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2022 IEEE International Interconnect Technology Conference (IITC), 2022, p.55-57
2022
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2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016, p.40-42
2016
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2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016, p.89-91
2016
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2004 IEEE International Reliability Physics Symposium. Proceedings, 2004, p.61-67
- Filippi, R.G.
- McGrath, J.F.
- Shaw, T.M.
- Murray, C.E.
- Rathore, H.S.
- McLaughlin, P.S.
- McGahay, V.
- Nicholson, L.
- Wang, P.-C.
- Lloyd, J.R.
- Lane, M.
- Rosenberg, R.
- Liu, X.
- Wang, Y.-Y.
- Landers, W.
- Spooner, T.
- Demarest, J.J.
- Engel, B.H.
- Gill, J.
- Goth, G.
- Barth, E.
- Biery, G.
- Davis, C.R.
- Wachnik, R.A.
- Goldblatt, R.
- Ivers, T.
- Swinton, A.
- Barile, C.
- Aitken, J.
2004
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2010 IEEE International Interconnect Technology Conference, 2010, p.1-3
- Nogami, T
- Maniscalco, J
- Madan, A
- Flaitz, P
- DeHaven, P
- Parks, C
- Tai, L
- Lawrence, B St
- Davis, R
- Murphy, R
- Shaw, T
- Cohen, S
- Hu, C.-K
- Cabral, C
- Chiang, S
- Kelly, J
- Zaitz, M
- Schmatz, J
- Choi, S
- Tsumura, K
- Penny, C
- Chen, H.-C
- Canaperi, D
- Vo, T
- Ito, F
- Straten, O
- Simon, A
- Rhee, S.-H
- Kim, B.-Y
- Bolom, T
- Ryan, V
- Ma, P
- Ren, J
- Aubuchon, J
- Fine, J
- Kozlowski, P
- Spooner, T
- Edelstein, D
2010
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2010 International Electron Devices Meeting, 2010, p.33.5.1-33.5.4
- Nogami, T
- Bolom, T
- Simon, A
- Kim, B
- Hu, C
- Tsumura, K
- Madan, A
- Baumann, F
- Wang, Y
- Flaitz, P
- Parks, C
- DeHaven, P
- Davis, R
- Zaitz, M
- Lawrence, B S
- Murphy, R
- Tai, L
- Molis, S
- Rhee, S
- Usui, T
- Cabral, C
- Maniscalco, J
- Clevenger, L
- Li, B
- Christiansen, C
- Chen, F
- Lee, T
- Schmatz, J
- Shobha, H
- Ito, F
- Ryan, T
- Nguyen, S
- Canaperi, D
- Arnold, J
- Choi, S
- Cohen, S
- Liniger, E
- Chen, H
- Chen, S
- Vo, T
- Kelly, J
- Straten, O
- Penny, C
- Bonilla, G
- Kozlowski, P
- Spooner, T
- Edelstein, D
2010
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2018 IEEE International Interconnect Technology Conference (IITC), 2018, p.13-15
2018
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Proceedings of the IEEE 2005 International Interconnect Technology Conference, 2005, 2005, p.135-137
2005
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2017 IEEE International Interconnect Technology Conference (IITC), 2017, p.1-3
2017
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2009 IEEE International Interconnect Technology Conference, 2009, p.8-10
- Soon-Cheon Seo
- Chih-Chao Yang
- Chun-Chen Yeh
- Haran, B.
- Horak, D.
- Fan, S.
- Koburger, C.
- Canaperi, D.
- Papa Rao, S.S.
- Monsieur, F.
- Knorr, A.
- Kerber, A.
- Chao-Kun Hu
- Kelly, J.
- Tuan Vo
- Cummings, J.
- Smalleya, M.
- Petrillo, K.
- Mehta, S.
- Schmitz, S.
- Levin, T.
- Dae-Guy Park
- Stathis, J.H.
- Spooner, T.
- Paruchuri, V.
- Wynne, J.
- Edelstein, D.
- McHerron, D.
- Doris, B.
2009
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2011 IEEE International Interconnect Technology Conference, 2011, p.1-3
2011
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2012 IEEE International Interconnect Technology Conference, 2012, p.1-3
- Chen, J. H.-C
- Waskiewicz, C.
- Fan, S. S.-C
- Halle, S.
- Chiew-seng Koay
- Yongan Xu
- Saulnier, N.
- Chia-Hsun Tseng
- Yunpeng Yin
- Mignot, Y.
- Beard, M.
- Morris, B.
- Horak, D.
- Mignot, S.
- Shobha, H.
- Sankarapandian, M.
- van der Straten, O.
- Kelly, J. J.
