, p.1-2
- Chiang, H.-L.
- Hadi, R. A.
- Wang, J.-F.
- Han, H.-C.
- Wu, J.-J.
- Hsieh, H.-H.
- Horng, J.-J.
- Chou, W.-S.
- Lien, B.-S.
- Chang, C.-H.
- Chen, Y.-C.
- Wang, Y.-H.
- Chen, T.-C.
- Liu, J.-C.
- Liu, Y.-C.
- Chiang, M.-H.
- Kao, K.-H.
- Pulicherla, B.
- Cai, J.
- Chang, C.-S.
- Su, K.-W.
- Cheng, K.-L.
- Yeh, T.-J.
- Peng, Y.-C.
- Enz, C.
- Chang, M.-C. F.
- Chang, M.-F.
- Wong, H.-S. P.
- Radu, I. P.
2023
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2022 IEEE International Ultrasonics Symposium (IUS), 2022, p.1-4
2022
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2023 International Electron Devices Meeting (IEDM), 2023, p.1-4
- Liao, S.
- Yang, L.
- Chiu, T.K.
- You, W.X.
- Wu, T.Y.
- Yang, K.F.
- Woon, W.Y.
- Ho, W.D.
- Lin, Z.C.
- Hung, H.Y.
- Huang, J.C.
- Huang, S.T.
- Tsai, M.C.
- Yu, C.L.
- Chen, S.H.
- Hu, K.K.
- Shih, C.C.
- Chen, Y.T.
- Liu, C.Y.
- Lin, H.Y.
- Chung, C.T.
- Su, L.
- Chou, C.Y.
- Shen, Y.T.
- Chang, C.M.
- Lin, Y.T.
- Lin, M.Y.
- Lin, W.C.
- Chen, B.H.
- Hou, C.S.
- Lai, F.
- Chen, X.
- Wu, J.
- Lin, C.K.
- Cheng, Y.K.
- Lin, H.T.
- Ku, Y.C.
- Lin, S.S.
- Lu, L.C.
- Jang, S.M.
- Cao, M.
2023
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2012 Symposium on VLSI Technology (VLSIT), 2012, p.129-130
- Huiling Shang
- Jain, S.
- Josse, E.
- Alptekin, E.
- Nam, M. H.
- Kim, S. W.
- Cho, K. H.
- Kim, I.
- Liu, Y.
- Yang, X.
- Wu, X.
- Ciavatti, J.
- Kim, N. S.
- Vega, R.
- Kang, L.
- Meer, H. V.
- Samavedam, S.
- Celik, M.
- Soss, S.
- Utomo, H.
- Ramachandran, R.
- Lai, W.
- Sardesai, V.
- Tran, C.
- Kim, J. Y.
- Park, Y. H.
- Tan, W. L.
- Shimizu, T.
- Joy, R.
- Strane, J.
- Tabakman, K.
- Lalanne, F.
- Montanini, P.
- Babich, K.
- Kim, J. B.
- Economikos, L.
- Cote, W.
- Reddy, C.
- Belyansky, M.
- Arndt, R.
- Kwon, U.
- Wong, K.
- Koli, D.
- Levedakis, D.
- Lee, J. W.
- Muncy, J.
- Krishnan, S.
- Schepis, D.
- Chen, X.
- Kim, B. D.
- Tian, C.
- Linder, B. P.
- Cartier, E.
- Narayanan, V.
- Northrop, G.
- Menut, O.
- Meiring, J.
- Thomas, A.
- Aminpur, M.
- Park, S. H.
- Lee, K. Y.
- Kim, B. Y.
- Rhee, S. H.
- Hamieh, B.
- Srivastava, R.
- Koshy, R.
- Goldberg, C.
- Pallachalil, M.
- Chae, M.
- Ogino, A.
- Watanabe, T.
- Oh, M.
- Mallela, H.
- Codi, D.
- Malinge, P.
- Weybright, M.
- Mann, R.
- Mittal, A.
- Eller, M.
- Lian, S.
- Li, Y.
- Divakaruni, R.
- Bukofsky, S.
- Kim, J. D.
- Sudijono, J.
- Neumueller, W.
- Matsuoka, F.
- Sampson, R.
2012
- Link zum Volltext
2009 IEEE International Electron Devices Meeting (IEDM), 2009, p.1-4
2009
- Link zum Volltext
AIP conference proceedings, 2011, Vol.1409 (1)
2011
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2018 IEEE Symposium on VLSI Technology, 2018, p.183-184
- Lee, K.
- Yamane, K.
- Noh, S.
- Naik, V. B.
- Yang, H.
- Jang, S. H.
- Kwon, J.
- Behin-Aein, B.
- Chao, R.
- Lim, J. H.
- S. K.
- Gan, K. W.
- Zeng, D.
- Thiyagarajah, N.
- Goh, L. C.
- Liu, B.
- Toh, E. H.
- Jung, B.
- Wee, T. L.
- Ling, T.
- Chan, T. H.
- Chung, N. L.
- Ting, J. W.
- Lakshmipathi, S.
- Son, J. S.
- Hwang, J.
- Zhang, L.
- Low, R.
- Krishnan, R.
- Kitamura, T.
- You, Y. S.
- Seet, C. S.
- Cong, H.
- Shum, D.
- Wong, J.
- Woo, S. T.
- Lam, J.
- Quek, E.
- See, A.
- Siah, S. Y.
2018
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2013 IEEE International Reliability Physics Symposium (IRPS), 2013, p.4C.3.1-4C.3.5
2013
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2010 35th IEEE Photovoltaic Specialists Conference, 2010, p.002563-002568
2010
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2013 IEEE 5th International Nanoelectronics Conference (INEC), 2013, p.89-90
2013
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Lecture notes in computer science, 2004, p.199-206
2004
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2022 International Electron Devices Meeting (IEDM), 2022, p.18.4.1-18.4.4
2022
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AIP conference proceedings, 2007, Vol.879 (1), p.883-886
2007
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2018 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), 2018, p.829-833
2018
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