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Thermal Aging Performance Analyses of High Color Rendering Index of Glass-Based Phosphor-Converted White-Light-Emitting Diode
IEEE transactions on device and materials reliability, 2015-12, Vol.15 (4), p.617-620
2015
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Prediction of L70 Life and Assessment of Color Shift for Solid-State Lighting Using Kalman Filter and Extended Kalman Filter-Based Models
IEEE transactions on device and materials reliability, 2015-03, Vol.15 (1), p.54-68
2015
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Degradation Mechanisms of Mid-Power White-Light LEDs Under High-Temperature-Humidity Conditions
IEEE transactions on device and materials reliability, 2015-06, Vol.15 (2), p.220-228
2015
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Investigation of the Impact of Drive Current and Phosphor Thickness on the Reliability of High Power White LED Lamp
IEEE transactions on device and materials reliability, 2019-06, Vol.19 (2), p.290-297
2019
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Prognostics of Chromaticity State for Phosphor-Converted White Light Emitting Diodes Using an Unscented Kalman Filter Approach
IEEE transactions on device and materials reliability, 2014-03, Vol.14 (1), p.564-573
2014
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Temporally- and Spatially-Resolved Observations of Current Filament Dynamics in Insulated Gate Bipolar Transistor Chip During Avalanche Breakdown
IEEE transactions on device and materials reliability, 2019-12, Vol.19 (4), p.723-727
2019
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Optical Analysis of Phosphor's Location for High-Power Light-Emitting Diodes
IEEE transactions on device and materials reliability, 2009-03, Vol.9 (1), p.65-73
2009
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Implications of Phosphor Coating on the Thermal Characteristics of Phosphor-Converted White LEDs
IEEE transactions on device and materials reliability, 2016-12, Vol.16 (4), p.576-582
2016
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Influence of AlN Thin Film as Thermal Interface Material on Thermal and Optical Properties of High-Power LED
IEEE transactions on device and materials reliability, 2014-03, Vol.14 (1), p.30-34
2014
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High Thermal Performance and Reliability of Quantum-Dot-Based Light-Emitting Diodes With Watt-Level Injection Power
IEEE transactions on device and materials reliability, 2019-03, Vol.19 (1), p.120-125
2019
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Accelerated Life Test of High Brightness Light Emitting Diodes
IEEE transactions on device and materials reliability, 2008-06, Vol.8 (2), p.304-311
2008
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Analytical/Experimental Hybrid Approach Based on Spectral Power Distribution for Quantitative Degradation Analysis of Phosphor Converted LED
IEEE transactions on device and materials reliability, 2014-03, Vol.14 (1), p.365-374
2014
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A Design for In-Situ Measurement of Optical Degradation of High Power Light-Emitting Diodes Under Accelerated Life Test
IEEE transactions on device and materials reliability, 2014-06, Vol.14 (2), p.645-650
2014
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Inverted-Cone-Lens Encapsulant With Gradient Surface for Ring-Remote-Phosphor Structure
IEEE transactions on device and materials reliability, 2014-03, Vol.14 (1), p.358-364
2014
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