- Canaperi, D.
- Mclellan, E.
- Boye, C.
- Levin, T.
- Juntao Li
- Demarest, J.
- Choi, S.
- Huang, E.
- Liemann, L.
- Haran, B.
- Arnold, J. C.
- Colburn, M.
- Clevenger, L.
- Spooner, T.
2012
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2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, 2010, p.975-978
2010
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2011 IEEE International Interconnect Technology Conference, 2011, p.1-3
2011
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2009 IEEE International Interconnect Technology Conference, 2009, p.5-7
2009
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2008 IEEE International Electron Devices Meeting, 2008, p.1-4
- Haran, B.S.
- Kumar, A.
- Adam, L.
- Chang, J.
- Basker, V.
- Kanakasabapathy, S.
- Horak, D.
- Fan, S.
- Chen, J.
- Faltermeier, J.
- Seo, S.
- Burkhardt, M.
- Burns, S.
- Halle, S.
- Holmes, S.
- Johnson, R.
- McLellan, E.
- Levin, T.M.
- Zhu, Y.
- Kuss, J.
- Ebert, A.
- Cummings, J.
- Canaperi, D.
- Paparao, S.
- Arnold, J.
- Sparks, T.
- Koay, C.S.
- Kanarsky, T.
- Schmitz, S.
- Petrillo, K.
- Kim, R.H.
- Demarest, J.
- Edge, L.F.
- Jagannathan, H.
- Smalley, M.
- Berliner, N.
- Cheng, K.
- LaTulipe, D.
- Koburger, C.
- Mehta, S.
- Raymond, M.
- Colburn, M.
- Spooner, T.
- Paruchuri, V.
- Haensch, W.
- McHerron, D.
- Doris, B.
2008
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Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407), 2000, p.219-221
2000
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2001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184), 2001, p.101-102
- Schiml, T.
- Biesemans, S.
- Brase, G.
- Burrell, L.
- Cowley, A.
- Chen, K.C.
- Von Ehrenwall, A.
- Von Ehrenwall, B.
- Felsner, P.
- Gill, J.
- Grellner, F.
- Guarin, F.
- Han, L.K.
- Hoinkis, M.
- Hsiung, E.
- Kaltalioglu, E.
- Kim, P.
- Knoblinger, G.
- Kulkarni, S.
- Leslie, A.
- Mono, T.
- Schafbauer, T.
- Schroeder, U.
- Schruefer, K.
- Spooner, T.
- Warner, D.
- Wang, C.
- Wong, R.
- Demm, E.
- Leung, P.
2001
- Link zum Volltext
2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016, p.31-33
2016
- Link zum Volltext
2015 IEEE International Electron Devices Meeting (IEDM), 2015, p.8.1.1-8.1.4
- Nogami, Takeshi
- Briggs, Benjamin D.
- Korkmaz, Sevim
- Chae, Moosung
- Penny, Christopher
- Juntao Li
- Wei Wang
- McLaughlin, Paul S.
- Kane, Terence
- Parks, Christopher
- Madan, Anita
- Cohen, Stephan
- Shaw, Thomas
- Priyadarshini, Deepika
- Shobha, Hosadurga
- Son Nguyen
- Patlolla, Raghuveer
- Kelly, James
- Xunyuan Zhang
- Spooner, Terry
- Canaperi, Donald
- Standaert, Theodorus
- Huang, Elbert
- Paruchuri, Vamsi
- Edelstein, Daniel
2015
- Link zum Volltext
Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407), 2000, p.261-263
- Goldblatt, R.D.
- Agarwala, B.
- Anand, M.B.
- Barth, E.P.
- Biery, G.A.
- Chen, Z.G.
- Cohen, S.
- Connolly, J.B.
- Cowley, A.
- Dalton, T.
- Das, S.K.
- Davis, C.R.
- Deutsch, A.
- DeWan, C.
- Edelstein, D.C.
- Emmi, P.A.
- Faltermeier, C.G.
- Fitzsimmons, J.A.
- Hedrick, J.
- Heidenreich, J.E.
- Hu, C.K.
- Hummel, J.P.
- Jones, P.
- Kaltalioglu, E.
- Kastenmeier, B.E.
- Krishnan, M.
- Landers, W.F.
- Liniger, E.
- Liu, J.
- Lustig, N.E.
- Malhotra, S.
- Manger, D.K.
- McGahay, V.
- Mih, R.
- Nye, H.A.
- Purushothaman, S.
- Rathore, H.A.
- Seo, S.C.
- Shaw, T.M.
- Simon, A.H.
- Spooner, T.A.
- Stetter, M.
- Wachnik, R.A.
- Ryan, J.G.
2000
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