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Cost-Utility Analysis of Denosumab Versus Alendronate For Postmenopausal Osteoporosis In South Korea
2018
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2024 IEEE International Reliability Physics Symposium (IRPS), 2024, p.P69.TX-1-P69.TX-4
2024
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2015 Winter Simulation Conference (WSC), 2015, p.2249-2259
2015
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2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers, 2014, p.1-2
- Seo, K.-I
- Haran, B.
- Gupta, D.
- Guo, D.
- Standaert, T.
- Xie, R.
- Shang, H.
- Alptekin, E.
- Bae, D.-I
- Bae, G.
- Boye, C.
- Cai, H.
- Chanemougame, D.
- Chao, R.
- Cheng, K.
- Cho, J.
- Choi, K.
- Hamieh, B.
- Hong, J. G.
- Hook, T.
- Jang, L.
- Jung, J.
- Jung, R.
- Lee, D.
- Lherron, B.
- Kambhampati, R.
- Kim, B.
- Kim, H.
- Kim, K.
- Kim, T. S.
- Ko, S.-B
- Lie, F. L.
- Liu, D.
- Mallela, H.
- Mclellan, E.
- Mehta, S.
- Montanini, P.
- Mottura, M.
- Nam, J.
- Nam, S.
- Nelson, F.
- Ok, I.
- Park, C.
- Park, Y.
- Paul, A.
- Prindle, C.
- Ramachandran, R.
- Sankarapandian, M.
- Sardesai, V.
- Scholze, A.
- Seo, S.-C
- Shearer, J.
- Southwick, R.
- Sreenivasan, R.
- Stieg, S.
- Strane, J.
- Sun, X.
- Sung, M. G.
- Surisetty, C.
- Tsutsui, G.
- Tripathi, N.
- Vega, R.
- Waskiewicz, C.
- Weybright, M.
- Yeh, C.-C
- Bu, H.
- Burns, S.
- Canaperi, D.
- Celik, M.
- Colburn, M.
- Jagannathan, H.
- Kanakasabaphthy, S.
- Kleemeier, W.
- Liebmann, L.
- Mcherron, D.
- Oldiges, P.
- Paruchuri, V.
- Spooner, T.
- Stathis, J.
- Divakaruni, R.
- Gow, T.
- Iacoponi, J.
- Jenq, J.
- Sampson, R.
- Khare, M.
2014
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2017 Winter Simulation Conference (WSC), 2017, p.4058-4069
2017
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2016 Winter Simulation Conference (WSC), 2016, p.2855-2866
2016
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The Journal of immunology (1950), 2018, Vol.200 (1_Supplement), p.42-42.16
2018
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Journal of physics. Conference series, 2008, Vol.100 (1), p.012018
2008
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2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), 2017, p.564-567
2017
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2017 16th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2017, p.466-472
2017
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2023 IEEE International Reliability Physics Symposium (IRPS), 2023, p.1-7
2023
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1998 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, ISSCC. First Edition (Cat. No.98CH36156), 1998, p.356-357
1998
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Materials science forum, 2009, Vol.618-619, p.463-466
2009
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Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004, 2004, p.240-241
2004
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2015 IEEE Magnetics Conference (INTERMAG), 2015, p.1-1
2015
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13th IEEE International Symposium on Modeling, Analysis, and Simulation of Computer and Telecommunication Systems, 2005, p.389-396
2005
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Proceedings of the 39th IEEE Conference on Decision and Control (Cat. No.00CH37187), 2000, Vol.4, p.4012-4017 vol.4
2000
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2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers, 2006, p.104-105
2006
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2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual, 2005, p.257-259
2005
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2013 IEEE International Conference on Mechatronics and Automation, 2013, p.1399-1404
2013
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2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 2014, p.1-4
- Guo, D.
- Shang, H.
- Seo, K.
- Haran, B.
- Standaert, T.
- Gupta, D.
- Alptekin, E.
- Bae, D.
- Bae, G.
- Chanemougame, D.
- Cheng, K.
- Cho, J.
- Hamieh, B.
- Hong, J.
- Hook, T.
- Jung, J.
- Kambhampati, R.
- Kim, B.
- Kim, H.
- Kim, K.
- Kim, T.
- Liu, D.
- Mallela, H.
- Montanini, P.
- Mottura, M.
- Nam, S.
- Ok, I.
- Park, Y.
- Paul, A.
- Prindle, C.
- Ramachandran, R.
- Sardesai, V.
- Scholze, A.
- Seo, S.
- Southwick, R.
- Strane, J.
- Sun, X.
- Tsutsui, G.
- Tripathi, N.
- Vega, R.
- Weybright, M.
- Xie, R.
- Yeh, C.
- Bu, H.
- Burns, S.
- Canaperi, D.
- Celik, M.
- Colburn, M.
- Jagannathan, H.
- Kanakasabaphthy, S.
- Kleemeier, W.
- Liebmann, L.
- Mcherron, D.
- Oldiges, P.
- Paruchuri, V.
- Spooner, T.
- Stathis, J.
- Divakaruni, R.
- Gow, T.
- Iacoponi, J.
- Jenq, J.
- Sampson, R.
- Yang, W.
- Khare, M.
2014
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